Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Three-dimensional Imaging, Optical Metrology, and Inspection V
Three-dimensional Imaging, Optical Metrology, and Inspection
Author:
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Three-dimensional Imaging, Optical Metrology, and Inspection IV
Author: Kevin G. Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
3D Imaging, Analysis and Applications
Author: Nick Pears
Publisher: Springer Science & Business Media
ISBN: 144714063X
Category : Computers
Languages : en
Pages : 506
Book Description
3D Imaging, Analysis and Applications brings together core topics, both in terms of well-established fundamental techniques and the most promising recent techniques in the exciting field of 3D imaging and analysis. Many similar techniques are being used in a variety of subject areas and applications and the authors attempt to unify a range of related ideas. With contributions from high profile researchers and practitioners, the material presented is informative and authoritative and represents mainstream work and opinions within the community. Composed of three sections, the first examines 3D imaging and shape representation, the second, 3D shape analysis and processing, and the last section covers 3D imaging applications. Although 3D Imaging, Analysis and Applications is primarily a graduate text, aimed at masters-level and doctoral-level research students, much material is accessible to final-year undergraduate students. It will also serve as a reference text for professional academics, people working in commercial research and development labs and industrial practitioners.
Publisher: Springer Science & Business Media
ISBN: 144714063X
Category : Computers
Languages : en
Pages : 506
Book Description
3D Imaging, Analysis and Applications brings together core topics, both in terms of well-established fundamental techniques and the most promising recent techniques in the exciting field of 3D imaging and analysis. Many similar techniques are being used in a variety of subject areas and applications and the authors attempt to unify a range of related ideas. With contributions from high profile researchers and practitioners, the material presented is informative and authoritative and represents mainstream work and opinions within the community. Composed of three sections, the first examines 3D imaging and shape representation, the second, 3D shape analysis and processing, and the last section covers 3D imaging applications. Although 3D Imaging, Analysis and Applications is primarily a graduate text, aimed at masters-level and doctoral-level research students, much material is accessible to final-year undergraduate students. It will also serve as a reference text for professional academics, people working in commercial research and development labs and industrial practitioners.
Wafer Manufacturing
Author: Imin Kao
Publisher: John Wiley & Sons
ISBN: 0470061219
Category : Technology & Engineering
Languages : en
Pages : 304
Book Description
Presenting all the major stages in wafer manufacturing, from crystals to prime wafers. This book first outlines the physics, associated metrology, process modelling and quality requirements and the goes on to discuss wafer forming and wafer surface preparation techniques. The whole is rounded off with a chapter on the research and future challenges in wafer manufacturing.
Publisher: John Wiley & Sons
ISBN: 0470061219
Category : Technology & Engineering
Languages : en
Pages : 304
Book Description
Presenting all the major stages in wafer manufacturing, from crystals to prime wafers. This book first outlines the physics, associated metrology, process modelling and quality requirements and the goes on to discuss wafer forming and wafer surface preparation techniques. The whole is rounded off with a chapter on the research and future challenges in wafer manufacturing.
Two- and Three-dimensional Methods for Inspection and Metrology
3D Imaging, Analysis and Applications
Author: Yonghuai Liu
Publisher: Springer Nature
ISBN: 3030440702
Category : Computers
Languages : en
Pages : 739
Book Description
This textbook is designed for postgraduate studies in the field of 3D Computer Vision. It also provides a useful reference for industrial practitioners; for example, in the areas of 3D data capture, computer-aided geometric modelling and industrial quality assurance. This second edition is a significant upgrade of existing topics with novel findings. Additionally, it has new material covering consumer-grade RGB-D cameras, 3D morphable models, deep learning on 3D datasets, as well as new applications in the 3D digitization of cultural heritage and the 3D phenotyping of crops. Overall, the book covers three main areas: ● 3D imaging, including passive 3D imaging, active triangulation 3D imaging, active time-of-flight 3D imaging, consumer RGB-D cameras, and 3D data representation and visualisation; ● 3D shape analysis, including local descriptors, registration, matching, 3D morphable models, and deep learning on 3D datasets; and ● 3D applications, including 3D face recognition, cultural heritage and 3D phenotyping of plants. 3D computer vision is a rapidly advancing area in computer science. There are many real-world applications that demand high-performance 3D imaging and analysis and, as a result, many new techniques and commercial products have been developed. However, many challenges remain on how to analyse the captured data in a way that is sufficiently fast, robust and accurate for the application. Such challenges include metrology, semantic segmentation, classification and recognition. Thus, 3D imaging, analysis and their applications remain a highly-active research field that will continue to attract intensive attention from the research community with the ultimate goal of fully automating the 3D data capture, analysis and inference pipeline.
Publisher: Springer Nature
ISBN: 3030440702
Category : Computers
Languages : en
Pages : 739
Book Description
This textbook is designed for postgraduate studies in the field of 3D Computer Vision. It also provides a useful reference for industrial practitioners; for example, in the areas of 3D data capture, computer-aided geometric modelling and industrial quality assurance. This second edition is a significant upgrade of existing topics with novel findings. Additionally, it has new material covering consumer-grade RGB-D cameras, 3D morphable models, deep learning on 3D datasets, as well as new applications in the 3D digitization of cultural heritage and the 3D phenotyping of crops. Overall, the book covers three main areas: ● 3D imaging, including passive 3D imaging, active triangulation 3D imaging, active time-of-flight 3D imaging, consumer RGB-D cameras, and 3D data representation and visualisation; ● 3D shape analysis, including local descriptors, registration, matching, 3D morphable models, and deep learning on 3D datasets; and ● 3D applications, including 3D face recognition, cultural heritage and 3D phenotyping of plants. 3D computer vision is a rapidly advancing area in computer science. There are many real-world applications that demand high-performance 3D imaging and analysis and, as a result, many new techniques and commercial products have been developed. However, many challenges remain on how to analyse the captured data in a way that is sufficiently fast, robust and accurate for the application. Such challenges include metrology, semantic segmentation, classification and recognition. Thus, 3D imaging, analysis and their applications remain a highly-active research field that will continue to attract intensive attention from the research community with the ultimate goal of fully automating the 3D data capture, analysis and inference pipeline.
Handbook of Optical Dimensional Metrology
Author: Kevin Harding
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Handbook of Optical Metrology
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1420019511
Category : Science
Languages : en
Pages : 746
Book Description
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
Publisher: CRC Press
ISBN: 1420019511
Category : Science
Languages : en
Pages : 746
Book Description
The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.
Optical Metrology and Inspection for Industrial Applications
Author: Kevin Harding
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819483850
Category : Engineering inspection
Languages : en
Pages : 532
Book Description
Includes Proceedings Vol. 7821
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819483850
Category : Engineering inspection
Languages : en
Pages : 532
Book Description
Includes Proceedings Vol. 7821