Study of the Edge Emission of Cadmium Sulphide and Silicon Bombarded by Electrons PDF Download
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Author: LABORATOIRE D'INFRA ROUGE TECHNIQUE ET APPLIQUE GIF-SUR-YVETTE (France) Publisher: ISBN: Category : Languages : en Pages : 1
Book Description
Mixed cadmium and zinc sulfides were obtained with a view to testing whether a coincidence is still observed between the absorption edge of the spectrum and the wavelength of the light emitted. The main results are those obtained from studies at liquid air temperature. On certain samples a complex light is obtained, containing a yellow band, a green band and a blue band at about 4900 angstroms, this wavelength corresponding to that of the absorption edge at the same temperature. On other crystals however, this band is very weak or disappears completely. In these cases only the green band, fairly complex in structure, and the yellow band appear. All the characteristics of the phenomenon appear to indicate that the light observed is due to a direct return from the conduction band to the valence band, or to a return from a level very close to the conduction band to the valence band. (Author).
Author: LABORATOIRE D'INFRA ROUGE TECHNIQUE ET APPLIQUE GIF-SUR-YVETTE (France) Publisher: ISBN: Category : Languages : en Pages : 1
Book Description
Mixed cadmium and zinc sulfides were obtained with a view to testing whether a coincidence is still observed between the absorption edge of the spectrum and the wavelength of the light emitted. The main results are those obtained from studies at liquid air temperature. On certain samples a complex light is obtained, containing a yellow band, a green band and a blue band at about 4900 angstroms, this wavelength corresponding to that of the absorption edge at the same temperature. On other crystals however, this band is very weak or disappears completely. In these cases only the green band, fairly complex in structure, and the yellow band appear. All the characteristics of the phenomenon appear to indicate that the light observed is due to a direct return from the conduction band to the valence band, or to a return from a level very close to the conduction band to the valence band. (Author).
Author: Donald T. Hawkins Publisher: Springer Science & Business Media ISBN: 1468413872 Category : Science Languages : en Pages : 305
Book Description
Auger electron spectroscopy is rapidly developing into the single most powerful analytical technique in basic and applied science.for investigating the chemical and structural properties of solids. Its ex plosive growth beginning in 1967 was triggered by the development of Auger analyzers capable of de tecting one atom layer of material in a fraction of a second. Continued growth was guaranteed firstly by the commercial availability of apparatus which combined the capabilities of scanning electron mi croscopy and ion-mill depth profiling with Auger analysis, and secondly by the increasing need to know the atomistics of many processes in fundamental research and engineering applications. The expanding use of Auger analysis was accompanied by an increase in the number of publications dealing with it. Because of the developing nature of Auger spectroscopy, the articles have appeared in many different sources covering diverse disciplines, so that it is extremely difficult to discover just what has or has not been subjected to Auger analysis. In this situation, a comprehensive bibliography is obviou-sly useful to those both inside and outside the field. For those in the field, this bibliography should be a wonderful time saver for locating certain references, in researching a particular topic, or when considering various aspects of instrumentation or data analysis. This bibliography not only provides the most complete listing of references pertinent to surface Auger analysis available today, but it is also a basis for extrapolating from past trends to future expectations.
Author: LABORATOIRE D'INFRA ROUGE TECHNIQUE ET APPLIQUE GIF-SUR-YVETTE (France)
Author: LABORATOIRE D'INFRA ROUGE TECHNIQUE ET APPLIQUE GIF-SUR-YVETTE (France)
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Author: Defense Documentation Center (U.S.)
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Author: D.L. Grigsby
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Author: Nick A. Komons
Author: Donald T. Hawkins
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