Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits PDF full book. Access full book title Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits by Rasit Onur Topaloglu. Download full books in PDF and EPUB format.
Book Description
"The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transisto"
Book Description
"The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transisto"
Author: Robert Spence Publisher: World Scientific ISBN: 9781860940408 Category : Technology & Engineering Languages : en Pages : 240
Book Description
Tolerance design techniques are playing an increasingly important role in maximizing the manufacturing yield of mass-produced electronic circuits. Tolerance Design of Electronic Circuits presents an account of design and analysis methods used to minimize the unwanted effects of component tolerances.Highlights of the book include? An overview of the concepts of Tolerance Analysis and Design? A detailed discussion of the Statistical Exploration Approach to tolerance design? An engineering discussion of the Monte Carlo statistical method? A presentation of several successful examples of the application of tolerance designThis book will be highly appropriate for professional Electronic Circuit Designers, Computer Aided Design Specialists, Electronic Engineering undergraduates and graduates taking courses in Advanced Electronic Circuit Design.
Author: Esteban Tlelo-Cuautle Publisher: BoD – Books on Demand ISBN: 9533073233 Category : Technology & Engineering Languages : en Pages : 384
Book Description
This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world share acquired experience and insights to develop advances in analog circuit design, modeling and simulation. The key contributions of the sixteen chapters focus on recent advances in analog circuits to accomplish academic or industrial target specifications.
Author: International Conference on Power Electronics and Drive Systems Publisher: Institute of Electrical & Electronics Engineers(IEEE) ISBN: 9780780324237 Category : Technology & Engineering Languages : en Pages : 638
Author: Ruijing Shen Publisher: Springer Science & Business Media ISBN: 1461407885 Category : Technology & Engineering Languages : en Pages : 326
Book Description
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Author: Publisher: World Scientific ISBN: 9814447188 Category : Science Languages : en Pages : 1006
Book Description
"CHEP (Computing in High Energy Physics) is the largest international meeting of the communities of High Energy Physics, Computing Science and the Computing Industry. The sixth conference in this series was held in Rio de Janeiro, Brazil in September 1995. The focus of the conference was "Computing for the next Millennium". High Energy Physics is at a point where major changes in the way data acquisition and computing problems are addressed will be called for in the high energy physics programs of the year 2000 and beyond. The conference covered a wide spectrum of topics including Data Access, Storage, and Analysis; Data Acquisition and Triggering; Worldwide Collaboration and Networking; Tools, Languages, and Software Development Environments; and special purpose processing systems. The papers presented both recent progress and radical approaches to computing problems as candidates for the basis of future computing in the field of high energy physics."--Provided by publisher
Author: Amir Zjajo Publisher: Springer Science & Business Media ISBN: 9048197252 Category : Technology & Engineering Languages : en Pages : 311
Book Description
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
Author: Sauro Longhi Publisher: Springer Nature ISBN: 3030327620 Category : Education Languages : en Pages : 406
Book Description
The book describes the significant multidisciplinary research findings at the Università Politecnica delle Marche and the expected future advances. It addresses some of the most dramatic challenges posed by today’s fast-growing, global society and the changes it has caused. It also discusses solutions to improve the wellbeing of human beings. The book covers the main research achievements in the different disciplines of the physical sciences and engineering, as well as several research lines developed at the university’s Faculty of Engineering in the fields of electronic and information engineering, telecommunications, biomedical engineering, mechanical engineering, manufacturing technologies, energy, advanced materials, chemistry, physics of matter, mathematical sciences, geotechnical engineering, circular economy, urban planning, construction engineering, infrastructures and environment protection, technologies and digitization of the built environment and cultural heritage. It highlights the international relevance and multidisciplinarity of research at the university as well as the planned research lines for the next years.
Author: Rob A. Rutenbar Publisher: John Wiley & Sons ISBN: 047122782X Category : Technology & Engineering Languages : en Pages : 773
Book Description
The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.
Author: Rasit Onur Topaloglu
Author: Rasit Onur Topaloglu
Author: Robert Spence
Author: 
Author: Esteban Tlelo-Cuautle
Author: International Conference on Power Electronics and Drive Systems
Author: Ruijing Shen
Author: 
Author: Amir Zjajo
Author: Sauro Longhi
Author: Rob A. Rutenbar