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Author: S. Bradbury Publisher: Elsevier ISBN: 1483164322 Category : Nature Languages : en Pages : 369
Book Description
The Evolution of the Microscope covers some of the features of the history of the microscope and the rationale of the design features found in microscopes. The book discusses the first microscopes, the compound microscope in England (1650-1750), simple or single-lens microscopes, and the development of the achromatic microscope. The text also describes the microscope in Victorian times as well as the optical microscope since 1880. The search for greater resolving power such as the ultra-violet and electron microscopes is considered. Scientists and microscopists will find the book invaluable.
Author: S. Bradbury Publisher: Elsevier ISBN: 1483164322 Category : Nature Languages : en Pages : 369
Book Description
The Evolution of the Microscope covers some of the features of the history of the microscope and the rationale of the design features found in microscopes. The book discusses the first microscopes, the compound microscope in England (1650-1750), simple or single-lens microscopes, and the development of the achromatic microscope. The text also describes the microscope in Victorian times as well as the optical microscope since 1880. The search for greater resolving power such as the ultra-violet and electron microscopes is considered. Scientists and microscopists will find the book invaluable.
Author: Joseph Goldstein Publisher: Springer Science & Business Media ISBN: 1461332737 Category : Science Languages : en Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Anwar Ul-Hamid Publisher: Springer ISBN: 3319984829 Category : Technology & Engineering Languages : en Pages : 422
Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author: Brent Fultz Publisher: Springer Science & Business Media ISBN: 3642297609 Category : Science Languages : en Pages : 775
Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author: James Pawley Publisher: Springer Science & Business Media ISBN: 1475753489 Category : Science Languages : en Pages : 639
Book Description
This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition and properties of fluorescent dyes, the techniques of 3D specimen preparation and the fundamental limitations, and practical complexities of quantitative confocal fluorescence imaging. Coverage includes practical multiphoton, photodamage and phototoxicity, 3D FRET, 3D microscopy correlated with micro-MNR, CARS, second and third harmonic signals, ion imaging in 3D, scanning RAMAN, plant specimens, practical 3D microscopy and correlated optical tomography.
Author: John C. Russ Publisher: Springer Science & Business Media ISBN: 1461305632 Category : Science Languages : en Pages : 461
Book Description
The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.
Author: Stephen J. Pennycook Publisher: Springer Science & Business Media ISBN: 1441972005 Category : Technology & Engineering Languages : en Pages : 764
Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Dee Lawlor Publisher: Springer ISBN: 3030053938 Category : Science Languages : en Pages : 171
Book Description
This book offers a beginner’s guide to using light microscopes. It begins with a brief introduction to the physics of optics, which will give the reader a basic grasp of the behaviors of light. In turn, each part of the microscope is explained using clear and simple English, together withdetailed photographs and diagrams. The reader will learn the function, care and correct use of each part. A troubleshooting section also helps resolve some of the most common issues encountered in light microscopy. Most people have a general idea of how to use a microscope, but many never get the full benefit, because they receive no training. With easy-to-follow steps and detailed images, this guide will help everyone achieve the best results, and be confident using their microscope. This book is intended for anyone using a light microscope, such as university students, people in lab environments, hobbyists, educators who teach science to young children, and anyone with a general interest in these valuable tools.
Author: Robert Hooke Publisher: Good Press ISBN: Category : History Languages : en Pages : 369
Book Description
"Micrographia" by Robert Hooke. Published by Good Press. Good Press publishes a wide range of titles that encompasses every genre. From well-known classics & literary fiction and non-fiction to forgotten−or yet undiscovered gems−of world literature, we issue the books that need to be read. Each Good Press edition has been meticulously edited and formatted to boost readability for all e-readers and devices. Our goal is to produce eBooks that are user-friendly and accessible to everyone in a high-quality digital format.
Author: S. Bradbury
Author: S. Bradbury
Author: Joseph Goldstein
Author: Anwar Ul-Hamid
Author: Douglas B. Murphy
Author: Brent Fultz
Author: James Pawley
Author: John C. Russ
Author: Stephen J. Pennycook
Author: Dee Lawlor
Author: Robert Hooke