IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data PDF Download

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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data PDF Author:
Publisher:
ISBN: 9780738116464
Category : Integrated circuits
Languages : en
Pages : 132

Book Description
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
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