Author: United States. Office of Naval ResearchPublisher:
ISBN:
Category :
Languages : en
Pages : 312
Book Description
Review, Naval Research Laboratory, Washington, D.C.
Author: United States. Office of Naval ResearchPublisher:
ISBN:
Category :
Languages : en
Pages : 312
Book Description
NRL Review
Author: Design, Fabrication and Characterization of Gated Silicon Field Emission Devices
Author: Johann Thomas TrujilloPublisher:
ISBN:
Category :
Languages : en
Pages : 388
Book Description
New Serial Titles
Author: Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 1608
Book Description
A union list of serials commencing publication after Dec. 31, 1949.
Field Emission Electronics
Author: Nikolay EgorovPublisher: Springer
ISBN: 3319565613
Category : Technology & Engineering
Languages : en
Pages : 578
Book Description
This book is dedicated to field emission electronics, a promising field at the interface between “classic” vacuum electronics and nanotechnology. In addition to theoretical models, it includes detailed descriptions of experimental and research techniques and production technologies for different types of field emitters based on various construction principles. It particularly focuses on research into and production of field cathodes and electron guns using recently developed nanomaterials and carbon nanotubes. Further, it discusses the applications of field emission cathodes in new technologies such as light sources, flat screens, microwave and X-ray devices.
Photo-excitation of Gated P-silicon Field Emitter Arrays
Author: Kendrick Xuong LiuComputing Information Directory
Author: Darlene Myers HildebrandtPublisher:
ISBN:
Category : Computer science
Languages : en
Pages : 476
Book Description
Modern Microwave and Millimeter-Wave Power Electronics
Author: Gregory S. NusinovichPublisher: John Wiley & Sons
ISBN: 0471683728
Category : Technology & Engineering
Languages : en
Pages : 885
Book Description
A comprehensive study of microwave vacuum electronic devices and their current and future applications While both vacuum and solid-state electronics continue to evolve and provide unique solutions, emerging commercial and military applications that call for higher power and higher frequencies to accommodate massive volumes of transmitted data are the natural domain of vacuum electronics technology. Modern Microwave and Millimeter-Wave Power Electronics provides systems designers, engineers, and researchers-especially those with primarily solid-state training-with a thoroughly up-to-date survey of the rich field of microwave vacuum electronic device (MVED) technology. This book familiarizes the R&D and academic communities with the capabilities and limitations of MVED and highlights the exciting scientific breakthroughs of the past decade that are dramatically increasing the compactness, efficiency, cost-effectiveness, and reliability of this entire class of devices. This comprehensive text explores a wide range of topics: Traveling-wave tubes, which form the backbone of satellite and airborne communications, as well as of military electronic countermeasures systems Microfabricated MVEDs and advanced electron beam sources Klystrons, gyro-amplifiers, and crossed-field devices "Virtual prototyping" of MVEDs via advanced 3-D computational models High-Power Microwave (HPM) sources Next-generation microwave structures and circuits How to achieve linear amplification Advanced materials technologies for MVEDs A Web site appendix providing a step-by-step walk-through of a typical MVED design process Concluding with an in-depth examination of emerging applications and future possibilities for MVEDs, Modern Microwave and Millimeter-Wave Power Electronics ensures that systems designers and engineers understand and utilize the significant potential of this mature, yet continually developing technology. SPECIAL NOTE: All of the editors' royalties realized from the sale of this book will fund the future research and publication activities of graduate students in the vacuum electronics field.
Proceedings of the 1993 Particle Accelerator Conference
Author: In Situ Real-Time Characterization of Thin Films
Author: Orlando AucielloPublisher: John Wiley & Sons
ISBN: 9780471241416
Category : Science
Languages : en
Pages : 282
Book Description
An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application