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Author: Ben Obinero Uwakwhe Publisher: CRC Press ISBN: 1420040103 Category : Technology & Engineering Languages : en Pages : 1510
Book Description
This two-volume set comprises the proceedings of the 2002 symposium concerned with innovation in the construction industry and global competition. Approximately 115 papers address topics ranging from business improvement to the impact of innovation on the built environment; and globalization and competitiveness.
Author: Ben Obinero Uwakwhe Publisher: CRC Press ISBN: 1420040103 Category : Technology & Engineering Languages : en Pages : 1510
Book Description
This two-volume set comprises the proceedings of the 2002 symposium concerned with innovation in the construction industry and global competition. Approximately 115 papers address topics ranging from business improvement to the impact of innovation on the built environment; and globalization and competitiveness.
Author: Alessandro Birolini Publisher: Springer ISBN: 3662542099 Category : Technology & Engineering Languages : en Pages : 666
Book Description
This book shows how to build in and assess reliability, availability, maintainability, and safety (RAMS) of components, equipment, and systems. It presents the state of the art of reliability (RAMS) engineering, in theory & practice, and is based on over 30 years author's experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The book structure allows rapid access to practical results. Methods & tools are given in a way that they can be tailored to cover different RAMS requirement levels. Thanks to Appendices A6 - A8 the book is mathematically self-contained, and can be used as a textbook or as a desktop reference with a large number of tables (60), figures (210), and examples / exercises^ 10,000 per year since 2013) were the motivation for this final edition, the 13th since 1985, including German editions. Extended and carefully reviewed to improve accuracy, it represents the continuous improvement effort to satisfy reader's needs and confidence. New are an introduction to risk management with structurally new models based on semi-Markov processes & to the concept of mean time to accident, reliability & availability of a k-out-of-n redundancy with arbitrary repair rate for n - k=2, 10 new homework problems, and refinements, in particular, on multiple failure mechanisms, approximate expressions, incomplete coverage, data analysis, and comments on ë, MTBF, MTTF, MTTR, R, PA.
Author: Adrian E. Raftery Publisher: CRC Press ISBN: 1420035398 Category : Mathematics Languages : en Pages : 571
Book Description
This volume discusses an important area of statistics and highlights the most important statistical advances. It is divided into four sections: statistics in the life and medical sciences, business and social science, the physical sciences and engineering, and theory and methods of statistics.
Author: Hoang Pham Publisher: Springer Science & Business Media ISBN: 9789813083844 Category : Computers Languages : en Pages : 364
Book Description
Providing a general introduction to software reliability engineering, this book presents detailed analytical models, state-of-the-art techniques, methodologies, and tools used to assess the reliability of software systems. It also explores new directions of research in the field of software reliability engineering, including fault tolerant software and a new software reliability model that includes environmental factors.
Author: Mehmet Sahinoglu Publisher: John Wiley & Sons ISBN: 0470127864 Category : Computers Languages : en Pages : 344
Book Description
This book is based on the author's advanced undergraduate or beginning graduate course, Computer Security and Reliability, which he has been teaching for the past six years. The author takes an index based quantitative approach to the subject as opposed to the usual verbal or qualitative or subjective case histories. The TWC-Solver, available on an accompanying CD-ROM, contains 10 java-coded, main applications and hundreds of subitems, and assists the reader in understanding the numerical implementations of the book chapters.
Author: Ben Obinero Uwakwhe
Author: 
Author: Ben Obinero Uwakwhe
Author: 
Author: Alessandro Birolini
Author: Adrian E. Raftery
Author: D. J. Dumin
Author: Anastasius Moumtzoglou
Author: Hoang Pham
Author: 
Author: Mehmet Sahinoglu