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Author: Oded Kafri Publisher: Wiley-Interscience ISBN: Category : Science Languages : en Pages : 216
Book Description
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
Author: Oded Kafri Publisher: Wiley-Interscience ISBN: Category : Science Languages : en Pages : 216
Book Description
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
Author: Oded Kafri Publisher: Wiley-Interscience ISBN: Category : Science Languages : en Pages : 216
Book Description
This one volume treatise presents a comprehensive discussion of moire metrology analysis. The authors work from a new point of view, treating the gratings used in moire analysis as an artificial analog to electromagnetic waves, thereby comparing moire analysis with conventional optical methods based on wave properties such as interferometry. It is shown that for every interferometric technique in metrology, there is an analogous technique in moire metrology and vice versa, and that scientists involved in optical metrology have a real choice between interferometric and moire methods.
Author: Isaac Amidror Publisher: Springer Science & Business Media ISBN: 940114205X Category : Mathematics Languages : en Pages : 492
Book Description
Who has not noticed, on one o~casion or another, those intriguing geometric patterns which appear at the intersection Of repetitive structures such as two far picket fences on a hill, the railings on both sides of a bridge, superposed layers of fabric, or folds of a nylon curtain? This fascinating phenomenon, known as the moire effect, has found useful applications in several fields of science and technology, such as metrology, strain analysis or even document authentication and anti-counterfeiting. However, in other situations moire patterns may have an unwanted, adverse effect. This is the case in the printing world, and, in particular, in the field of colour reproduction: moire patterns which may be caused by the dot-screens used for colour printing may severely deteriorate the image quality and tum into a real printer's nightmare. The starting point of the work on which this book is based was, indeed, in the research of moire phenomena in the context of the colour printing process. The initial aim of this research was to understand the nature and the causes of the superposition moire patterns between regular screens in order to find how to avoid, or at least minimize, their adverse effect on colour printing. This interesting research led us, after all, to a much more far reaching mathematical understanding of the moire phenomenon, whose interest stands in its own right, independently of any particular application.
Author: Rajpal S. Sirohi Publisher: CRC Press ISBN: 1482236117 Category : Technology & Engineering Languages : en Pages : 449
Book Description
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Author: Daniel Post Publisher: Springer Science & Business Media ISBN: 1461243343 Category : Technology & Engineering Languages : en Pages : 451
Book Description
A description of both the theory and practice of physical measurements that use high-sensitivity moiré - principally moiré interferometry. The focus here is on the mechanics and micromechanics of materials and structural elements and the book includes new studies published for the first time. Diverse fields are addressed: advanced composite materials, thermal stresses, electronic packaging, fracture, metallurgy, time-dependence, strain gage calibration. All the methods can be applied for whole-field measurements on nearly and solid bodies. This reader-friendly book will serve engineers and scientists who are concerned with measurements of real phenomena, while also stimulating students to pursue the treasures of experimental analysis.
Author: Walt Boyes Publisher: Butterworth-Heinemann ISBN: 0080941885 Category : Technology & Engineering Languages : en Pages : 929
Book Description
The discipline of instrumentation has grown appreciably in recent years because of advances in sensor technology and in the interconnectivity of sensors, computers and control systems. This 4e of the Instrumentation Reference Book embraces the equipment and systems used to detect, track and store data related to physical, chemical, electrical, thermal and mechanical properties of materials, systems and operations. While traditionally a key area within mechanical and industrial engineering, understanding this greater and more complex use of sensing and monitoring controls and systems is essential for a wide variety of engineering areas--from manufacturing to chemical processing to aerospace operations to even the everyday automobile. In turn, this has meant that the automation of manufacturing, process industries, and even building and infrastructure construction has been improved dramatically. And now with remote wireless instrumentation, heretofore inaccessible or widely dispersed operations and procedures can be automatically monitored and controlled. This already well-established reference work will reflect these dramatic changes with improved and expanded coverage of the traditional domains of instrumentation as well as the cutting-edge areas of digital integration of complex sensor/control systems. - Thoroughly revised, with up-to-date coverage of wireless sensors and systems, as well as nanotechnologies role in the evolution of sensor technology - Latest information on new sensor equipment, new measurement standards, and new software for embedded control systems, networking and automated control - Three entirely new sections on Controllers, Actuators and Final Control Elements; Manufacturing Execution Systems; and Automation Knowledge Base - Up-dated and expanded references and critical standards
Author: Kevin Harding Publisher: Taylor & Francis ISBN: 1439854823 Category : Science Languages : en Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author: Anil Kishen Publisher: World Scientific ISBN: 1908979461 Category : Technology & Engineering Languages : en Pages : 341
Book Description
Biophotonics in dentistry is a rapidly growing area. Unlike other books, this invaluable compendium touches on the fundamental areas in biophotonics. Contributed by world-renowned authors, it provides a basic understanding on a range of topics for individuals of different backgrounds to acquire a minimum knowledge of research and development in biophotonics. The chapters are arranged in two major categories. The first describes the fundamental aspects of photonics, such as photomechanics, biomedical imaging, lasers and laser-tissue interaction, spectroscopy and photodynamic therapy. The second details the applications of biophotonics, with special relevance to dentistry, including dental photobiomechanics, Raman spectroscopy and dental tissue optics./a
Author: Keith J. Kasunic Publisher: John Wiley & Sons ISBN: 1118809904 Category : Science Languages : en Pages : 271
Book Description
Covers the fundamental principles behind optomechanical design This book emphasizes a practical, systems-level overview of optomechanical engineering, showing throughout how the requirements on the optical system flow down to those on the optomechanical design. The author begins with an overview of optical engineering, including optical fundamentals as well as the fabrication and alignment of optical components such as lenses and mirrors. The concepts of optomechanical engineering are then applied to the design of optical systems, including the structural design of mechanical and optical components, structural dynamics, thermal design, and kinematic design. Optomechanical Systems Engineering: Reviews the fundamental concepts of optical engineering as they apply to optomechanical design Illustrates the fabrication and alignment requirements typically found in an optical system Examines the elements of structural design from a mechanical, optical, and vibrational viewpoint Develops the thermal management principles of temperature and distortion control Describes the optomechanical requirements for kinematic and semi-kinematic mounts Uses examples and case studies to illustrate the concepts and equations presented in the book Provides supplemental materials on a companion website Focusing on fundamental concepts and first-order estimates of optomechanical system performance, Optomechanical Systems Engineering is accessible to engineers, scientists, and managers who want to quickly master the principles of optomechanical engineering.
Author: John David Vincent Publisher: John Wiley & Sons ISBN: 1119011876 Category : Technology & Engineering Languages : en Pages : 594
Book Description
Presents a comprehensive introduction to the selection, operation, and testing of infrared devices, including a description of modern detector assemblies and their operation This book discusses how to use and test infrared and visible detectors. The book provides a convenient reference for those entering the field of IR detector design, test or use, those who work in the peripheral areas, and those who teach and train others in the field. Chapter 1 contains introductory material. Radiometry is covered in Chapter 2. The author examines Thermal detectors in Chapter 3; the “Classical” photon detectors – simple photoconductors and photovoltaics in Chapter 4; and “Modern Photon Detectors” in Chapter 5. Chapters 6 through 8 consider respectively individual elements and small arrays of elements the “readouts” (ROICs) used with large imaging arrays; and Electronics for FPA Operation and Testing. The Test Set and The Testing Process are analyzed in Chapters 9 and 10, with emphasis on uncertainty and trouble shooting. Chapters 11 through 15 discuss related skills, such as Uncertainty, Cryogenics, Vacuum, Optics, and the use of Fourier Transforms in the detector business. Some highlights of this new edition are that it Discusses radiometric nomenclature and calculations, detector mechanisms, the associated electronics, how these devices are tested, and real-life effects and problems Examines new tools in Infrared detector operations, specifically: selection and use of ROICs, electronics for FPA operation, operation of single element and very small FPAs, microbolometers, and multi-color FPAs Contains five chapters with frequently sought-after information on related subjects, such as uncertainty, optics, cryogenics, vacuum, and the use of Fourier mathematics for detector analyses Fundamentals of Infrared and Visible Detector Operation and Testing, Second Edition, provides the background and vocabulary necessary to help readers understand the selection, operation, and testing of modern infrared devices.
Author: Oded Kafri
Author: Oded Kafri
Author: Oded Kafri
Author: Isaac Amidror
Author: Rajpal S. Sirohi
Author: Daniel Post
Author: Walt Boyes
Author: Kevin Harding
Author: Anil Kishen
Author: Keith J. Kasunic
Author: John David Vincent