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Author: Zhong-lin Wang Publisher: Springer Science & Business Media ISBN: 1489915796 Category : Science Languages : en Pages : 461
Book Description
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Author: Zhong-lin Wang Publisher: Springer Science & Business Media ISBN: 1489915796 Category : Science Languages : en Pages : 461
Book Description
Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.
Author: Bernard Frois Publisher: World Scientific ISBN: 9789971509750 Category : Science Languages : en Pages : 832
Book Description
This book summarizes the considerable progress recently achieved in the understanding of nucleon and nuclear structure by using high energy electrons as a probe. A collection of papers discusses in detail the new frontiers of this field. Experimental and theoretical articles cover topics such as the structure of the nucleon, nucleon distributions, many-body correlations, non-nucleonic degrees of freedom and few-body systems. This book is an up-to-date introduction to the research planned with continuous beam electron accelerators.
Author: David L Ederer Publisher: World Scientific ISBN: 9814547255 Category : Languages : en Pages : 248
Book Description
The Raman Emission by X-rays (REX-I) Workshop focused on Raman Scattering of x-rays mostly from Synchrotron Radiation Sources. The advent of new high brightness sources of x-ray radiation has given new impetus to this tantalizing technique that has offered ways of obtaining new insights into the atomic and electronic structure of solids and gases, but which has been limited by weak sources of excitation. In the last five years, Raman scattering by x-rays has been observed an ubiquitous phenomena. It has been applied to yield new information about the band structure of solids and about the electronic structure of atoms. It was the object of this workshop to identify and define key issues in this rapidly developing subfield of x-ray physics by gathering together a group of theorists and experimentalists, and by providing overlap between atomic and condensed matter physics. The workshop aimed to achieve this end by providing an environment to discuss the latest developments and to initiate cross fertilization in the difference areas.
Author: Zhe Feng Publisher: CRC Press ISBN: 1040105793 Category : Science Languages : en Pages : 172
Book Description
Raman Scattering on Emerging Semiconductors and Oxides presents Raman scattering studies. It describes the key fundamental elements in applying Raman spectroscopies to various semiconductors and oxides without complicated and deep Raman theories. Across nine chapters, it covers: • SiC and IV-IV semiconductors, • III-GaN and nitride semiconductors, • III-V and II-VI semiconductors, • ZnO-based and GaO-based semiconducting oxides, • Graphene, ferroelectric oxides, and other emerging materials, • Wide-bandgap semiconductors of SiC, GaN, and ZnO, and • Ultra-wide gap semiconductors of AlN, Ga2O3, and graphene. Key achievements from the author and collaborators in the above fields are referred to and cited with typical Raman spectral graphs and analyses. Written for engineers, scientists, and academics, this comprehensive book will be fundamental for newcomers in Raman spectroscopy. Zhe Chuan Feng has had an impressive career spanning many years of important work in engineering and tech, including as a professor at the Graduate Institute of Photonics & Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei; establishing the Science Exploring Lab; joining Kennesaw State University as an adjunct professor, part-time; and at the Department of Electrical and Computer Engineering, Southern Polytechnic College of Engineering and Engineering Technology. Currently, he is focusing on materials research for LED, III-nitrides, SiC, ZnO, other semiconductors/oxides, and nanostructures and has devoted time to materials research and growth of III-V and II-VI compounds, LED, III nitrides, SiC, ZnO, GaO, and other semiconductors/oxides. Professor Feng has also edited and published multiple review books in his field, alongside authoring scientific journal papers and conference/proceeding papers. He has organized symposiums and been an invited speaker at different international conferences and universities. He has also served as a guest editor for special journal issues.
Author: Elliot Leader Publisher: Cambridge University Press ISBN: 9780521468404 Category : Science Languages : en Pages : 550
Book Description
This work presents, in two volumes, a comprehensive and unified treatment of modern theoretical and experimental particle physics at a level accessible to beginning research students. The emphasis throughout is on presenting underlying physical principles in a simple and intuitive way, and the more sophisticated methods demanded by present day research interests are introduced in a very gradual and gentle fashion. Volume 1 covers electroweak interactions, the discovery and properties of the 'new' particles, the discovery of partons and the construction and predictions of the simple parton model. Volume 2 deals at some length with CP-violation, but is mainly devoted to QCD and its application to 'hard' processes. A brief coverage of 'soft' hadronic physics is included. This work will provide a comprehensive reference and textbook for all graduate students and researchers interested in modern particle physics.
Author: Rainer Blatt Publisher: World Scientific ISBN: 9814543179 Category : Science Languages : en Pages : 398
Book Description
The 14th International Conference on Laser Spectroscopy brought together spectroscopists from all over the world working in the very diverse and still growing field of laser spectroscopy. Spanning the area from fundamental issues (such as experiments testing the foundations of quantum mechanics), to atomic and molecular spectroscopy, precision spectroscopy and matter wave optics to Bose-Einstein condensation, covering quantum optics and the new field of quantum computation and quantum information, up to nonlinear optics and ultrashort pulse spectroscopy, and medical applications of laser spectroscopy, the conference addressed a large number of modern scientific issues at the highest level.
Author: Winfried Schülke Publisher: Oxford University Press, USA ISBN: 0198510179 Category : Science Languages : en Pages : 606
Book Description
This work offers the first comprehensive review of experimental methods, theory, and successful applications of synchrotron radiation based on inelastic X-ray scattering spectroscopy, which enables the investigation of electron dynamics in condensed matter (correlated motion and excitation).
Author: Brent Fultz Publisher: Springer Science & Business Media ISBN: 3642297609 Category : Science Languages : en Pages : 775
Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author: Zhong-lin Wang
Author: Zhong-lin Wang
Author: Bernard Frois
Author: David L Ederer
Author: Zhe Feng
Author: Elliot Leader
Author: Rainer Blatt
Author: Winfried Schülke
Author: 
Author: Brent Fultz
Author: