Author: Carl RothPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 102
Book Description
Simulation and Test Pattern Generation for Bridge Faults in CMO ICs
Author: Carl RothPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 102
Book Description
Handbook of Semiconductor Manufacturing Technology
Author: Yoshio NishiPublisher: CRC Press
ISBN: 9780824787837
Category : Technology & Engineering
Languages : en
Pages : 1186
Book Description
The Handbook of Semiconductor Manufacturing Technology describes the individual processes and manufacturing control, support, and infrastructure technologies of silicon-based integrated-circuit manufacturing, many of which are also applicable for building devices on other semiconductor substrates. Discussing ion implantation, rapid thermal processing, photomask fabrication, chip testing, and plasma etching, the editors explore current and anticipated equipment, devices, materials, and practices of silicon-based manufacturing. The book includes a foreword by Jack S. Kilby, cowinner of the Nobel Prize in Physics 2000 "for his part in the invention of the integrated circuit."
Accurate Resistive Bridge Fault Modeling, Simulation, and Test Generation
Author: Vijay Ramesh Sar-DessaiPublisher:
ISBN:
Category :
Languages : en
Pages : 154
Book Description
Proceedings
Author: Publisher:
ISBN:
Category : Computer storage devices
Languages : en
Pages : 1062
Book Description
CMOS Electronics
Author: Jaume SeguraPublisher: John Wiley & Sons
ISBN: 9780471476696
Category : Technology & Engineering
Languages : en
Pages : 370
Book Description
CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
Proceedings, ... International Symposium on VLSI Design
Author: Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 492
Book Description
Mantech Journal
Author: Proceedings
Author: International Symposium on Multiple Valued LogicPublisher:
ISBN: 9780769514628
Category :
Languages : en
Pages : 314
Book Description
Science Abstracts
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1360
Book Description
Author: