Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Special Issue on IEEE International Symposium on Physical and Failure Analysis of Circuits (IPFA) 2021
Author: Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
Author: Physical and Failure Analysis of Integrated Circuits
Author: IEEE Singapore SectionPhysical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Author: Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Physical and Failure Analysis of Integrated Circuits
Author: IEEE.Reliability and Failure Analysis of High-Power LED Packaging
Author: Cher Ming TanPublisher: Woodhead Publishing
ISBN: 012822407X
Category : Technology & Engineering
Languages : en
Pages : 190
Book Description
Reliability and Failure Analysis of High-Power LED Packaging provides fundamental understanding of the reliability and failure analysis of materials for high-power LED packaging, with the ultimate goal of enabling new packaging materials. This book describes the limitations of the present reliability standards in determining the lifetime of high-power LEDs due to the lack of deep understanding of the packaging materials and their interaction with each other. Many new failure mechanisms are investigated and presented with consideration of the different stresses imposed by varying environmental conditions. The detailed failure mechanisms are unique to this book and will provide insights for readers regarding the possible failure mechanisms in high-power LEDs. The authors also show the importance of simulation in understanding the hidden failure mechanisms in LEDs. Along with simulation, the use of various destructive and non-destructive tools such as C-SAM, SEM, FTIR, Optical Microscopy, etc. in investigation of the causes of LED failures are reviewed. The advancement of LEDs in the last two decades has opened vast new applications for LEDs which also has led to harsher stress conditions for high-power LEDs. Thus, existing standards and reliability tests need to be revised to meet the new demands for high-power LEDs. Introduces the failure mechanisms of high-power LEDs under varying environmental conditions and methods of how to test, simulate, and predict them Describes the chemistry underlying the material degradation and its impact on LEDs Discusses future directions of new packaging materials for improved performance and reliability of high-power LEDs
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2007
Author: Souvik MahapatraPublisher:
ISBN: 9781424410156
Category : Integrated circuits
Languages : en
Pages : 309
Book Description
The Physical and Failure Analysis of Integrated Circuits, 2001
Author: IEEE ELECTRON DEVICES SOCIETYPublisher: IEEE
ISBN: 9780780366763
Category : Technology & Engineering
Languages : en
Pages : 200
Book Description
Counterfeit Integrated Circuits
Author: Mark (Mohammad) TehranipoorPublisher: Springer
ISBN: 3319118242
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.