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Author: Publisher: ISBN: Category : Languages : en Pages : 25
Book Description
Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are observed. The purpose of this testing is to provide baseline data for isolating failure mechanisms under shock and environmental loading in a representative device used or under consideration for use within systems and assemblies of the DOD/DOE weapons complex. The specific device chosen for this study was the AD22280 model of the ADXL78 MEMS Accelerometer manufactured by Analog Devices Inc. This study focuses only on the shock loading response of the device and provides the necessary data for adding influence of environmental exposure to the reliability of this class of devices. The published absolute maximum rating for acceleration in any axis was 4000 G for this device powered or unpowered. Results from this study showed first failures at 8000 G indicating a margin of error of two. Higher shock level testing indicated that an in-plane, but off-axis acceleration was more damaging than one in the sense direction.
Author: Publisher: ISBN: Category : Languages : en Pages : 25
Book Description
Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are observed. The purpose of this testing is to provide baseline data for isolating failure mechanisms under shock and environmental loading in a representative device used or under consideration for use within systems and assemblies of the DOD/DOE weapons complex. The specific device chosen for this study was the AD22280 model of the ADXL78 MEMS Accelerometer manufactured by Analog Devices Inc. This study focuses only on the shock loading response of the device and provides the necessary data for adding influence of environmental exposure to the reliability of this class of devices. The published absolute maximum rating for acceleration in any axis was 4000 G for this device powered or unpowered. Results from this study showed first failures at 8000 G indicating a margin of error of two. Higher shock level testing indicated that an in-plane, but off-axis acceleration was more damaging than one in the sense direction.
Author: National Aeronautics and Space Administration (NASA) Publisher: Createspace Independent Publishing Platform ISBN: 9781720481201 Category : Languages : en Pages : 74
Book Description
NASA Goddard Space Flight Center (GSFC) has evaluated the dynamic response of a commercial-off-the-shelf (COTS) microelectromechanical systems (MEMS) device made by Analog Device, Inc. The device is designated as ADXL250 and is designed mainly for sensing dynamic acceleration. It is also used to measure the tilting angle of any system or component from its original level position. The device has been in commercial use (e.g., in automobile airbag deployment system as a dual-axial accelerometer and in the electronic game play-station as a tilting sensor) with success, but NASA needs an in-depth assessment of its performance under severe dynamic shock environments. It was realized while planning this evaluation task that two assessments would be beneficial to NASA's missions: (1) severe dynamic shock response under nominal thermal environments; and (2) general dynamic performance under cryogenic environments. The first evaluation aims at obtaining a good understanding of its micromachined structure within a framework of brittle fracture dynamics, while the second evaluation focuses on the structure integrity under cryogenic temperature conditions. The information we gathered from the manufacturer indicated that the environmental stresses under NASA's evaluation program have been far beyond what the device has experienced with commercial applications, for which the device was designed. Thus NASA needs the outcome of this evaluation in order to make the selection for possible use for its missions. This paper provides details of the first evaluation the dynamic response under severe multi-axial single-pulse shock load. It was performed using finite element tools with nonlinear dynamics procedures.Fan, Mark S. and Shaw, Harry C.Goddard Space Flight CenterACCELEROMETERS; COMMERCIAL OFF-THE-SHELF PRODUCTS; DYNAMIC RESPONSE; MICROELECTROMECHANICAL SYSTEMS; FINITE ELEMENT METHOD; ATTITUDE (INCLINATION); SHOCK LOADS; COMPUTERIZED SIMULATION
Author: Publisher: ISBN: Category : Languages : en Pages : 14
Book Description
The characteristics of a piezoresistive accelerometer in shock environments have been studied at Sandia National Laboratories (SNL) in the Mechanical Shock Testing Laboratory for ten years The SNL Shock Laboratory has developed a capability to characterize accelerometers and other transducers with shocks aligned with the transducer's sensing axis and perpendicular to the transducer's sensing axis. This unique capability includes Hopkinson bars made of aluminum, steel, titanium, and beryllium. The bars are configured as both single and split Hopkinson bars. Four different areas that conclude this study are summarized in this paper: characterization of the cross-axis response of the accelerometer in the four environments of static compression, static strain on a beam, dynamic strain, and mechanical shock, the accelerometer's response on a titanium Hopkinson bar with two 45° flats on the end of the bar; failure analysis of the accelerometer; and measurement of the accelerometer's self-generating cable response in a shock environment.
Author: Publisher: ISBN: Category : Languages : en Pages : 12
Book Description
The characteristics of a piezoresistive accelerometer in shock environments are being studied at Sandia National Laboratories in the Mechanical Shock Testing Laboratory. A beryllium Hopkinson bar capability has been developed to extend the understanding of the piezoresistive accelerometer, in two mechanical configurations and with and without mechanical isolation, in the high frequency, high shock environments where measurements are being made. In this paper, recent measurements with beryllium single and split-Hopkinson bar configurations are described. The in axis performance of the piezoresistive accelerometer in mechanical isolation for frequencies of dc-30 kHz and shock magnitudes of up to 6,000 g as determined from measurements with a beryllium Hopkinson bar with a certified laser doppler vibrometer as the reference measurement are presented. Results of characterizations of the accelerometers subjected to cross axis shocks in a split beryllium Hopkinson bar configuration are also presented.
Author: Institute of Electrical and Electronics Engineers Publisher: ISBN: 9780738114309 Category : Accelerometers Languages : en Pages : 0
Book Description
Abstract: The specification and test requirements for a linear, single-axis, nongyroscopic accelerometer for use in internal navigation, guidance, and leveling systems are defined. A standard specification guide and a compilation of recommended test procedures for such accelerometers are provided. Informative annexes are given on the various types of such accelerometers (force or pendulous torque rebalance with analog or digital output, vibrating beam, and micromechanical) and error effects, on filtering, noise, and transient analysis techniques, and on calibration and modeling techniques (multipoint tumble analysis, vibration and shock test analyses, and geophysical effects in inertial instrument testing). Keywords: accelerometer, inertial instrument, inertial sensor, pendulous accelerometer, vibrating beam accelerometer, micromechanical accelerometer, power spectal density, vibration and shock, geophysical effects, specification, testing.
Author: Alan S. Morris Publisher: Academic Press ISBN: 0128011327 Category : Technology & Engineering Languages : en Pages : 727
Book Description
Measurement and Instrumentation: Theory and Application, Second Edition, introduces undergraduate engineering students to measurement principles and the range of sensors and instruments used for measuring physical variables. This updated edition provides new coverage of the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces, also featuring chapters on data acquisition and signal processing with LabVIEW from Dr. Reza Langari. Written clearly and comprehensively, this text provides students and recently graduated engineers with the knowledge and tools to design and build measurement systems for virtually any engineering application. - Provides early coverage of measurement system design to facilitate a better framework for understanding the importance of studying measurement and instrumentation - Covers the latest developments in measurement technologies, including smart sensors, intelligent instruments, microsensors, digital recorders, displays, and interfaces - Includes significant material on data acquisition and signal processing with LabVIEW - Extensive coverage of measurement uncertainty aids students' ability to determine the accuracy of instruments and measurement systems
Author: Jacob Fraden Publisher: Springer Science & Business Media ISBN: 0387216049 Category : Technology & Engineering Languages : en Pages : 596
Book Description
Seven years have passed since the publication of the previous edition of this book. During that time, sensor technologies have made a remarkable leap forward. The sensitivity of the sensors became higher, the dimensions became smaller, the sel- tivity became better, and the prices became lower. What have not changed are the fundamental principles of the sensor design. They are still governed by the laws of Nature. Arguably one of the greatest geniuses who ever lived, Leonardo Da Vinci, had his own peculiar way of praying. He was saying, “Oh Lord, thanks for Thou do not violate your own laws. ” It is comforting indeed that the laws of Nature do not change as time goes by; it is just our appreciation of them that is being re?ned. Thus, this new edition examines the same good old laws of Nature that are employed in the designs of various sensors. This has not changed much since the previous edition. Yet, the sections that describe the practical designs are revised substantially. Recent ideas and developments have been added, and less important and nonessential designs were dropped. Probably the most dramatic recent progress in the sensor technologies relates to wide use of MEMS and MEOMS (micro-electro-mechanical systems and micro-electro-opto-mechanical systems). These are examined in this new edition with greater detail. This book is about devices commonly called sensors. The invention of a - croprocessor has brought highly sophisticated instruments into our everyday lives.
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Author: Mark S. Fan
Author: National Aeronautics and Space Administration (NASA)
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Author: Institute of Electrical and Electronics Engineers
Author: Alan S. Morris
Author: Jacob Fraden