The International Journal of Microcircuits and Electronic Packaging PDF Download

Author:
Publisher:
ISBN:
Category : Electronic packaging
Languages : en
Pages : 582

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Author: Shen Liu
Publisher: John Wiley & Sons
ISBN: 0470828412
Category : Technology & Engineering
Languages : en
Pages : 586

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Book Description
Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming "test and try out" method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development. In this book, Liu and Liu allow people in the area to learn the basic and advanced modeling and simulation skills to help solve problems they encounter. Models and simulates numerous processes in manufacturing, reliability and testing for the first time Provides the skills necessary for virtual prototyping and virtual reliability qualification and testing Demonstrates concurrent engineering and co-design approaches for advanced engineering design of microelectronic products Covers packaging and assembly for typical ICs, optoelectronics, MEMS, 2D/3D SiP, and nano interconnects Appendix and color images available for download from the book's companion website Liu and Liu have optimized the book for practicing engineers, researchers, and post-graduates in microelectronic packaging and interconnection design, assembly manufacturing, electronic reliability/quality, and semiconductor materials. Product managers, application engineers, sales and marketing staff, who need to explain to customers how the assembly manufacturing, reliability and testing will impact their products, will also find this book a critical resource. Appendix and color version of selected figures can be found at www.wiley.com/go/liu/packaging

Author: Ephraim Suhir
Publisher: Springer Science & Business Media
ISBN: 0387329897
Category : Technology & Engineering
Languages : en
Pages : 1471

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Book Description
This handbook provides the most comprehensive, up-to-date and easy-to-apply information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials. It details their assemblies, structures and systems, and each chapter contains a summary of the state-of-the-art in a particular field. The book provides practical recommendations on how to apply current knowledge and technology to design and manufacture. It further describes how to operate a viable, reliable and cost-effective electronic component or photonic device, and how to make such a device into a successful commercial product.

Author: P. Singh
Publisher: Springer Science & Business Media
ISBN: 1461560292
Category : Technology & Engineering
Languages : en
Pages : 391

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Book Description
With the proliferation of packaging technology, failure and reliability have become serious concerns. This invaluable reference details processes that enable detection, analysis and prevention of failures. It provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers and PCB assemblies.

Author: Ephraim Suhir
Publisher: CRC Press
ISBN: 1351132504
Category : Mathematics
Languages : en
Pages : 238

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Book Description
Improvements in safety in the air and in space can be achieved through better ergonomics, better work environments, and other efforts of traditional avionic psychology that directly affect human behaviors and performance. Not limited to just the aerospace field, this book discusses adaptive probabilistic predictive modeling in human-in-the-loop situations and gets you familiar with a new, powerful, flexible, and effective approach to making outcomes from missions successful and safe. Covers the concepts, which are adaptable across other disciplines, and methodology for evaluating the likelihood of a successful outcome of an extraordinary situation Considers human performance and equipment/instrumentation reliability, as well as other possible sources of uncertainty Presents probabilistic assessment of an aerospace mission outcome Provides the most effective, physically meaningful, and cost-effective planning of an aerospace mission Offers how to organize and provide the most effective training of personnel

Author: Mark A. Levin
Publisher: John Wiley & Sons
ISBN: 1119179394
Category : Technology & Engineering
Languages : en
Pages : 456

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Book Description
The authoritative guide to the effective design and production of reliable technology products, revised and updated While most manufacturers have mastered the process of producing quality products, product reliability, software quality and software security has lagged behind. The revised second edition of Improving Product Reliability and Software Quality offers a comprehensive and detailed guide to implementing a hardware reliability and software quality process for technology products. The authors – noted experts in the field – provide useful tools, forms and spreadsheets for executing an effective product reliability and software quality development process and explore proven software quality and product reliability concepts. The authors discuss why so many companies fail after attempting to implement or improve their product reliability and software quality program. They outline the critical steps for implementing a successful program. Success hinges on establishing a reliability lab, hiring the right people and implementing a reliability and software quality process that does the right things well and works well together. Designed to be accessible, the book contains a decision matrix for small, medium and large companies. Throughout the book, the authors describe the hardware reliability and software quality process as well as the tools and techniques needed for putting it in place. The concepts, ideas and material presented are appropriate for any organization. This updated second edition: Contains new chapters on Software tools, Software quality process and software security. Expands the FMEA section to include software fault trees and software FMEAs. Includes two new reliability tools to accelerate design maturity and reduce the risk of premature wearout. Contains new material on preventative maintenance, predictive maintenance and Prognostics and Health Management (PHM) to better manage repair cost and unscheduled downtime. Presents updated information on reliability modeling and hiring reliability and software engineers. Includes a comprehensive review of the reliability process from a multi-disciplinary viewpoint including new material on uprating and counterfeit components. Discusses aspects of competition, key quality and reliability concepts and presents the tools for implementation. Written for engineers, managers and consultants lacking a background in product reliability and software quality theory and statistics, the updated second edition of Improving Product Reliability and Software Quality explores all phases of the product life cycle.

Author: Ephraim Suhir
Publisher: CRC Press
ISBN: 0429863829
Category : Technology & Engineering
Languages : en
Pages : 344

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Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime. Describes how to use the developed methods of analytical predictive modeling to minimize thermal stresses and strains in solder joint of IC devices Shows how to build the preprocessing models in finite-element analyses (FEA) by comparing the FEA and analytical data Covers how to design the most effective test vehicles for testing solder joints Details how to design and organize, in addition to or sometimes even instead of highly accelerated life tests (HALT), highly focused and highly cost-effective failure oriented accelerated testing (FOAT) to understand the physic of failure of solder joint interconnections Outlines how to convert the low cycle fatigue conditions into elastic fatigue conditions and to assess the fatigue lifetime in such cases Illustrates ways to replace time- and labor-consuming, expensive, and possibly misleading temperature cycling tests with simpler and physically meaningful accelerated tests This book is aimed towards professionals in electronic and photonic packaging, electronic and optical materials, materials engineering, and mechanical design.

Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 268

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Author: Johan Liu
Publisher: Springer Science & Business Media
ISBN: 144195760X
Category : Technology & Engineering
Languages : en
Pages : 216

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Book Description
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also includes exercises and detailed solutions at the end of each chapter.

Author: Antoni P. Tomsia
Publisher: Springer Science & Business Media
ISBN: 1461553938
Category : Technology & Engineering
Languages : en
Pages : 841

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Book Description
This volume, titled Proceedings of the International Materials Symposium on Ce ramic Microstructures: Control at the Atomic Level summarizes the progress that has been achieved during the past decade in understanding and controlling microstructures in ceram ics. A particular emphasis of the symposium, and therefore of this volume, is advances in the characterization, understanding, and control of micro structures at the atomic or near-atomic level. This symposium is the fourth in a series of meetings, held every ten years, devoted to ceramic microstructures. The inaugural meeting took place in 1966, and focussed on the analysis, significance, and production of microstructure; the symposium emphasized the need for, and importance of characterization in achieving a more complete understanding of the physical and chemical characteristics of ceramics. A consensus emerged at that meeting on the critical importance of characterization in achieving a more complete understanding of ceramic properties. That point of view became widely accepted in the ensuing decade. The second meeting took place in 1976 at a time of world-wide energy shortages and thus emphasized energy-related applications of ceramics, and more specifically, microstructure-property relationships of those materials. The third meeting, held in 1986, was devoted to the role that interfaces played both during processing, and in influencing the ultimate properties of single and polyphase ceramics, and ceramic-metal systems.