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Author: Andrej Rumiantsev Publisher: CRC Press ISBN: 1000792854 Category : Technology & Engineering Languages : en Pages : 279
Book Description
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Author: Andrej Rumiantsev Publisher: CRC Press ISBN: 1000792854 Category : Technology & Engineering Languages : en Pages : 279
Book Description
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Author: Valerio Elia Publisher: World Scientific ISBN: 178326103X Category : Technology & Engineering Languages : en Pages : 221
Book Description
This book presents:• The results of an empirical analysis of the new phenomenon of virtual clusters (VCs), which highlight the dynamics of these emerging innovation networks in the digital economy; the challenges that this dynamics represents for the conventional theories, which are unable to define a comprehensive framework that supports the development of these networks.• An overview of the most significant theoretical approaches to innovation networks, and their rethinking in the digital economy scenario. Following a neo-Schumpeterian approach, a particular focus is on the opportunity to integrate the economic benefits coming from the geographical proximity, with the advantages related to the “organisational proximity” allowed by the ICT networks.• The constituent points of a strategy aimed at sustaining the developing processes of a VC in a drawback region, and a description of the e-Salento project, an application of this strategy to an Italian drawback region, the Salento. Some general implications of the project for theory and practice are also discussed.• The architecture and the master plan of two initiatives within the e-Salento project, concerning the agribusiness and tourism sectors.• A model of leadership, to guide innovation in an organisation competing in the digital economy, including both firms and regions.The perspective advanced in this book addresses issues concerned with VC growth and regions' economic development processes that are common to both the regional studies and the innovation management literature; the book represents an important empirically grounded contribution to them. Furthermore, several scholars argue that new development models are emerging for firms and regions. There is a lack of published work that provides empirical grounding and/or analytical models of firms' and regions' development processes in the Net Economy.
Author: Pierpaolo Andriani Publisher: World Scientific Publishing Company ISBN: 9781860944604 Category : Business & Economics Languages : en Pages : 171
Book Description
This proceedings volume presents a multi-disciplinary analysis of modern businesses as complex systems and some managerial implications of managing complex networks in the knowledge economy. It discusses the impact of major forces that are altering today's business landscape, such as sweeping technological changes, unbundling of integrated structures, growing interdependence between once-independent sectors and increased unpredictability of strategy outcomes. The result has been and will increasingly be the dominion of complex interconnected networks in business. One of the challenges facing today's management is to develop theories and practices that address the dynamics of business networks. Complexity theory has much to contribute to this purpose. Thus, this volume focuses on exploring the emerging patterns of order and discussing the new management practices suitable to the network economy.
Author: Andrej Rumiantsev
Author: Andrej Rumiantsev
Author: 
Author: Valerio Elia
Author: Angappa Gunasekaran
Author: Jay O. Cohen
Author: Pierpaolo Andriani