Testing of High-Resolution SI and GE Analyzers for X-Ray Raman Scattering and X-Ray Emission Spectroscopy PDF Download
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Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
A project at Stanford Linear Accelerator Center (SLAC) is currently underway for the building of a new multi-crystal x-ray spectrometer that will be used to probe the fundamental structures of light elements, including water, as well as 3d transition metals, such as metalloproteins, in dilute systems. Experimentation for determining the focal lengths for the prospective high-resolution, spherically-curved silicon (Si) and germanium (Ge) analyzers for the instrument and the energy resolutions at their respective focal points is described. The focal lengths of the Si and Ge analyzers being sampled were found by minimizing the focal size made from a diffused helium-neon (HeNe) gas laser operating at 632 nm (0.95 meV). Afterwards, the energy resolutions were determined by using synchrotron radiation (SR), in the range from 6-16 keV energies. The experiments were performed at Beamline 10-2 at the Stanford Synchrotron Radiation Laboratory (SSRL), a division of SLAC. This data, along with the energies of the incident beams, was used to determine which samples are most effective at focusing x-rays to the highest spatial and energy resolution. Sample Si (440)A, with a focal length of 1015.2 mm, had the best energy resolution. Furthermore, a new multi-crystal goniometer was tested and commissioned. As part of this work, the device was prealigned into Rowland geometry, in order to facilitate the process of finding a single high-energy resolution x-ray focus for all 7 analyzers.
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
A project at Stanford Linear Accelerator Center (SLAC) is currently underway for the building of a new multi-crystal x-ray spectrometer that will be used to probe the fundamental structures of light elements, including water, as well as 3d transition metals, such as metalloproteins, in dilute systems. Experimentation for determining the focal lengths for the prospective high-resolution, spherically-curved silicon (Si) and germanium (Ge) analyzers for the instrument and the energy resolutions at their respective focal points is described. The focal lengths of the Si and Ge analyzers being sampled were found by minimizing the focal size made from a diffused helium-neon (HeNe) gas laser operating at 632 nm (0.95 meV). Afterwards, the energy resolutions were determined by using synchrotron radiation (SR), in the range from 6-16 keV energies. The experiments were performed at Beamline 10-2 at the Stanford Synchrotron Radiation Laboratory (SSRL), a division of SLAC. This data, along with the energies of the incident beams, was used to determine which samples are most effective at focusing x-rays to the highest spatial and energy resolution. Sample Si (440)A, with a focal length of 1015.2 mm, had the best energy resolution. Furthermore, a new multi-crystal goniometer was tested and commissioned. As part of this work, the device was prealigned into Rowland geometry, in order to facilitate the process of finding a single high-energy resolution x-ray focus for all 7 analyzers.
Author: Publisher: ISBN: Category : Languages : en Pages : 5
Book Description
A project at Stanford Linear Accelerator Center (SLAC) is currently underway for the building of a new multi-crystal x-ray spectrometer that will be used to probe the fundamental structures of light elements, including water, as well as 3d transition metals, such as metalloproteins, in dilute systems. Experimentation for determining the focal lengths for the prospective high-resolution, spherically-curved silicon (Si) and germanium (Ge) analyzers for the instrument and the energy resolutions at their respective focal points is described in this paper. The focal lengths of the Si and Ge analyzers being sampled are found by minimizing the focal size made from a diffused helium-neon (HeNe) gas laser operating at 632 nm (0.95 meV). Afterwards, the energy resolutions are determined by using synchrotron radiation (SR), in the range from 6-16 keV energies. The experiments were performed at Beamline 10-2 at the Stanford Synchrotron Radiation Laboratory (SSRL), a division of SLAC. This data, along with the energies of the incident beams, is used to determine which samples are most effective at focusing x-rays to the highest spatial and energy resolution. Sample Si (440)A, with a focal length of 1015.2 mm, is concluded to have the best energy resolution. Furthermore, a new multi-crystal goniometer was tested and commissioned. As part of this work, the device was prealigned into Rowland geometry, in order to facilitate the process of finding a single high-energy resolution x-ray focus for all 7 analyzers.
Author: Publisher: ISBN: Category : Languages : en Pages : 8
Book Description
A spectrometer designed to use an undulator source and having targeted resolutions of 0.01 eV in one mode of use and 0.2 eV in another will operate at the APS. We report here on analyzers that we have, constructed for use on this spectrometer for 0.2-eV resolution. We have tested them at NSLS beamline X21 using focused wiggler radiation and at CHESS using radiation from the CHESS-ANL undulator. Analyzers were constructed by gluing and pressing 90-mm-diameter, (111) oriented Ge wafers into concave glass forms having a radius near 1 m. An overall inelastic scattering resolution of 0.3 eV using the (444) reflection was demonstrated at CHESS. Recent results at X21 revealed a useful diameter of 74 mm at an 870 Bragg angle.
Author: United States. National Bureau of Standards. Technical Information and Publications Division Publisher: ISBN: Category : Government publications Languages : en Pages : 844
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Author: United States. Energy Research and Development Administration
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Author: International Institution for Production Engineering Research
Author: National Institute of Standards and Technology (U.S.)
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Author: United States. National Bureau of Standards
Author: United States. National Bureau of Standards. Technical Information and Publications Division