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Author: Jean Daillant Publisher: Springer Science & Business Media ISBN: 3540486968 Category : Science Languages : en Pages : 347
Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author: Helmut Dosch Publisher: Springer ISBN: 3540384561 Category : Science Languages : en Pages : 154
Book Description
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Author: Jean Daillant Publisher: Springer Science & Business Media ISBN: 3540486968 Category : Science Languages : en Pages : 347
Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author: Hartmut Zabel Publisher: Springer Science & Business Media ISBN: 3642771440 Category : Science Languages : en Pages : 237
Book Description
Owing to the increased availability of synchrotron sources, surface X-ray scattering is a rapidly expanding technique with important applications to surface structures and surface phase transitions, roughening of surfaces and interfaces, and the structure of liquid surfaces, including polymers, liquid crystals, and organic films. Surface studies with neutrons, on the other hand provide important information on liquid andmagnetic films. The contributions to this volume, written by active researchers in the field, provide an up-to-date overview of the highly sophisticated techniques and their applications.
Author: L.A. Feigin Publisher: Springer Science & Business Media ISBN: 1475766246 Category : Science Languages : en Pages : 339
Book Description
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Author: Mikhail A. Krivoglaz Publisher: Springer ISBN: 9783642787676 Category : Science Languages : en Pages : 284
Book Description
Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scattering of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first monograph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two-volume mono graph published in Russian in 1983-84 (this edition is the revised translation of the latter).
Author: Z.L. Wang Publisher: Springer Science & Business Media ISBN: 030647249X Category : Technology & Engineering Languages : en Pages : 1519
Book Description
These books, with of a total of 40 chapters, are a comprehensive and complete introductory text on the synthesis, characterization, and applications of nanomaterials. They are aimed at graduate students and researchers whose background is chemistry, physics, materials science, chemical engineering, electrical engineering, and biomedical science. The first part emphasizes the chemical and physical approaches used for synthesis of nanomaterials. The second part emphasizes the techniques used for characterizing the structure and properties of nanomaterials, aiming at describing the physical mechanism, data interpretation, and detailed applications of the techniques. The final part focuses on systems of different nanostructural materials with novel properties and applications.
Author: Peter S. Pershan Publisher: Cambridge University Press ISBN: 0521814014 Category : Science Languages : en Pages : 335
Book Description
A practical guide for graduate students and researchers on all aspects of x-ray scattering experiments on liquid surfaces and interfaces.
Author: Françoise Hippert Publisher: Springer Science & Business Media ISBN: 1402033370 Category : Science Languages : en Pages : 580
Book Description
- Up-to-date account of the principles and practice of inelastic and spectroscopic methods available at neutron and synchrotron sources - Multi-technique approach set around a central theme, rather than a monograph on one technique - Emphasis on the complementarity of neutron spectroscopy and X-ray spectroscopy which are usually treated in separate books
Author: Professor of Materials Science Ryong-Joon Roe Publisher: Oxford University Press on Demand ISBN: 9780195113211 Category : Science Languages : en Pages : 331
Book Description
Also, to help students gain a unified view of diffraction, the distinction between wide-angle diffraction and small-angle scattering is postponed until late in the text."--BOOK JACKET.
Author: Jean Daillant
Author: Helmut Dosch
Author: Jean Daillant
Author: Hartmut Zabel
Author: L.A. Feigin
Author: Mikhail A. Krivoglaz
Author: Z.L. Wang
Author: Peter S. Pershan
Author: Françoise Hippert
Author: Professor of Materials Science Ryong-Joon Roe
Author: Jean Daillant