Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits PDF full book. Access full book title Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits by Yichuang Sun. Download full books in PDF and EPUB format.
Author: Yichuang Sun Publisher: IET ISBN: 0863417450 Category : Technology & Engineering Languages : en Pages : 411
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Yichuang Sun Publisher: IET ISBN: 0863417450 Category : Technology & Engineering Languages : en Pages : 411
Book Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Author: Jose Luis Huertas Díaz Publisher: Springer Science & Business Media ISBN: 0387235213 Category : Technology & Engineering Languages : en Pages : 310
Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author: Kiran Gunnam Publisher: CRC Press ISBN: 1000796841 Category : Science Languages : en Pages : 97
Book Description
CMOS process technology progress has led to a revolution towards new and innovative integrated circuits and systems. This trend is still moving forward for applications ranging from high-speed wireless and wireline data transfer down to ultra-low-power mobile applications for more interconnected world. The high performance analog and RF circuits and systems are at the heart of all these developments. Selected Topics in RF, Analog and Mixed Signal Circuits and Systems provides an overview and the state of the art developments on several selected topics in RF, analog and mixed signal circuits and system. The topics include ADC conversion and equalization for high-speed links, clock and data recovery for high speed wireline transmission with speeds in several Gb/s, signal generation for terahertz application, oscillator phase noise fundamentals and analog/digital PLL overview. Topics covered in the book include:Overview of Oscillator Phase NoiseClock and Data Recovery in High-Speed Wireline CommunicationPhase Lock Loop Design TechniquesTerahertz and mm-Wave Signal Generation, Synthesis and Amplification: Reaching the Fundamental LimitsEqualization and A/D conversion for high-speed links
Author: Frank Ellinger Publisher: Springer Science & Business Media ISBN: 3540693246 Category : Technology & Engineering Languages : en Pages : 523
Book Description
The striking feature of this book is its coverage of the upper GHz domain. However, the latest technologies, applications and broad range of circuits are discussed. Design examples are provided including cookbook-like optimization strategies. This state-of-the-art book is valuable for researchers as well as for engineers in industry. Furthermore, the book serves as fruitful basis for lectures in the area of IC design.
Author: Prithviraj Kabisatpathy Publisher: Springer Science & Business Media ISBN: 0387257438 Category : Technology & Engineering Languages : en Pages : 183
Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Author: Dimitris Gizopoulos Publisher: Springer Science & Business Media ISBN: 0387294090 Category : Technology & Engineering Languages : en Pages : 431
Book Description
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Author: Taylor & Francis Group Publisher: CRC Press ISBN: 9780367778897 Category : Integrated circuits Languages : en Pages : 438
Book Description
Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.
Author: Yichuang Sun
Author: Yichuang Sun
Author: Jose Luis Huertas Díaz
Author: Kiran Gunnam
Author: Frank Ellinger
Author: Wei-hsing Huang
Author: Cheng-Ping Wang
Author: Karim Arabi
Author: Prithviraj Kabisatpathy
Author: Dimitris Gizopoulos
Author: Taylor & Francis Group