Author: James R. EhrsteinPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
Spreading Resistance Symposium
Author: James R. EhrsteinPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
NBS Special Publication
Author: Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 956
Book Description
Emerging Semiconductor Technology
Author: Dinesh C. GuptaPublisher: ASTM International
ISBN: 0803104596
Category : Process control
Languages : en
Pages : 701
Book Description
Spreading Resistance Analysis for Silicon Layers with Nonuniform Resistivity
Author: David H. DickeyPublisher:
ISBN:
Category : Electric resistance, Spreading
Languages : en
Pages : 76
Book Description
Publications
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 540
Book Description
Journal of Research of the National Bureau of Standards
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 554
Book Description
Nondestructive Evaluation of Semiconductor Materials and Devices
Author: J. ZemelPublisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Semiconductor Measurement Technology
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 76
Book Description
Publications of the National Bureau of Standards
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category : Washington (D.C.)
Languages : en
Pages : 544
Book Description
Publications of the National Bureau of Standards ... Catalog
Author: United States. National Bureau of StandardsPublisher:
ISBN:
Category :
Languages : en
Pages : 548
Book Description