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Author: Sidney Irving Firstman Publisher: ISBN: Category : Automatic test equipment Languages : en Pages : 12
Book Description
Four categories of automatic test equipment (ATE) limitations are discussed: those surrounding automatic testing per se, those most closely associated with ATEprime equipment interactions, those associated with the ATE operating in its environment, and those concerned primarily with man-machine activities.
Author: Sidney Irving Firstman Publisher: ISBN: Category : Automatic test equipment Languages : en Pages : 12
Book Description
Four categories of automatic test equipment (ATE) limitations are discussed: those surrounding automatic testing per se, those most closely associated with ATEprime equipment interactions, those associated with the ATE operating in its environment, and those concerned primarily with man-machine activities.
Author: Keith Brindley Publisher: Elsevier ISBN: 1483101150 Category : Technology & Engineering Languages : en Pages : 241
Book Description
Automatic Test Equipment provides a clear and concise discussion of automatic test equipment. The book is comprised of nine chapters that deal with both concepts and standards. Chapter 1 reviews the term of automatic test equipment, while Chapter 2 covers the types of test equipment. Chapter 3 discusses fixture, and Chapters 4 and 5 talk about the strategies, methods, and processes used by automatic test equipment systems. The book also deals with computer and instrument buses, and then covers general-purpose interface bus. The last two chapters discuss the VMEbus and VXIbus. The text will be of great use to practitioners from different fields who wish to utilize automatic test equipment in their work.
Author: Erik Larsson Publisher: Springer Science & Business Media ISBN: 0387256245 Category : Technology & Engineering Languages : en Pages : 397
Book Description
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author: Publisher: ISBN: Category : Aeronautics Languages : en Pages : 580
Book Description
A selection of annotated references to unclassified reports and journal articles that were introduced into the NASA scientific and technical information system and announced in Scientific and technical aerospace reports (STAR) and International aerospace abstracts (IAA)
Author: Sidney Irving Firstman
Author: Sidney Irving Firstman
Author: Keith Brindley
Author: Erik Larsson
Author: Keith Brindley
Author: 
Author: United States. General Accounting Office
Author: United States. Defense Logistics Studies Information Exchange
Author: 
Author: Us Department Of Defense
Author: United States. Defense Logistics Studies Information Exchange