Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Std 1149.1b-1994
Author: Supplement to IEEE Std 1491.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture
Author: I E E E * StandardsPublisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9781559374972
Category :
Languages : en
Pages : 66
Book Description
1149.1b-1994 Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture
Author: Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-scan Architecture
Author: Institute of Electrical and Electronics EngineersPublisher:
ISBN: 9781559374972
Category : Integrated circuits
Languages : en
Pages : 0
Book Description
"A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language (VHDL). General characteristics, the overall structure of a Boundary-Scan Description Language (BSDL) description, special cases, and example packages are included.
IEEE Std 1149.1-1990
Author: IEEE Standard Test Access Port and Boundary-scan Architecture
Author: IEEE Standards BoardPublisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 0
Book Description
IEEE Standard Test Access Port and Boundary-scan Architecture
Author: Publisher:
ISBN: 9780738129457
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
IEEE standard test access port and boundary-scan architecture
Author: Institute of Electrical and Electronics EngineersPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Author: