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Author: R. Simon Sherratt Publisher: MDPI ISBN: 3039364790 Category : Science Languages : en Pages : 146
Book Description
Advances in technology have produced a range of on-body sensors and smartwatches that can be used to monitor a wearer’s health with the objective to keep the user healthy. However, the real potential of such devices not only lies in monitoring but also in interactive communication with expert-system-based cloud services to offer personalized and real-time healthcare advice that will enable the user to manage their health and, over time, to reduce expensive hospital admissions. To meet this goal, the research challenges for the next generation of wearable healthcare devices include the need to offer a wide range of sensing, computing, communication, and human–computer interaction methods, all within a tiny device with limited resources and electrical power. This Special Issue presents a collection of six papers on a wide range of research developments that highlight the specific challenges in creating the next generation of low-power wearable healthcare sensors.
Author: R. Simon Sherratt Publisher: MDPI ISBN: 3039364790 Category : Science Languages : en Pages : 146
Book Description
Advances in technology have produced a range of on-body sensors and smartwatches that can be used to monitor a wearer’s health with the objective to keep the user healthy. However, the real potential of such devices not only lies in monitoring but also in interactive communication with expert-system-based cloud services to offer personalized and real-time healthcare advice that will enable the user to manage their health and, over time, to reduce expensive hospital admissions. To meet this goal, the research challenges for the next generation of wearable healthcare devices include the need to offer a wide range of sensing, computing, communication, and human–computer interaction methods, all within a tiny device with limited resources and electrical power. This Special Issue presents a collection of six papers on a wide range of research developments that highlight the specific challenges in creating the next generation of low-power wearable healthcare sensors.
Author: Nuno Lourenço Publisher: Springer ISBN: 3319420372 Category : Technology & Engineering Languages : en Pages : 199
Book Description
This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit’s performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described.
Author: Pradeep Kumar Mallick Publisher: Springer Nature ISBN: 9811570310 Category : Technology & Engineering Languages : en Pages : 1126
Book Description
This book presents selected, high-quality research papers from the International Conference on Electronic Systems and Intelligent Computing (ESIC 2020), held at NIT Yupia, Arunachal Pradesh, India, on 2 – 4 March 2020. Discussing the latest challenges and solutions in the field of smart computing, cyber-physical systems and intelligent technologies, it includes papers based on original theoretical, practical and experimental simulations, developments, applications, measurements, and testing. The applications and solutions featured provide valuable reference material for future product development.
Author: Zhanhai Qin Publisher: Springer Science & Business Media ISBN: 0387239057 Category : Technology & Engineering Languages : en Pages : 295
Book Description
Symbolic analysis is an intriguing topic in VLSI designs. The analysis methods are crucial for the applications to the parasitic reduction and analog circuit evaluation. However, analyzing circuits symbolically remains a challenging research issue. Therefore, in this book, we survey the recent results as the progress of on-going works rather than as the solution of the field. For parasitic reduction, we approximate a huge amount of electrical parameters into a simplified RLC network. This reduction allows us to handle very large integrated circuits with given memory capacity and CPU time. A symbolic analysis approach reduces the circuit according to the network topology. Thus, the designer can maintain the meaning of the original network and perform the analysis hierarchically. For analog circuit designs, symbolic analysis provides the relation between the tunable parameters and the characteristics of the circuit. The analysis allows us to optimize the circuit behavior. The book is divided into three parts. Part I touches on the basics of circuit analysis in time domain and in s domain. For an s domain expression, the Taylor's expansion with s approaching infinity is equivalent to the time domain solution after the inverse Laplace transform. On the other hand, the Taylor's expansion when s approaches zero derives the moments of the output responses in time domain. Part II focuses on the techniques for parasitic reduction. In Chapter 2, we present the approximation methods to match the first few moments with reduced circuit orders. In Chapter 3, we apply the Y-Delta transformation to reduce the dynamic linear network. The method finds the exact values of the low order coefficients of the numerator and denominator of the transfer function and thus matches part of the moments. In Chapter 4, we handle two major issues of the Y-Delta transformation: common factors in fractional expressions and round-off errors. Chapter 5 explains the stability of the reduced expression, in particular the Ruth-Hurwitz Criterion. We make an effort to describe the proof of the Criterion because the details are omitted in most of the contemporary textbooks. In Chapter 6, we present techniques to synthesize circuits to approximate the reduced expressions after the transformation. In Part III, we discuss symbolic generation of the determinants and cofactors for the application to analog designs. In Chapter 7, we depict the classical topological analysis approach. In Chapter 8, we describe a determinant decision diagram approach that exploits the sparsity of the matrix to accelerate the computation. In Chapter 9, we take only significant terms when we search through determinant decision diagram to approximate the solution. In Chapter 10, we extend the determinant decision diagram to a hierarchical model. The construction of the modules through the hierarchy is similar to the Y-Delta transformation in the sense that a byproduct of common factors appears in the numerator and denominator. Therefore, we describe the method to prune the common factors.
Author: Basel Halak Publisher: Springer Nature ISBN: 3030237818 Category : Technology & Engineering Languages : en Pages : 231
Book Description
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Author: Guoyong Shi Publisher: Springer ISBN: 1493911031 Category : Technology & Engineering Languages : en Pages : 308
Book Description
This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.
Author: Esteban Tlelo-Cuautle Publisher: BoD – Books on Demand ISBN: 9533078847 Category : Technology & Engineering Languages : en Pages : 306
Book Description
This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc.
Author: Bo Liu Publisher: Springer ISBN: 3642391621 Category : Technology & Engineering Languages : en Pages : 243
Book Description
Computational intelligence techniques are becoming more and more important for automated problem solving nowadays. Due to the growing complexity of industrial applications and the increasingly tight time-to-market requirements, the time available for thorough problem analysis and development of tailored solution methods is decreasing. There is no doubt that this trend will continue in the foreseeable future. Hence, it is not surprising that robust and general automated problem solving methods with satisfactory performance are needed.
Author: Ricardo Martins Publisher: Springer ISBN: 3319340603 Category : Technology & Engineering Languages : en Pages : 220
Book Description
This book introduces readers to a variety of tools for analog layout design automation. After discussing the placement and routing problem in electronic design automation (EDA), the authors overview a variety of automatic layout generation tools, as well as the most recent advances in analog layout-aware circuit sizing. The discussion includes different methods for automatic placement (a template-based Placer and an optimization-based Placer), a fully-automatic Router and an empirical-based Parasitic Extractor. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. All the methods described are applied to practical examples for a 130nm design process, as well as placement and routing benchmark sets.
Author: Sheldon X. D. Tan Publisher: ISBN: 9783030261733 Category : Integrated circuits Languages : en Pages :
Book Description
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Author: R. Simon Sherratt 
Author: R. Simon Sherratt 
Author: Nuno Lourenço
Author: Pradeep Kumar Mallick
Author: Zhanhai Qin
Author: Basel Halak
Author: Guoyong Shi
Author: Esteban Tlelo-Cuautle
Author: Bo Liu
Author: Ricardo Martins
Author: Sheldon X. D. Tan