Author: Patrick Kam LuiPublisher:
ISBN:
Category :
Languages : en
Pages : 278
Book Description
The Application of Spectral Techniques to the Detection of Single and Multiple Stuck-at Faults in Irredundant Combinational Networks
Author: Patrick Kam LuiThe Application of Spectral Techniques to the Detection of Single and Multiple Stuck-at Faults in Irredundant Combinational Networks
Author: Patrick Kam LuiMasters Theses in the Pure and Applied Sciences
Author: Wade H. ShaferPublisher: Springer Science & Business Media
ISBN: 1468449192
Category : Science
Languages : en
Pages : 314
Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1 957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 28 (thesis year 1 983) a total of 10,661 theses titles from 26 Canadian and 197 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 28 reports theses submitted in-1983, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
Spectral Techniques and Fault Detection
Author: Mark G. KarpovskyPublisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 632
Book Description
VLSI Testing
Author: Stanley Leonard HurstPublisher: IET
ISBN: 9780852969014
Category : Computers
Languages : en
Pages : 560
Book Description
Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
VLSI Custom Microelectronics
Author: Stanley L. HurstPublisher: CRC Press
ISBN: 0824746406
Category : Technology & Engineering
Languages : en
Pages : 489
Book Description
Focuses on the design and production of integrated circuits specifically designed for a particular application from original equipment manufacturers. The book outlines silicon and GaAs semiconductor fabrication techniques and circuit configurations; compares custom design style; discusses computer-aided design tools; and more.
1989 IEEE International Symposium on Circuits and Systems
Author: The ... IEEE Asia Pacific Conference on ASICs
Author: Publisher:
ISBN:
Category : Application specific integrated circuits
Languages : en
Pages : 434
Book Description
The Engineering Index Annual
Author: Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 2264
Book Description
Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
Author: