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Author: Thomas Franklin Publisher: ISBN: Category : Languages : en Pages :
Book Description
The ORIONR PLUS scanning helium ion microscope (HIM) images at sub nanometer resolution. Images of the secondary electron emission have superior resolution and depth of field compared to a scanning electron microscope (SEM). Ionoluminescent imaging is not an area that has been extensively explored by typical ion beam systems as they have large spot sizes in the region of microns, leading to poor spatial resolution. This thesis confirms that the ORIONR PLUS can form images from the ionoluminescent signal, resolutions of 20nm can be obtained for images of bright nanoparticles. Ionoluminescence spectra can also be obtained from some samples. The position of emission peaks in samples under the ORIONR PLUS does not deviate significantly from cathodoluminescence (CL) peaks under SEM. However, the relative heights of the emission peaks in a sample can vary between ionoluminescence (IL) and CL. In addition, It is found that there exists a proportional relationship between acceleration voltage and ionoluminescent signal in the ORIONR PLUS, this relationship is also exhibited in CL. However, when normalised for current and acceleration voltage there appears to be no samples that show greater luminescence under ionoluminescence than cathodoluminescence, with ionoluminescent intensities up to an order of magnitude lower. Ionoluminescence under the ORIONR PLUS is found to be a poor candidate for the analysis of direct band gap semiconductors, this is attributed to the smaller interaction volumes and achievable beam current of the ORIONR PLUS. It is also found that some direct band gap materials are very susceptible to beam damage under the ion beam at beam doses typically used for secondary electron (SE) imaging. It is possible to obtain simultaneous IL and SE images of organic fluorospores in a biological sample. However, the luminescence of the fluorospores was only just sufficient to form images with a 200nm resolution. Rare earth based nanoparticles show brighter luminescence and greater resistance to beam damage than organic fluorospores. If such particles could be utilised for immunofluorescence it would make combined secondary electron and immunofluorescence imaging under the ORIONR PLUS a viable technique.
Author: Thomas Franklin Publisher: ISBN: Category : Languages : en Pages :
Book Description
The ORIONR PLUS scanning helium ion microscope (HIM) images at sub nanometer resolution. Images of the secondary electron emission have superior resolution and depth of field compared to a scanning electron microscope (SEM). Ionoluminescent imaging is not an area that has been extensively explored by typical ion beam systems as they have large spot sizes in the region of microns, leading to poor spatial resolution. This thesis confirms that the ORIONR PLUS can form images from the ionoluminescent signal, resolutions of 20nm can be obtained for images of bright nanoparticles. Ionoluminescence spectra can also be obtained from some samples. The position of emission peaks in samples under the ORIONR PLUS does not deviate significantly from cathodoluminescence (CL) peaks under SEM. However, the relative heights of the emission peaks in a sample can vary between ionoluminescence (IL) and CL. In addition, It is found that there exists a proportional relationship between acceleration voltage and ionoluminescent signal in the ORIONR PLUS, this relationship is also exhibited in CL. However, when normalised for current and acceleration voltage there appears to be no samples that show greater luminescence under ionoluminescence than cathodoluminescence, with ionoluminescent intensities up to an order of magnitude lower. Ionoluminescence under the ORIONR PLUS is found to be a poor candidate for the analysis of direct band gap semiconductors, this is attributed to the smaller interaction volumes and achievable beam current of the ORIONR PLUS. It is also found that some direct band gap materials are very susceptible to beam damage under the ion beam at beam doses typically used for secondary electron (SE) imaging. It is possible to obtain simultaneous IL and SE images of organic fluorospores in a biological sample. However, the luminescence of the fluorospores was only just sufficient to form images with a 200nm resolution. Rare earth based nanoparticles show brighter luminescence and greater resistance to beam damage than organic fluorospores. If such particles could be utilised for immunofluorescence it would make combined secondary electron and immunofluorescence imaging under the ORIONR PLUS a viable technique.
Author: David C. Joy Publisher: Springer Science & Business Media ISBN: 1461486602 Category : Technology & Engineering Languages : en Pages : 63
Book Description
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined.
Author: Gregor Hlawacek Publisher: Springer ISBN: 3319419900 Category : Science Languages : en Pages : 536
Book Description
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.
Author: Peter W. Hawkes Publisher: Springer Nature ISBN: 3030000699 Category : Technology & Engineering Languages : en Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Tien T. Tsong Publisher: Cambridge University Press ISBN: 0521363799 Category : Science Languages : en Pages : 399
Book Description
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.
Author: Vincent S. Smentkowski Publisher: Springer Science & Business Media ISBN: 3319013602 Category : Science Languages : en Pages : 333
Book Description
This book summarizes the main surface analysis techniques that are being used to study biological specimens/systems. The compilation of chapters in this book highlight the benefits that surface analysis provides. The outer layer of bulk solid or liquid samples is referred to as the surface of the sample/material. At the surface, the composition, microstructure, phase, chemical bonding, electronic states, and/or texture is often different than that of the bulk material. The outer surface is where many material interactions/reactions take place. This is especially true biomaterials which may be fabricated into bio-devices and in turn implanted into tissues and organs. Surfaces of biomaterials (synthetic or modified natural materials) are of critical importance since the surface is typically the only part of the biomaterial/bio-device that comes in contact with the biological system. Analytical techniques are required to characterize the surface of biomaterials and quantify their impact in real-world biological systems. Surface analysis of biological materials started in the 1960’s and the number of researchers working in this area have increased very rapidly since then, a number of advances have been made to standard surface analytical instrumentation, and a number of new instruments have been introduced.
Author: Thomas Franklin
Author: Thomas Franklin
Author: Thomas M. W. Franklin
Author: David C. Joy
Author: Gregor Hlawacek
Author: Peter W. Hawkes
Author: Toshio Sakurai
Author: Tien T. Tsong
Author: Vincent S. Smentkowski
Author: Srinivasa Ranganathan
Author: Alfred Wagner