Author: Om JohariPublisher:
ISBN: 9780931288098
Category :
Languages : en
Pages :
Book Description
Scanning Electron Microscopy 1979
Author: Om JohariScanning Electron Microscopy/1979
Author: Publisher:
ISBN: 9780931288050
Category : Microscopy
Languages : en
Pages :
Book Description
Scanning Electron Microscopy
Author: Publisher:
ISBN: 9780931288050
Category : Microscopy
Languages : en
Pages :
Book Description
Electron Microscopy and Analysis, 1979
Author: T. MulveyPublisher: Institute of Physics Publishing (GB)
ISBN:
Category : Science
Languages : en
Pages : 496
Book Description
Scanning Electron Microscopy
Author: Om JohariScanning Electron Microscopy 1979
Author: Om JohariPublisher:
ISBN: 9780931288067
Category : Microscopy
Languages : en
Pages :
Book Description
The Beginnings of Electron Microscopy
Author: Peter W. HawkesPublisher: Academic Press
ISBN: 1483284654
Category : Science
Languages : en
Pages : 654
Book Description
The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.
Springer Handbook of Microscopy
Author: Peter W. HawkesPublisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Principles of Analytical Electron Microscopy
Author: Joseph GoldsteinPublisher: Springer Science & Business Media
ISBN: 1489920374
Category : Science
Languages : en
Pages : 458
Book Description
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Scanning Electron Microscopy
Author: Ludwig ReimerPublisher: Springer
ISBN: 3540389679
Category : Science
Languages : en
Pages : 538
Book Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.