Author: G.P. Zhigal'skii
Publisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
The Study of Electromigration Reliability by the Use of 1/f and 1/f℗ Noise Measurements in Thin Metal Films
Author: Phinese Oren Barkley
Publisher:
ISBN:
Category : Electrodiffusion
Languages : en
Pages : 184
Book Description
Publisher:
ISBN:
Category : Electrodiffusion
Languages : en
Pages : 184
Book Description
The Physical Properties of Thin Metal Films
Author: G.P. Zhigal'skii
Publisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Publisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Quantum 1/F Noise & Other Low Frequency Fluctuations in Electronic Devices
Author: American Institute of Physics
Publisher: A I P Press
ISBN: 9781563962523
Category : Science
Languages : en
Pages : 216
Book Description
This text contains the papers from the fifth Symposium in the sequence of quantum 1/f noise. The scope of the conference includes quantum 1/f noise, other low frequency fluctuations in electronic devices and their relation to fundamental 1/f noise.
Publisher: A I P Press
ISBN: 9781563962523
Category : Science
Languages : en
Pages : 216
Book Description
This text contains the papers from the fifth Symposium in the sequence of quantum 1/f noise. The scope of the conference includes quantum 1/f noise, other low frequency fluctuations in electronic devices and their relation to fundamental 1/f noise.
Reliability of Compound Analogue Semiconductor Integrated Circuits
Author: Aris Christou
Publisher: RIAC
ISBN: 1933904194
Category :
Languages : en
Pages : 487
Book Description
Publisher: RIAC
ISBN: 1933904194
Category :
Languages : en
Pages : 487
Book Description
IEEE Proceedings of the Southeastcon
Author:
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 438
Book Description
Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 438
Book Description
Reliability Physics 1985
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 268
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 268
Book Description
1/f Noise and Electromigration in A1 Ti Thin Films
Materials Reliability in Microelectronics II: Volume 265
Author: C. V. Thompson
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 352
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 352
Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Noise In Physical Systems And 1/f Fluctuations - Proceedings Of The 13th International Conference
Author: Vytautas Bareikis
Publisher: World Scientific
ISBN: 9814549177
Category :
Languages : en
Pages : 770
Book Description
The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.
Publisher: World Scientific
ISBN: 9814549177
Category :
Languages : en
Pages : 770
Book Description
The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.