Author: IEEE Electron Devices Society
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 246
Book Description
Sixth International Vacuum Microelectronics Conference
Author: IEEE Electron Devices Society
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 246
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 246
Book Description
Proceedings of the Sixth International Conference on Luminescent Materials
Author:
Publisher: The Electrochemical Society
ISBN: 9781566771825
Category : Science
Languages : en
Pages : 440
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771825
Category : Science
Languages : en
Pages : 440
Book Description
Cold Cathodes
Author: M. Cahay
Publisher: The Electrochemical Society
ISBN: 9781566772952
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566772952
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
Scientific Information Bulletin
Vacuum Nanoelectronic Devices
Author: Anatoliy Evtukh
Publisher: John Wiley & Sons
ISBN: 1119037964
Category : Technology & Engineering
Languages : en
Pages : 472
Book Description
Introducing up-to-date coverage of research in electron field emission from nanostructures, Vacuum Nanoelectronic Devices outlines the physics of quantum nanostructures, basic principles of electron field emission, and vacuum nanoelectronic devices operation, and offers as insight state-of-the-art and future researches and developments. This book also evaluates the results of research and development of novel quantum electron sources that will determine the future development of vacuum nanoelectronics. Further to this, the influence of quantum mechanical effects on high frequency vacuum nanoelectronic devices is also assessed. Key features: • In-depth description and analysis of the fundamentals of Quantum Electron effects in novel electron sources. • Comprehensive and up-to-date summary of the physics and technologies for THz sources for students of physical and engineering specialties and electronics engineers. • Unique coverage of quantum physical results for electron-field emission and novel electron sources with quantum effects, relevant for many applications such as electron microscopy, electron lithography, imaging and communication systems and signal processing. • New approaches for realization of electron sources with required and optimal parameters in electronic devices such as vacuum micro and nanoelectronics. This is an essential reference for researchers working in terahertz technology wanting to expand their knowledge of electron beam generation in vacuum and electron source quantum concepts. It is also valuable to advanced students in electronics engineering and physics who want to deepen their understanding of this topic. Ultimately, the progress of the quantum nanostructure theory and technology will promote the progress and development of electron sources as main part of vacuum macro-, micro- and nanoelectronics.
Publisher: John Wiley & Sons
ISBN: 1119037964
Category : Technology & Engineering
Languages : en
Pages : 472
Book Description
Introducing up-to-date coverage of research in electron field emission from nanostructures, Vacuum Nanoelectronic Devices outlines the physics of quantum nanostructures, basic principles of electron field emission, and vacuum nanoelectronic devices operation, and offers as insight state-of-the-art and future researches and developments. This book also evaluates the results of research and development of novel quantum electron sources that will determine the future development of vacuum nanoelectronics. Further to this, the influence of quantum mechanical effects on high frequency vacuum nanoelectronic devices is also assessed. Key features: • In-depth description and analysis of the fundamentals of Quantum Electron effects in novel electron sources. • Comprehensive and up-to-date summary of the physics and technologies for THz sources for students of physical and engineering specialties and electronics engineers. • Unique coverage of quantum physical results for electron-field emission and novel electron sources with quantum effects, relevant for many applications such as electron microscopy, electron lithography, imaging and communication systems and signal processing. • New approaches for realization of electron sources with required and optimal parameters in electronic devices such as vacuum micro and nanoelectronics. This is an essential reference for researchers working in terahertz technology wanting to expand their knowledge of electron beam generation in vacuum and electron source quantum concepts. It is also valuable to advanced students in electronics engineering and physics who want to deepen their understanding of this topic. Ultimately, the progress of the quantum nanostructure theory and technology will promote the progress and development of electron sources as main part of vacuum macro-, micro- and nanoelectronics.
Future Energy Conferences and Symposia
Cold Cathodes II
Author: M. Cahay
Publisher: The Electrochemical Society
ISBN: 9781566773423
Category : Technology & Engineering
Languages : en
Pages : 432
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566773423
Category : Technology & Engineering
Languages : en
Pages : 432
Book Description
Sixth International Conference on Noise in Physical Systems
Author: Paul Herman Ernst Meijer
Publisher:
ISBN:
Category : Electronic noise
Languages : en
Pages : 436
Book Description
Publisher:
ISBN:
Category : Electronic noise
Languages : en
Pages : 436
Book Description
Final Program and Proceedings
Microelectronics Fialure Analysis Desk Reference, Seventh Edition
Author: Tejinder Gandhi
Publisher: ASM International
ISBN: 1627082468
Category : Technology & Engineering
Languages : en
Pages : 719
Book Description
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Publisher: ASM International
ISBN: 1627082468
Category : Technology & Engineering
Languages : en
Pages : 719
Book Description
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.