Author: Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 86
Book Description
Symposium on Spectrochemical Analysis for Trace Elements
Author: American Society for Testing MaterialsPublisher:
ISBN:
Category : Metal
Languages : en
Pages : 92
Book Description
Activities of the NBS Spectrochemical Analysis Section
Author: Bourdon Francis ScribnerPublisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 112
Book Description
Activities in optical spectrometry included development of programs for calculations on a time-sharing computer, measurement of arc temperatures, applications of the laser probe and the plasma jet, and studies on atomic absorption spectrometry. In x-ray spectroscopy, there were some modifications of equipment, improvements in computation methods, and several applications. Improvements and additions were made to the electron probe analyzer, along with studies on measurement techniques, including nondispersive analysis and computation procedures. The spark-source mass spectrometer was also modified, and a new analog computer has been built and tested for reduction of photographic plate data; applications of this instrument to analyses of pure materials are described. Enrichment methods are being studied for the analysis of pure materials by emission spectroscopy, particularly with an electro-deposition technique. Homogeneity studies and analyses were performed in the development of standard reference materials. (Author).
Symposium on Spectrochemical Analysis for Trace Elements
Author: American Society for Testing and MaterialsPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Activities of the NBS Spectrochemical Analysis Section
Author: Bourdon F. ScribnerPublisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 114
Book Description
Activities of the NBS Spectrochemical Analysis Section, July 1969 to June 1970
Author: Bourdon Francis ScribnerPublisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 120
Book Description
Spectrochemical research activities, improvements in equipment, and applications, especially to the certification of NBS Standard Reference Materials, are summarized. In electron probe microanalysis, a comprehensive computer correction program for accurate analysis of materials relative to single elements or simple compounds was developed, an improved lithium-doped silicon detector was found to provide increased resolution, and improvements in microprobe instrumentation produced a high level of stability. Studies of procedures for correction of x-ray fluorescence measurements were made, instrumental changes resulted in marked improvement in performance reliability, and new applications were made. In optical emission spectrometry, studies were made of beryllium determination in an air pollution investigation and trace analyses were made of organic materials to parts per billion limits. Methods of pre-concentration of impurities are described for optical emission and isotope dilution spark source mass spectrometric analysis of ingot iron, botanical materials, and high purity reagents. Work on Standard Reference Materials resulted in certification of stainless steel, clays, ferrosilicon, blast furnace irons, white irons, lead bearing metal, and ductile irons. (Author).
Nuclear Science Abstracts
Author: Accuracy in Trace Analysis
Author: Philip D. LaFleurPublisher:
ISBN:
Category : Trace elements
Languages : en
Pages : 662
Book Description
NBS Special Publication
Author: Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 674
Book Description
Special Publication
Author: Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 1290
Book Description
Author: