SSDLTR 2007 Technical Digest PDF Download

Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 324

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Author: Christopher Hebling
Publisher:
ISBN:
Category :
Languages : en
Pages : 370

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Author: Howard Huff
Publisher: Springer Science & Business Media
ISBN: 3540745599
Category : Technology & Engineering
Languages : en
Pages : 364

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Book Description
Even as we tentatively enter the nanotechnology era, we are now encountering the 50th anniversary of the invention of the IC. Will silicon continue to be the pre-eminent material and will Moore’s Law continue unabated, albeit in a broader economic venue, in the nanotechnology era? This monograph addresses these issues by a re-examination of the scientific and technological foundations of the micro-electronics era. It also features two visionary articles of Nobel laureates.

Author: James J. Kumler
Publisher:
ISBN:
Category : Electronic books
Languages : en
Pages : 677

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Author: Michael Kriss
Publisher: John Wiley & Sons
ISBN: 0470510595
Category : Technology & Engineering
Languages : en
Pages : 1936

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Book Description
A comprehensive and practical analysis and overview of the imaging chain through acquisition, processing and display The Handbook of Digital Imaging provides a coherent overview of the imaging science amalgam, focusing on the capture, storage and display of images. The volumes are arranged thematically to provide a seamless analysis of the imaging chain from source (image acquisition) to destination (image print/display). The coverage is planned to have a very practical orientation to provide a comprehensive source of information for practicing engineers designing and developing modern digital imaging systems. The content will be drawn from all aspects of digital imaging including optics, sensors, quality, control, colour encoding and decoding, compression, projection and display. Contains approximately 50 highly illustrated articles printed in full colour throughout Over 50 Contributors from Europe, US and Asia from academia and industry The 3 volumes are organized thematically for enhanced usability: Volume 1: Image Capture and Storage; Volume 2: Image Display and Reproduction, Hardcopy Technology, Halftoning and Physical Evaluation, Models for Halftone Reproduction; Volume 3: Imaging System Applications, Media Imaging, Remote Imaging, Medical and Forensic Imaging 3 Volumes www.handbookofdigitalimaging.com

Author: Axel Rühl
Publisher: Cuvillier Verlag
ISBN: 3867278318
Category :
Languages : en
Pages : 181

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Author: Andrea Redaelli
Publisher: Woodhead Publishing
ISBN: 0128209461
Category : Technology & Engineering
Languages : en
Pages : 364

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Book Description
Semiconductor Memories and Systems provides a comprehensive overview of the current state of semiconductor memory at the technology and system levels. After an introduction on market trends and memory applications, the book focuses on mainstream technologies, illustrating their current status, challenges and opportunities, with special attention paid to scalability paths. Technologies discussed include static random access memory (SRAM), dynamic random access memory (DRAM), non-volatile memory (NVM), and NAND flash memory. Embedded memory and requirements and system level needs for storage class memory are also addressed. Each chapter covers physical operating mechanisms, fabrication technologies, and the main challenges to scalability. Finally, the work reviews the emerging trends for storage class memory, mainly focusing on the advantages and opportunities of phase change based memory technologies. Features contributions from experts from leading companies in semiconductor memory Discusses physical operating mechanisms, fabrication technologies and paths to scalability for current and emerging semiconductor memories Reviews primary memory technologies, including SRAM, DRAM, NVM and NAND flash memory Includes emerging storage class memory technologies such as phase change memory

Author: Arup Bhattacharyya
Publisher: CRC Press
ISBN: 1351798324
Category : Technology & Engineering
Languages : en
Pages : 512

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Book Description
The primary focus of this book is on basic device concepts, memory cell design, and process technology integration. The first part provides in-depth coverage of conventional nonvolatile memory devices, stack structures from device physics, historical perspectives, and identifies limitations of conventional devices. The second part reviews advances made in reducing and/or eliminating existing limitations of NVM device parameters from the standpoint of device scalability, application extendibility, and reliability. The final part proposes multiple options of silicon based unified (nonvolatile) memory cell concepts and stack designs (SUMs). The book provides Industrial R&D personnel with the knowledge to drive the future memory technology with the established silicon FET-based establishments of their own. It explores application potentials of memory in areas such as robotics, avionics, health-industry, space vehicles, space sciences, bio-imaging, genetics etc.

Author: Seiichi Aritome
Publisher: John Wiley & Sons
ISBN: 1119132622
Category : Technology & Engineering
Languages : en
Pages : 433

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Book Description
Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectives Describes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memory Written by an authority in NAND flash memory technology, with over 25 years’ experience

Author: Tibor Grasser
Publisher: Springer Nature
ISBN: 3030375005
Category : Technology & Engineering
Languages : en
Pages : 724

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Book Description
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.