Author: International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life (7, 2002, Novosibirsk)Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Author: International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life (7, 2002, Novosibirsk)Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life : 9 - 13 September 2002, Novosibirsk, Russia. 2(2002)
Author: Yuri V. ChuguiPublisher:
ISBN:
Category : Lasers
Languages : en
Pages : 1326
Book Description
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Author: Publisher:
ISBN:
Category : Laser interferometers
Languages : en
Pages : 688
Book Description
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 9-13 September 2002, Novosibirsk, Russia: Dimensional measurements and quality of management in production (cont.) ; Surface measurements ; Innovative components, techniques, and methods ; Photonics measurement and its applications in medicine and biology ; Optical and laser applications for everyday life ; Optical methods of flow studies ; Interference methods for measurements
Author: Publisher:
ISBN: 9780819446862
Category : Laser interferometers
Languages : en
Pages : 0
Book Description
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Author: Yuri V. ChuguiPublisher:
ISBN:
Category : Laser interferometers
Languages : en
Pages : 710
Book Description
Interernational Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
Author: Fringe 2009
Author: Wolfgang OstenPublisher: Springer Science & Business Media
ISBN: 3642030513
Category : Technology & Engineering
Languages : en
Pages : 808
Book Description
21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.
Eighth International Symposium on Laser Metrology
Author: R. Rodriguez-VeraPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Mathematics
Languages : en
Pages : 886
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Eighth International Symposium on Laser Metrology : Macro-, Micro-, and Nano-technologies Applied in Science, Engineering, and Industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Author: International Symposium on Laser MetrologyPublisher:
ISBN:
Category : Laser interferometers
Languages : en
Pages :
Book Description
Nanophenomena at Surfaces
Author: Michail MichailovPublisher: Springer Science & Business Media
ISBN: 3642165109
Category : Technology & Engineering
Languages : en
Pages : 294
Book Description
This book presents the state of the art in nanoscale surface physics. It outlines contemporary trends in the field covering a wide range of topical areas: atomic structure of surfaces and interfaces, molecular films and polymer adsorption, biologically inspired nanophysics, surface design and pattern formation, and computer modeling of interfacial phenomena. Bridging "classical" and "nano" concepts, the present volume brings attention to the physical background of exotic condensed-matter properties. The book is devoted to Iwan Stranski and Rostislaw Kaischew, remarkable scientists, who played a crucial role in setting up the theoretical fundamentals of nucleation and crystal growth phenomena in the last century.