Author: Leonid V. Azároff Publisher: ISBN: Category : Science Languages : en Pages : 368
Book Description
Elementary x-ray diffraction theory -- Principles of powder photography -- The design and alignment of powder cameras -- Procedures for taking powder photographs -- Relation of spacings to cell geometry -- Interpretation of powder photographs -- Analytical methods for indexing powder photographs -- The reciprocal lattice -- Indexing powder photographs with the aid of the reciprocal lattice -- Reduced cells and their application -- Homogeneous axes and the Delaunay reduction -- Identification of substances by the powder method -- The sources of error in measured spacings -- The practice of attaining accuracy -- Appearance of powder photographs.
Author: Yoshio Waseda Publisher: Springer Science & Business Media ISBN: 3642166350 Category : Technology & Engineering Languages : en Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: Myeongkyu Lee Publisher: CRC Press ISBN: 1315361973 Category : Science Languages : en Pages : 302
Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Vitalij Pecharsky Publisher: Springer Science & Business Media ISBN: 0387095799 Category : Science Languages : en Pages : 751
Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: M. F. C. Ladd Publisher: Springer Science & Business Media ISBN: 1461579333 Category : Science Languages : en Pages : 404
Book Description
Crystallography may be described as the science of the structure of materi als, using this word in its widest sense, and its ramifications are apparent over a broad front of current scientific endeavor. It is not surprising, therefore, to find that most universities offer some aspects of crystallography in their undergraduate courses in the physical sciences. It is the principal aim of this book to present an introduction to structure determination by X-ray crystal lography that is appropriate mainly to both final-year undergraduate studies in crystallography, chemistry, and chemical physics, and introductory post graduate work in this area of crystallography. We believe that the book will be of interest in other disciplines, such as physics, metallurgy, biochemistry, and geology, where crystallography has an important part to play. In the space of one book, it is not possible either to cover all aspects of crystallography or to treat all the subject matter completely rigorously. In particular, certain mathematical results are assumed in order that their applications may be discussed. At the end of each chapter, a short bibliog raphy is given, which may be used to extend the scope of the treatment given here. In addition, reference is made in the text to specific sources of information. We have chosen not to discuss experimental methods extensively, as we consider that this aspect of crystallography is best learned through practical experience, but an attempt has been made to simulate the interpretive side of experimental crystallography in both examples and exercises.
Author: Gregory S. Girolami Publisher: University Science Books ISBN: 9781891389771 Category : Science Languages : en Pages : 0
Book Description
X-Ray Crystallography is a well-balanced, thorough, and clearly written introduction to the most important and widely practiced technique to determine the arrangement of atoms in molecules and solids. Featuring excellent illustrations and homework problems throughout, the book is intended both for advanced undergraduate and graduate students who are learning the subject for the first time, as well as for those who have practical experience but seek a text summarizing the theory of diffraction and X-ray crystallography. It is organized into three parts: Part 1 deals with symmetry and space groups, Part 2 explains the physics of X rays and diffraction, and Part 3 examines the methods for solving and refining crystal structures. The discussion proceeds in a logical and clear fashion from the fundamentals through to advanced topics such as disorder, twinning, microfocus sources, low energy electron diffraction, charge flipping, protein crystallography, the maximum likelihood method of refinement, and powder, neutron, and electron diffraction. The author's clear writing style and distinctive approach is well suited for chemists, biologists, materials scientists, physicists, and scientists from related disciplines.
Author: Mark F.C. Ladd Publisher: Springer Science & Business Media ISBN: 9780306474538 Category : Science Languages : en Pages : 874
Book Description
I was highly flattered when I was asked by Mark Ladd and Rex Palmer if I would write the Foreword to this Fourth Edition of their book. "Ladd & Palmer" is such a well-known and classic book on the subject of crystal structure determination, one of the standards in the field: I did feel daunted by the prospect, and wondered if I could do justice to it. The determination of crystal structures by X-ray crystallography has come a long way since the 1912 discoveries of von Laue and the Braggs. In the intervening years great advances have been made, so that today it is almost taken for granted that crystal structures can be determined in which hundreds, if not thousands, of sepa rate atomic positions can be found with apparent ease. In the early years the struc tures of relatively simple materials, such as the alkali halides, were often argued over and even disputed, whereas today we routinely see published structures of most complex molecular crystals, including the structures of viruses and proteins.
Author: André Authier Publisher: Oxford University Press, USA ISBN: 0199659842 Category : Science Languages : en Pages : 456
Book Description
2012 marked the centenary of one of the most significant discoveries of the early twentieth century, the discovery of X-ray diffraction (March 1912, by Laue, Friedrich, and Knipping) and of Bragg's law (November 1912). The discovery of X-ray diffraction confirmed the wave nature of X-rays and the space-lattice hypothesis. It had two major consequences: the analysis of the structure of atoms, and the determination of the atomic structure of materials. This had a momentous impact in chemistry, physics, mineralogy, material science, and biology. This book relates the discovery itself, the early days of X-ray crystallography, and the way the news of the discovery spread round the world. It explains how the first crystal structures were determined, and recounts which were the early applications of X-ray crystallography. It also tells how the concept of space lattice has developed since ancient times, and how our understanding of the nature of light has changed over time. The contributions of the main actors of the story, prior to the discovery, at the time of the discovery and immediately afterwards, are described through their writings and are put into the context of the time, accompanied by brief biographical details.
Author: Robert E. Dinnebier Publisher: Walter de Gruyter GmbH & Co KG ISBN: 3110461382 Category : Science Languages : en Pages : 347
Book Description
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach.The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Author: Georg Will Publisher: Springer Science & Business Media ISBN: 3540279865 Category : Science Languages : en Pages : 232
Book Description
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Author: Leonid V. Azároff
Author: Yoshio Waseda
Author: Myeongkyu Lee
Author: Vitalij Pecharsky
Author: M. F. C. Ladd
Author: Gregory S. Girolami
Author: Mark F.C. Ladd
Author: André Authier
Author: Robert E. Dinnebier
Author: Georg Will