Author: Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 76
Book Description
The MSFC Complementary Metal Oxide Semiconductor (including Multilevel Interconnect Metallization) Process Handbook
Author: Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 76
Book Description
NASA Technical Memorandum
Author: NASA Tech Briefs
Author: Scientific and Technical Aerospace Reports
Author: Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1370
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Government Reports Announcements & Index
Author: Government Reports Annual Index
Author: Publisher:
ISBN:
Category : Government reports announcements & index
Languages : en
Pages : 1212
Book Description
Electromagnetic Compatibility of Integrated Circuits
Author: Sonia Ben DhiaPublisher: Springer Science & Business Media
ISBN: 0387266011
Category : Technology & Engineering
Languages : en
Pages : 478
Book Description
Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
Electronic Failure Analysis Handbook
Author: Perry L. MartinPublisher: McGraw Hill Professional
ISBN: 9780070410442
Category : Technology & Engineering
Languages : en
Pages : 770
Book Description
Annotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--BOOK JACKET. Title Summary field provided by Blackwell North America, Inc. All Rights Reserved.
Scientific and Technical Aerospace Reports
Author: A Century at Langley
Author: Joseph R. ChambersPublisher: Government Printing Office
ISBN: 9780160941474
Category : Aeronautics
Languages : en
Pages : 134
Book Description