Author: Donald J. SvetkoffPublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection II
Author: Donald J. SvetkoffThree-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
Author: Donald J. SvetkoffThree-dimensional Imaging and Laser-based Systems for Metrology and Inspection III
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection II
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN: 9780819423115
Category : Engineering inspection
Languages : en
Pages : 262
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection
Author: Three-dimensional Imaging, Optical Metrology, and Inspection IV
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
Three-dimensional Imaging, Optical Metrology, and Inspection
Author: Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Three-dimensional Imaging, Optical Metrology, and Inspection V
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Three Dimensional Imaging & Laser Based Systems....
Author: K. Harding. D. SvetkoffTwo- and Three-dimensional Vision Systems for Inspection, Control, and Metrology
Author: Bruce G. BatchelorPublisher: SPIE-International Society for Optical Engineering
ISBN: 9780819451538
Category : Computers
Languages : en
Pages : 228
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.