Author: Sarunas Raudys
Publisher: Springer Science & Business Media
ISBN: 1447103599
Category : Computers
Languages : en
Pages : 309
Book Description
The classification of patterns is an important area of research which is central to all pattern recognition fields, including speech, image, robotics, and data analysis. Neural networks have been used successfully in a number of these fields, but so far their application has been based on a 'black box approach' with no real understanding of how they work. In this book, Sarunas Raudys - an internationally respected researcher in the area - provides an excellent mathematical and applied introduction to how neural network classifiers work and how they should be used.. .
Statistical and Neural Classifiers
Author: Sarunas Raudys
Publisher: Springer Science & Business Media
ISBN: 1447103599
Category : Computers
Languages : en
Pages : 309
Book Description
The classification of patterns is an important area of research which is central to all pattern recognition fields, including speech, image, robotics, and data analysis. Neural networks have been used successfully in a number of these fields, but so far their application has been based on a 'black box approach' with no real understanding of how they work. In this book, Sarunas Raudys - an internationally respected researcher in the area - provides an excellent mathematical and applied introduction to how neural network classifiers work and how they should be used.. .
Publisher: Springer Science & Business Media
ISBN: 1447103599
Category : Computers
Languages : en
Pages : 309
Book Description
The classification of patterns is an important area of research which is central to all pattern recognition fields, including speech, image, robotics, and data analysis. Neural networks have been used successfully in a number of these fields, but so far their application has been based on a 'black box approach' with no real understanding of how they work. In this book, Sarunas Raudys - an internationally respected researcher in the area - provides an excellent mathematical and applied introduction to how neural network classifiers work and how they should be used.. .
Statistical and Neural Classifiers
Author: Sarunas Raudys
Publisher:
ISBN: 9781447103608
Category :
Languages : en
Pages : 324
Book Description
Publisher:
ISBN: 9781447103608
Category :
Languages : en
Pages : 324
Book Description
Statistical Pattern Recognition
Author: Andrew R. Webb
Publisher: John Wiley & Sons
ISBN: 0470854782
Category : Mathematics
Languages : en
Pages : 516
Book Description
Statistical pattern recognition is a very active area of study andresearch, which has seen many advances in recent years. New andemerging applications - such as data mining, web searching,multimedia data retrieval, face recognition, and cursivehandwriting recognition - require robust and efficient patternrecognition techniques. Statistical decision making and estimationare regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fullyupdated with new methods, applications and references. It providesa comprehensive introduction to this vibrant area - with materialdrawn from engineering, statistics, computer science and the socialsciences - and covers many application areas, such as databasedesign, artificial neural networks, and decision supportsystems. * Provides a self-contained introduction to statistical patternrecognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vectormachines, and unsupervised classification. * Each section concludes with a description of the applicationsthat have been addressed and with further developments of thetheory. * Includes background material on dissimilarity, parameterestimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions tomore lengthy projects. The book is aimed primarily at senior undergraduate and graduatestudents studying statistical pattern recognition, patternprocessing, neural networks, and data mining, in both statisticsand engineering departments. It is also an excellent source ofreference for technical professionals working in advancedinformation development environments. For further information on the techniques and applicationsdiscussed in this book please visit ahref="http://www.statistical-pattern-recognition.net/"www.statistical-pattern-recognition.net/a
Publisher: John Wiley & Sons
ISBN: 0470854782
Category : Mathematics
Languages : en
Pages : 516
Book Description
Statistical pattern recognition is a very active area of study andresearch, which has seen many advances in recent years. New andemerging applications - such as data mining, web searching,multimedia data retrieval, face recognition, and cursivehandwriting recognition - require robust and efficient patternrecognition techniques. Statistical decision making and estimationare regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fullyupdated with new methods, applications and references. It providesa comprehensive introduction to this vibrant area - with materialdrawn from engineering, statistics, computer science and the socialsciences - and covers many application areas, such as databasedesign, artificial neural networks, and decision supportsystems. * Provides a self-contained introduction to statistical patternrecognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vectormachines, and unsupervised classification. * Each section concludes with a description of the applicationsthat have been addressed and with further developments of thetheory. * Includes background material on dissimilarity, parameterestimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions tomore lengthy projects. The book is aimed primarily at senior undergraduate and graduatestudents studying statistical pattern recognition, patternprocessing, neural networks, and data mining, in both statisticsand engineering departments. It is also an excellent source ofreference for technical professionals working in advancedinformation development environments. For further information on the techniques and applicationsdiscussed in this book please visit ahref="http://www.statistical-pattern-recognition.net/"www.statistical-pattern-recognition.net/a
Pattern Classification
Author: Jgen Schmann
Publisher: Wiley-Interscience
ISBN:
Category : Business & Economics
Languages : en
Pages : 424
Book Description
PATTERN CLASSIFICATION a unified view of statistical and neural approaches The product of years of research and practical experience in pattern classification, this book offers a theory-based engineering perspective on neural networks and statistical pattern classification. Pattern Classification sheds new light on the relationship between seemingly unrelated approaches to pattern recognition, including statistical methods, polynomial regression, multilayer perceptron, and radial basis functions. Important topics such as feature selection, reject criteria, classifier performance measurement, and classifier combinations are fully covered, as well as material on techniques that, until now, would have required an extensive literature search to locate. A full program of illustrations, graphs, and examples helps make the operations and general properties of different classification approaches intuitively understandable. Offering a lucid presentation of complex applications and their algorithms, Pattern Classification is an invaluable resource for researchers, engineers, and graduate students in this rapidly developing field.
Publisher: Wiley-Interscience
ISBN:
Category : Business & Economics
Languages : en
Pages : 424
Book Description
PATTERN CLASSIFICATION a unified view of statistical and neural approaches The product of years of research and practical experience in pattern classification, this book offers a theory-based engineering perspective on neural networks and statistical pattern classification. Pattern Classification sheds new light on the relationship between seemingly unrelated approaches to pattern recognition, including statistical methods, polynomial regression, multilayer perceptron, and radial basis functions. Important topics such as feature selection, reject criteria, classifier performance measurement, and classifier combinations are fully covered, as well as material on techniques that, until now, would have required an extensive literature search to locate. A full program of illustrations, graphs, and examples helps make the operations and general properties of different classification approaches intuitively understandable. Offering a lucid presentation of complex applications and their algorithms, Pattern Classification is an invaluable resource for researchers, engineers, and graduate students in this rapidly developing field.
Machine Learning Neural And Statistical Classification
Author: Donald Michie
Publisher:
ISBN: 9788188689736
Category :
Languages : en
Pages : 290
Book Description
Publisher:
ISBN: 9788188689736
Category :
Languages : en
Pages : 290
Book Description
Pattern Recognition and Neural Networks
Author: Brian D. Ripley
Publisher: Cambridge University Press
ISBN: 9780521717700
Category : Computers
Languages : en
Pages : 420
Book Description
This 1996 book explains the statistical framework for pattern recognition and machine learning, now in paperback.
Publisher: Cambridge University Press
ISBN: 9780521717700
Category : Computers
Languages : en
Pages : 420
Book Description
This 1996 book explains the statistical framework for pattern recognition and machine learning, now in paperback.
Computer Systems that Learn
Author: Sholom M. Weiss
Publisher: Morgan Kaufmann Publishers
ISBN:
Category : Computers
Languages : en
Pages : 248
Book Description
This text is a practical guide to classification learning systems and their applications, which learn from sample data and make predictions for new cases. The authors examine prominent methods from each area, using an engineering approach and taking the practitioner's point of view.
Publisher: Morgan Kaufmann Publishers
ISBN:
Category : Computers
Languages : en
Pages : 248
Book Description
This text is a practical guide to classification learning systems and their applications, which learn from sample data and make predictions for new cases. The authors examine prominent methods from each area, using an engineering approach and taking the practitioner's point of view.
Machine Learning, Neural and Statistical Classification
Author: Donald Michie
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 312
Book Description
Artificial Neural Networks and Statistical Pattern Recognition
Author: I.K. Sethi
Publisher: Elsevier
ISBN: 148329787X
Category : Computers
Languages : en
Pages : 286
Book Description
With the growing complexity of pattern recognition related problems being solved using Artificial Neural Networks, many ANN researchers are grappling with design issues such as the size of the network, the number of training patterns, and performance assessment and bounds. These researchers are continually rediscovering that many learning procedures lack the scaling property; the procedures simply fail, or yield unsatisfactory results when applied to problems of bigger size. Phenomena like these are very familiar to researchers in statistical pattern recognition (SPR), where the curse of dimensionality is a well-known dilemma. Issues related to the training and test sample sizes, feature space dimensionality, and the discriminatory power of different classifier types have all been extensively studied in the SPR literature. It appears however that many ANN researchers looking at pattern recognition problems are not aware of the ties between their field and SPR, and are therefore unable to successfully exploit work that has already been done in SPR. Similarly, many pattern recognition and computer vision researchers do not realize the potential of the ANN approach to solve problems such as feature extraction, segmentation, and object recognition. The present volume is designed as a contribution to the greater interaction between the ANN and SPR research communities.
Publisher: Elsevier
ISBN: 148329787X
Category : Computers
Languages : en
Pages : 286
Book Description
With the growing complexity of pattern recognition related problems being solved using Artificial Neural Networks, many ANN researchers are grappling with design issues such as the size of the network, the number of training patterns, and performance assessment and bounds. These researchers are continually rediscovering that many learning procedures lack the scaling property; the procedures simply fail, or yield unsatisfactory results when applied to problems of bigger size. Phenomena like these are very familiar to researchers in statistical pattern recognition (SPR), where the curse of dimensionality is a well-known dilemma. Issues related to the training and test sample sizes, feature space dimensionality, and the discriminatory power of different classifier types have all been extensively studied in the SPR literature. It appears however that many ANN researchers looking at pattern recognition problems are not aware of the ties between their field and SPR, and are therefore unable to successfully exploit work that has already been done in SPR. Similarly, many pattern recognition and computer vision researchers do not realize the potential of the ANN approach to solve problems such as feature extraction, segmentation, and object recognition. The present volume is designed as a contribution to the greater interaction between the ANN and SPR research communities.
From Statistics to Neural Networks
Author: Vladimir Cherkassky
Publisher: Springer Science & Business Media
ISBN: 3642791190
Category : Computers
Languages : en
Pages : 414
Book Description
The NATO Advanced Study Institute From Statistics to Neural Networks, Theory and Pattern Recognition Applications took place in Les Arcs, Bourg Saint Maurice, France, from June 21 through July 2, 1993. The meeting brought to gether over 100 participants (including 19 invited lecturers) from 20 countries. The invited lecturers whose contributions appear in this volume are: L. Almeida (INESC, Portugal), G. Carpenter (Boston, USA), V. Cherkassky (Minnesota, USA), F. Fogelman Soulie (LRI, France), W. Freeman (Berkeley, USA), J. Friedman (Stanford, USA), F. Girosi (MIT, USA and IRST, Italy), S. Grossberg (Boston, USA), T. Hastie (AT&T, USA), J. Kittler (Surrey, UK), R. Lippmann (MIT Lincoln Lab, USA), J. Moody (OGI, USA), G. Palm (U1m, Germany), B. Ripley (Oxford, UK), R. Tibshirani (Toronto, Canada), H. Wechsler (GMU, USA), C. Wellekens (Eurecom, France) and H. White (San Diego, USA). The ASI consisted of lectures overviewing major aspects of statistical and neural network learning, their links to biological learning and non-linear dynamics (chaos), and real-life examples of pattern recognition applications. As a result of lively interactions between the participants, the following topics emerged as major themes of the meeting: (1) Unified framework for the study of Predictive Learning in Statistics and Artificial Neural Networks (ANNs); (2) Differences and similarities between statistical and ANN methods for non parametric estimation from examples (learning); (3) Fundamental connections between artificial learning systems and biological learning systems.
Publisher: Springer Science & Business Media
ISBN: 3642791190
Category : Computers
Languages : en
Pages : 414
Book Description
The NATO Advanced Study Institute From Statistics to Neural Networks, Theory and Pattern Recognition Applications took place in Les Arcs, Bourg Saint Maurice, France, from June 21 through July 2, 1993. The meeting brought to gether over 100 participants (including 19 invited lecturers) from 20 countries. The invited lecturers whose contributions appear in this volume are: L. Almeida (INESC, Portugal), G. Carpenter (Boston, USA), V. Cherkassky (Minnesota, USA), F. Fogelman Soulie (LRI, France), W. Freeman (Berkeley, USA), J. Friedman (Stanford, USA), F. Girosi (MIT, USA and IRST, Italy), S. Grossberg (Boston, USA), T. Hastie (AT&T, USA), J. Kittler (Surrey, UK), R. Lippmann (MIT Lincoln Lab, USA), J. Moody (OGI, USA), G. Palm (U1m, Germany), B. Ripley (Oxford, UK), R. Tibshirani (Toronto, Canada), H. Wechsler (GMU, USA), C. Wellekens (Eurecom, France) and H. White (San Diego, USA). The ASI consisted of lectures overviewing major aspects of statistical and neural network learning, their links to biological learning and non-linear dynamics (chaos), and real-life examples of pattern recognition applications. As a result of lively interactions between the participants, the following topics emerged as major themes of the meeting: (1) Unified framework for the study of Predictive Learning in Statistics and Artificial Neural Networks (ANNs); (2) Differences and similarities between statistical and ANN methods for non parametric estimation from examples (learning); (3) Fundamental connections between artificial learning systems and biological learning systems.