Solder Joint Reliability Prediction for Multiple Environments PDF Download

Author: Andrew E. Perkins
Publisher: Springer Science & Business Media
ISBN: 0387793941
Category : Technology & Engineering
Languages : en
Pages : 202

View

Book Description
Solder Joint Reliability Prediction for Multiple Environments will provide industry engineers, graduate students and academic researchers, and reliability experts with insights and useful tools for evaluating solder joint reliability of ceramic area array electronic packages under multiple environments. The material presented here is not limited to ceramic area array packages only, it can also be used as a methodology for relating numerical simulations and experimental data into an easy-to-use equation that captures the essential information needed to predict solder joint reliability. Such a methodology is often needed to relate complex information in a simple manner to managers and non-experts in solder joint who work with computer server applications as well as for harsh environments such as those found in the defense, space, and automotive industries.

Author: Andrew Eugene Perkins
Publisher:
ISBN: 9780549008842
Category :
Languages : en
Pages : 214

View

Book Description
Microelectronic systems are subjected to thermal cycling, power cycling, and vibration environments in various applications. These environments, whether applied sequentially or simultaneously, affect the solder joint reliability. Literature is scarce on predicting solder joint fatigue failure under such multiple loading environments. This thesis aims to develop a unified modeling methodology to study the reliability of electronic packages subjected to thermal cycling, power cycling, and vibration loading conditions. Such a modeling methodology is comprised of an enriched material model to accommodate time-, temperature-, and direction-dependent behavior of various materials in the assembly, and at the same time, will have a geometry model that can accommodate thermal- and power-cycling induced low-cycle fatigue damage mechanism as well as vibration-induced high-cycle fatigue damage mechanism. The developed modeling methodology is applied to study the reliability characteristics of ceramic area array electronic packages with lead-based solder interconnections. In particular, this thesis aims to study the reliability of such solder interconnections under thermal, power, and vibration conditions individually, and validate the model against these conditions using appropriate experimental data either from in-house experiments or existing literature. Once validated, this thesis also aims to perform a design of simulations study to understand the effect of various materials, geometry, and thermal parameters on solder joint reliability of ceramic ball grid array and ceramic column grid array packages, and use such a study to develop universal polynomial predictive equations for solder joint reliability. The thesis also aims to employ the unified modeling methodology to develop new understanding of the acceleration factor relationship between power cycling and thermal cycling. Finally, this thesis plans to use the unified modeling methodology to study solder joint reliability under the sequential application of thermal cycling and vibration loading conditions, and to validate the modeling results with first-of-its-kind experimental data. A nonlinear cumulative damage law is developed to account for the nonlinearity and effect of sequence loading under thermal cycling, power cycling, and vibration loading.

Author: John H. Lau
Publisher: Springer Nature
ISBN: 9811539200
Category : Technology & Engineering
Languages : en
Pages : 545

View

Book Description
This book focuses on the assembly and reliability of lead-free solder joints. Both the principles and engineering practice are addressed, with more weight placed on the latter. This is achieved by providing in-depth studies on a number of major topics such as solder joints in conventional and advanced packaging components, commonly used lead-free materials, soldering processes, advanced specialty flux designs, characterization of lead-free solder joints, reliability testing and data analyses, design for reliability, and failure analyses for lead-free solder joints. Uniquely, the content not only addresses electronic manufacturing services (EMS) on the second-level interconnects, but also packaging assembly on the first-level interconnects and the semiconductor back-end on the 3D IC integration interconnects. Thus, the book offers an indispensable resource for the complete food chain of electronics products.

Author: E-H Wong
Publisher: Woodhead Publishing
ISBN: 0857099116
Category : Technology & Engineering
Languages : en
Pages : 477

View

Book Description
Robust Design of Microelectronics Assemblies Against Mechanical Shock, Temperature and Moisture discusses how the reliability of packaging components is a prime concern to electronics manufacturers. The text presents a thorough review of this important field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques. The authors use their extensive experience to produce detailed chapters covering temperature, moisture, and mechanical shock induced failure, adhesive interconnects, and viscoelasticity. Useful program files and macros are also included. - Discusses how the reliability of packaging components is a prime concern to electronics manufacturers - Presents a thorough review of this important field of research, providing users with a practical guide that discusses theoretical aspects, experimental results, and modeling techniques - Includes program files and macros for additional study

Author: Carlos Algora
Publisher: John Wiley & Sons
ISBN: 1118755642
Category : Technology & Engineering
Languages : en
Pages : 908

View

Book Description
Concentrator Photovoltaics (CPV) is one of the most promising technologies to produce solar electricity at competitive prices. High performing CPV systems with efficiencies well over 30% and multi-megawatt CPV plants are now a reality. As a result of these achievements, the global CPV market is expected to grow dramatically over the next few years reaching cumulative installed capacity of 12.5 GW by 2020. In this context, both new and consolidated players are moving fast to gain a strategic advantage in this emerging market. Written with clear, brief and self-contained technical explanations, Handbook of Concentrator Photovoltaic Technology provides a complete overview of CPV covering: the fundamentals of solar radiation, solar cells, concentrator optics, modules and trackers; all aspects of characterization and reliability; case studies based on the description of actual systems and plants in the field; environmental impact, market potential and cost analysis. CPV technology is at a key point of expansion. This timely handbook aims to provide a comprehensive assessment of all CPV scientific, technological and engineering background with a view to equipping engineers and industry professionals with all of the vital information they need to help them sustain the impetus of this encouraging technology. Key features: Uniquely combines an explanation of the fundamentals of CPV systems and components with an overview of the market place and their real-life applications. Each chapter is written by well-known industry specialists with extensive expertise in each particular field of CPV technology. Reviews the basic concepts of multi-junction solar cells and new concepts for CPV cells, highlighting the key differences between them. Demonstrates the state of the art of several CPV centres and companies. Facilitates future cost calculation models for CPV. Features extensive case studies in each chapter, including coverage of CPV modules and systems.

Author: John H. Lau
Publisher: Springer Science & Business Media
ISBN: 9780442002602
Category : Computers
Languages : en
Pages : 504

View

Book Description
Looks at how solder joint reliability is influenced by flux reactions, solder paste, reflow methods, wave soldering, and cleaning. Explores failure mechanisms and includes practical methods for testing, analysis, and life prediction of solder joints subjected to conditions of fatigue, creep, stress relaxation, shock, and vibration. For engineers and designers involved in electronics packaging. Annotation copyrighted by Book News, Inc., Portland, OR

Author: Ahmad Kamal Ariffin
Publisher: Trans Tech Publications Ltd
ISBN: 3038134791
Category : Technology & Engineering
Languages : en
Pages : 1484

View

Book Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This two-volume set of 339 peer-reviewed papers covers the broad areas of Composite, Polymer and Ceramic Materials, Fracture Mechanics and Mechanisms, Materials, Mechanical Structure, Strength and Dynamics, Interface Failure and Failure Analysis, Nano-Mechanics and Structures, Damage and Failure, Structural Design and Optimisation, Fatigue and Crack Propagation, Materials Modelling and Computation, Concrete, Rock and Soil, Dynamic Fracture and Impact, Erosion and Corrosion, Smart Materials and Structures, Biomechanics and Other Novel Methods of Computer Modelling in Engineering and Science.

Author: Ephraim Suhir
Publisher: John Wiley & Sons
ISBN: 047088679X
Category : Technology & Engineering
Languages : en
Pages : 610

View

Book Description
The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice.

Author: John H. Lau
Publisher: Springer Science & Business Media
ISBN: 1461539102
Category : Technology & Engineering
Languages : en
Pages : 649

View

Book Description
Solders have given the designer of modern consumer, commercial, and military electronic systems a remarkable flexibility to interconnect electronic components. The properties of solder have facilitated broad assembly choices that have fueled creative applications to advance technology. Solder is the electrical and me chanical "glue" of electronic assemblies. This pervasive dependency on solder has stimulated new interest in applica tions as well as a more concerted effort to better understand materials properties. We need not look far to see solder being used to interconnect ever finer geo metries. Assembly of micropassive discrete devices that are hardly visible to the unaided eye, of silicon chips directly to ceramic and plastic substrates, and of very fine peripheral leaded packages constitute a few of solder's uses. There has been a marked increase in university research related to solder. New electronic packaging centers stimulate applications, and materials engineering and science departments have demonstrated a new vigor to improve both the materials and our understanding of them. Industrial research and development continues to stimulate new application, and refreshing new packaging ideas are emerging. New handbooks have been published to help both the neophyte and seasoned packaging engineer.

Author: Mohd N. Tamin
Publisher: Springer Science & Business
ISBN: 3319000926
Category : Technology & Engineering
Languages : en
Pages : 179

View

Book Description
This book presents a systematic approach in performing reliability assessment of solder joints using Finite Element (FE) simulation. Essential requirements for FE modelling of an electronic package or a single reflowed solder joint subjected to reliability test conditions are elaborated. These cover assumptions considered for a simplified physical model, FE model geometry development, constitutive models for solder joints and aspects of FE model validation. Fundamentals of the mechanics of solder material are adequately reviewed in relation to FE formulations. Concept of damage is introduced along with deliberation of cohesive zone model and continuum damage model for simulation of solder/IMC interface and bulk solder joint failure, respectively. Applications of the deliberated methodology to selected problems in assessing reliability of solder joints are demonstrated. These industry-defined research-based problems include solder reflow cooling, temperature cycling and mechanical fatigue of a BGA package, JEDEC board-level drop test and mechanisms of solder joint fatigue. Emphasis is placed on accurate quantitative assessment of solder joint reliability through basic understanding of the mechanics of materials as interpreted from results of FE simulations. The FE simulation methodology is readily applicable to numerous other problems in mechanics of materials and structures.