Author: Publisher:
ISBN:
Category : Imaging systems
Languages : en
Pages : 282
Book Description
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection
Author: Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection II
Author: Donald J. SvetkoffThree-dimensional Imaging, Optical Metrology, and Inspection V
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 240
Book Description
This work presents a series of papers examining various aspects of three-dimensional imaging, optical metrology and inspection.
Three-dimensional and Unconventional Imaging for Industrial Inspection and Metrology
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 436
Book Description
Three-dimensional Imaging, Optical Metrology, and Inspection
Author: Publisher:
ISBN:
Category : Engineering inspection
Languages : en
Pages : 246
Book Description
Image Analysis and Recognition
Author: Mohamed KamelPublisher: Springer Science & Business Media
ISBN: 3642026117
Category : Computers
Languages : en
Pages : 977
Book Description
This book constitutes the refereed proceedings of the 6th International Conference on Image Analysis and Recognition, ICIAR 2009, held in Halifax, Canada, in July 2009. The 93 revised full papers presented were carefully reviewed and selected from 164 submissions. The papers are organized in topical sections on image and video processing and analysis; image segmentation; image and video retrieval and indexing; pattern analysis and recognition; biometrics face recognition; shape analysis; motion analysis and tracking; 3D image analysis; biomedical image analysis; document analysis and applications.
Three-dimensional Imaging, Optical Metrology, and Inspection IV
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Computers
Languages : en
Pages : 318
Book Description
Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.
Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection III
Author: Kevin G. HardingPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 232
Book Description
Author: Donald J. Svetkoff
Author: