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Author: James Steven Becker Publisher: ISBN: 9781124717265 Category : Languages : en Pages : 208
Book Description
This thesis explores the surface structure and vibrational dynamics of organic thin films using the surface-sensitive and non-destructive helium atom scattering technique. The interfacial dynamics of thin polymer films and organic-semiconductor hybrid interfaces are examined here with the goals of determining the surfaces' ability to accommodate collisional energy, the threshold film thickness at which the surface differs from the bulk or underlying substrate, and the structure and ordering of novel hybrid interfaces. Time-of-flight spectroscopy, helium atom diffraction and Debye-Waller attenuation of elastic peak intensities form the majority of the experiments performed here to measure the properties of interest.
Author: James Steven Becker Publisher: ISBN: 9781124717265 Category : Languages : en Pages : 208
Book Description
This thesis explores the surface structure and vibrational dynamics of organic thin films using the surface-sensitive and non-destructive helium atom scattering technique. The interfacial dynamics of thin polymer films and organic-semiconductor hybrid interfaces are examined here with the goals of determining the surfaces' ability to accommodate collisional energy, the threshold film thickness at which the surface differs from the bulk or underlying substrate, and the structure and ordering of novel hybrid interfaces. Time-of-flight spectroscopy, helium atom diffraction and Debye-Waller attenuation of elastic peak intensities form the majority of the experiments performed here to measure the properties of interest.
Author: Abraham Ulman Publisher: Elsevier ISBN: 1483288897 Category : Technology & Engineering Languages : en Pages : 415
Book Description
Physics of Thin Films has been one of the longest running continuing series in thin film science consisting of 20 volumes since 1963. The series contains some of the highest quality studies of the properties ofvarious thin films materials and systems.In order to be able to reflect the development of todays science and to cover all modern aspects of thin films, the series, beginning with Volume 20, will move beyond the basic physics of thin films. It will address the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.Edited by Abraham Ulman, Organic Thin Films and Surfaces: Directions for the Nineties will be the first volume to link two dynamic areas in the physical sciences--organic thin films and surface science. Contributions from leading experts in the field cover a range of important topics on the processing, characterization, and applications of organic thin films.
Author: Horst-Günter Rubahn Publisher: Springer Science & Business Media ISBN: 3540959300 Category : Technology & Engineering Languages : en Pages : 208
Book Description
Organic semiconductors are a central topic of advanced materials research. The book is aiming at bridging the gap between the development and production of devices and basic research on thin film characterisation using cutting-edge techniques in surface and interface science. Topics involve organic molecular-based sensors; interfaces in organic diodes and transistors; mobility in organic field effect transistors and space charge problems; integration of optoelectronic nanostructures; nonlinear optical properties of organic nanostructures; the wetting layer problem; how to get from functionalized molecules to nanoaggregates; optical, electrical and mechanical properties of organic nanofibers as well; as near field investigations of organic thin films.
Author: Karsten Hinrichs Publisher: Springer Science & Business Media ISBN: 3642401287 Category : Science Languages : en Pages : 369
Book Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Author: Abraham Ulman Publisher: Butterworth-Heinemann ISBN: Category : Science Languages : en Pages : 302
Book Description
Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.
Author: Matthew Pelliccione Publisher: Springer Science & Business Media ISBN: 0387751092 Category : Technology & Engineering Languages : en Pages : 206
Book Description
The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.
Author: Sunil K Sinha Publisher: World Scientific ISBN: 9811231524 Category : Science Languages : en Pages : 430
Book Description
Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.
Author: Publisher: Elsevier ISBN: 0080480012 Category : Science Languages : en Pages : 800
Book Description
The book is devoted to the consideration of the different processes taking place in thin films and at surfaces. Since the most important physico-chemical phenomena in such media are accompanied by the rearrangement of an intra- and intermolecular coordinates and consequently a surrounding molecular ensemble, the theory of radiationless multi-vibrational transitions is used for its description. The second part of the book considers the numerous surface phenomena. And in the third part is described the preparation methods and characteristics of different types of thin films. Both experimental and theoretical descriptions are represented. Media rearrangement coupled with the reagent transformation largely determines the absolute value and temperature dependence of the rate constants and other characteristics of the considered processes. These effects are described at the atomic or molecular level based on the multi-phonon theory, starting from the first pioneering studies through to contemporary studies.A number of questions are included at the end of many chapters to further reinforce the material presented.· Unified approach to the description of numerous physico-chemical phenomena in different materials· Based on the pioneering research work of the authors· Explantion of a variety of experimental observations· Material is presented at two levels of complexity for specialists and non-specialists · Identifies existing and potential applications of the processes and phenomena · Includes questions at the end of some chapters to further reinforce the material discussed
Author: James Steven Becker
Author: James Steven Becker
Author: 
Author: Abraham Ulman
Author: B. G. Demczyk
Author: Horst-Günter Rubahn
Author: Karsten Hinrichs
Author: Abraham Ulman
Author: Matthew Pelliccione
Author: Sunil K Sinha
Author: