Symposium on Electron Microscopy of Microfibers PDF Download

Author: Irvin M. Asher
Publisher:
ISBN:
Category : Asbestos
Languages : en
Pages : 228

View

Book Description

Author: American Society for Testing Materials
Publisher:
ISBN:
Category : Microscope and microscopy
Languages : en
Pages : 136

View

Book Description

Author: Cullis
Publisher: CRC Press
ISBN: 9780854981588
Category : Technology & Engineering
Languages : en
Pages : 552

View

Book Description

Author: Ke-hsin Kuo
Publisher: World Scientific
ISBN: 9814569240
Category : Science
Languages : en
Pages : 492

View

Book Description

Author: A.G. Cullis
Publisher: CRC Press
ISBN: 1000112160
Category : Science
Languages : en
Pages : 533

View

Book Description
This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Author: ASM International
Publisher: ASM International
ISBN: 1615030913
Category : Electronic apparatus and appliances
Languages : en
Pages : 551

View

Book Description

Author: S. Amelinckx
Publisher: John Wiley & Sons
ISBN: 3527614559
Category : Technology & Engineering
Languages : en
Pages : 527

View

Book Description
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Author: Roman Gr. Maev
Publisher: John Wiley & Sons
ISBN: 3527623140
Category : Science
Languages : en
Pages : 291

View

Book Description
This only and up-to-date monograph on this versatile method covers its use in a range of applications spanning the fields of physics, materials science, electrical engineering, medicine, and research and industry. Following an introduction, the highly experienced author goes on to investigate acoustic field structure, output signal formation in transmission raster acoustic microscopes and non-linear acoustic effects. Further chapters deal with the visco-elastic properties and microstructure of the model systems and composites used, as well as polymer composite materials and the microstructure and physical-mechanical properties of biological tissues. A handy reference for materials scientists, electrical engineers, radiologists, laboratory medics, test engineers, physicists, and graduate students.

Author:
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919

View

Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Author: Bruce Molitoris
Publisher: Frontiers Media SA
ISBN: 2889762300
Category : Science
Languages : en
Pages : 79

View

Book Description