Author: Meshram, Ankush
Publisher: KIT Scientific Publishing
ISBN: 3731512572
Category :
Languages : en
Pages : 224
Book Description
Configuring an anomaly-based Network Intrusion Detection System for cybersecurity of an industrial system in the absence of information on networking infrastructure and programmed deterministic industrial process is challenging. Within the research work, different self-learning frameworks to analyze passively captured network traces from PROFINET-based industrial system for protocol-based and process behavior-based anomaly detection are developed, and evaluated on a real-world industrial system.
Self-learning Anomaly Detection in Industrial Production
Author: Meshram, Ankush
Publisher: KIT Scientific Publishing
ISBN: 3731512572
Category :
Languages : en
Pages : 224
Book Description
Configuring an anomaly-based Network Intrusion Detection System for cybersecurity of an industrial system in the absence of information on networking infrastructure and programmed deterministic industrial process is challenging. Within the research work, different self-learning frameworks to analyze passively captured network traces from PROFINET-based industrial system for protocol-based and process behavior-based anomaly detection are developed, and evaluated on a real-world industrial system.
Publisher: KIT Scientific Publishing
ISBN: 3731512572
Category :
Languages : en
Pages : 224
Book Description
Configuring an anomaly-based Network Intrusion Detection System for cybersecurity of an industrial system in the absence of information on networking infrastructure and programmed deterministic industrial process is challenging. Within the research work, different self-learning frameworks to analyze passively captured network traces from PROFINET-based industrial system for protocol-based and process behavior-based anomaly detection are developed, and evaluated on a real-world industrial system.
Proceedings of the 2018 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory
Author: Beyerer, Jürgen
Publisher: KIT Scientific Publishing
ISBN: 3731509369
Category : Computers
Languages : en
Pages : 136
Book Description
Publisher: KIT Scientific Publishing
ISBN: 3731509369
Category : Computers
Languages : en
Pages : 136
Book Description
Outlier Analysis
Author: Charu C. Aggarwal
Publisher: Springer
ISBN: 3319475789
Category : Computers
Languages : en
Pages : 481
Book Description
This book provides comprehensive coverage of the field of outlier analysis from a computer science point of view. It integrates methods from data mining, machine learning, and statistics within the computational framework and therefore appeals to multiple communities. The chapters of this book can be organized into three categories: Basic algorithms: Chapters 1 through 7 discuss the fundamental algorithms for outlier analysis, including probabilistic and statistical methods, linear methods, proximity-based methods, high-dimensional (subspace) methods, ensemble methods, and supervised methods. Domain-specific methods: Chapters 8 through 12 discuss outlier detection algorithms for various domains of data, such as text, categorical data, time-series data, discrete sequence data, spatial data, and network data. Applications: Chapter 13 is devoted to various applications of outlier analysis. Some guidance is also provided for the practitioner. The second edition of this book is more detailed and is written to appeal to both researchers and practitioners. Significant new material has been added on topics such as kernel methods, one-class support-vector machines, matrix factorization, neural networks, outlier ensembles, time-series methods, and subspace methods. It is written as a textbook and can be used for classroom teaching.
Publisher: Springer
ISBN: 3319475789
Category : Computers
Languages : en
Pages : 481
Book Description
This book provides comprehensive coverage of the field of outlier analysis from a computer science point of view. It integrates methods from data mining, machine learning, and statistics within the computational framework and therefore appeals to multiple communities. The chapters of this book can be organized into three categories: Basic algorithms: Chapters 1 through 7 discuss the fundamental algorithms for outlier analysis, including probabilistic and statistical methods, linear methods, proximity-based methods, high-dimensional (subspace) methods, ensemble methods, and supervised methods. Domain-specific methods: Chapters 8 through 12 discuss outlier detection algorithms for various domains of data, such as text, categorical data, time-series data, discrete sequence data, spatial data, and network data. Applications: Chapter 13 is devoted to various applications of outlier analysis. Some guidance is also provided for the practitioner. The second edition of this book is more detailed and is written to appeal to both researchers and practitioners. Significant new material has been added on topics such as kernel methods, one-class support-vector machines, matrix factorization, neural networks, outlier ensembles, time-series methods, and subspace methods. It is written as a textbook and can be used for classroom teaching.
Machine Learning, Optimization, and Data Science
Author: Giuseppe Nicosia
Publisher: Springer Nature
ISBN: 3031255992
Category : Computers
Languages : en
Pages : 639
Book Description
This two-volume set, LNCS 13810 and 13811, constitutes the refereed proceedings of the 8th International Conference on Machine Learning, Optimization, and Data Science, LOD 2022, together with the papers of the Second Symposium on Artificial Intelligence and Neuroscience, ACAIN 2022. The total of 84 full papers presented in this two-volume post-conference proceedings set was carefully reviewed and selected from 226 submissions. These research articles were written by leading scientists in the fields of machine learning, artificial intelligence, reinforcement learning, computational optimization, neuroscience, and data science presenting a substantial array of ideas, technologies, algorithms, methods, and applications.
Publisher: Springer Nature
ISBN: 3031255992
Category : Computers
Languages : en
Pages : 639
Book Description
This two-volume set, LNCS 13810 and 13811, constitutes the refereed proceedings of the 8th International Conference on Machine Learning, Optimization, and Data Science, LOD 2022, together with the papers of the Second Symposium on Artificial Intelligence and Neuroscience, ACAIN 2022. The total of 84 full papers presented in this two-volume post-conference proceedings set was carefully reviewed and selected from 226 submissions. These research articles were written by leading scientists in the fields of machine learning, artificial intelligence, reinforcement learning, computational optimization, neuroscience, and data science presenting a substantial array of ideas, technologies, algorithms, methods, and applications.
Multimodal Panoptic Segmentation of 3D Point Clouds
Author: Dürr, Fabian
Publisher: KIT Scientific Publishing
ISBN: 3731513145
Category :
Languages : en
Pages : 248
Book Description
The understanding and interpretation of complex 3D environments is a key challenge of autonomous driving. Lidar sensors and their recorded point clouds are particularly interesting for this challenge since they provide accurate 3D information about the environment. This work presents a multimodal approach based on deep learning for panoptic segmentation of 3D point clouds. It builds upon and combines the three key aspects multi view architecture, temporal feature fusion, and deep sensor fusion.
Publisher: KIT Scientific Publishing
ISBN: 3731513145
Category :
Languages : en
Pages : 248
Book Description
The understanding and interpretation of complex 3D environments is a key challenge of autonomous driving. Lidar sensors and their recorded point clouds are particularly interesting for this challenge since they provide accurate 3D information about the environment. This work presents a multimodal approach based on deep learning for panoptic segmentation of 3D point clouds. It builds upon and combines the three key aspects multi view architecture, temporal feature fusion, and deep sensor fusion.
Proceedings of the 2022 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory
Author: Beyerer, Jürgen
Publisher: KIT Scientific Publishing
ISBN: 3731513048
Category :
Languages : en
Pages : 140
Book Description
In August 2022, Fraunhofer IOSB and IES of KIT held a joint workshop in a Schwarzwaldhaus near Triberg. Doctoral students presented research reports and discussed various topics like computer vision, optical metrology, network security, usage control, and machine learning. This book compiles the workshop's results and ideas, offering a comprehensive overview of the research program of IES and Fraunhofer IOSB.
Publisher: KIT Scientific Publishing
ISBN: 3731513048
Category :
Languages : en
Pages : 140
Book Description
In August 2022, Fraunhofer IOSB and IES of KIT held a joint workshop in a Schwarzwaldhaus near Triberg. Doctoral students presented research reports and discussed various topics like computer vision, optical metrology, network security, usage control, and machine learning. This book compiles the workshop's results and ideas, offering a comprehensive overview of the research program of IES and Fraunhofer IOSB.
Smart Computing Techniques in Industrial IoT
Author: Chiranji Lal Chowdhary
Publisher: Springer Nature
ISBN: 9819774942
Category :
Languages : en
Pages : 225
Book Description
Publisher: Springer Nature
ISBN: 9819774942
Category :
Languages : en
Pages : 225
Book Description
Advanced Intelligent Computing Technology and Applications
Author: De-Shuang Huang
Publisher: Springer Nature
ISBN: 981975609X
Category :
Languages : en
Pages : 548
Book Description
Publisher: Springer Nature
ISBN: 981975609X
Category :
Languages : en
Pages : 548
Book Description
Machine Learning and Knowledge Discovery in Databases. Research Track
Author: Albert Bifet
Publisher: Springer Nature
ISBN: 3031703650
Category :
Languages : en
Pages : 509
Book Description
Publisher: Springer Nature
ISBN: 3031703650
Category :
Languages : en
Pages : 509
Book Description
Control Charts and Machine Learning for Anomaly Detection in Manufacturing
Author: Kim Phuc Tran
Publisher: Springer Nature
ISBN: 3030838196
Category : Technology & Engineering
Languages : en
Pages : 270
Book Description
This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution. The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes. The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.
Publisher: Springer Nature
ISBN: 3030838196
Category : Technology & Engineering
Languages : en
Pages : 270
Book Description
This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution. The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes. The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.