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Author: Jawar Singh Publisher: Springer Science & Business Media ISBN: 1461408180 Category : Technology & Engineering Languages : en Pages : 176
Book Description
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Author: Jawar Singh Publisher: Springer Science & Business Media ISBN: 1461408180 Category : Technology & Engineering Languages : en Pages : 176
Book Description
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Author: Jawar Singh Publisher: Springer ISBN: 9781493902446 Category : Technology & Engineering Languages : en Pages : 168
Book Description
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design. Provides a complete and concise introduction to SRAM bitcell design and analysis; Offers techniques to face nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis; Includes simulation set-ups for extracting different design metrics for CMOS technology and emerging devices; Emphasizes different trade-offs for achieving the best possible SRAM bitcell design.
Author: Bhupendra Singh Reniwal Publisher: CRC Press ISBN: 1000985156 Category : Technology & Engineering Languages : en Pages : 213
Book Description
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discusses low-power design methodologies for static random-access memory (SRAM) Covers radiation-hardened SRAM design for aerospace applications Focuses on various reliability issues that are faced by submicron technologies Exhibits more stable memory topologies Nanoscale technologies unveiled significant challenges to the design of energy- efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry. The text adopts a unique way to explain the SRAM bitcell, array design, and analysis of its design parameters to meet the sub-nano-regime challenges for complementary metal-oxide semiconductor devices. It comprehensively covers low- power-design methodologies for SRAM, exhibits more stable memory topologies, and radiation-hardened SRAM design for aerospace applications. Every chapter includes a glossary, highlights, a question bank, and problems. The text will serve as a useful text for senior undergraduate students, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing comprehensive studies of variability-induced failure mechanism in sense amplifiers and power, delay, and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students, and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers the development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal health care assistants, and smart Internet of Things applications.
Author: Mohamed Abu Rahma Publisher: Springer Science & Business Media ISBN: 1461417481 Category : Technology & Engineering Languages : en Pages : 176
Book Description
Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.
Author: S. Rajaram Publisher: Springer ISBN: 9811359504 Category : Computers Languages : en Pages : 728
Book Description
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Author: Rohit Dhiman Publisher: CRC Press ISBN: 1000778061 Category : Technology & Engineering Languages : en Pages : 255
Book Description
The incessant scaling of complementary metal-oxide semiconductor (CMOS) technology has resulted in significant performance improvements in very-large-scale integration (VLSI) design techniques and system architectures. This trend is expected to continue in the future, but this requires breakthroughs in the design of nano-CMOS and post-CMOS technologies. Nanoelectronics refers to the possible future technologies beyond conventional CMOS scaling limits. This volume addresses the current state-of-the-art nanoelectronic technologies and presents potential options for next-generation integrated circuits. Nanoelectronics for Next-generation Integrated Circuits is a useful reference guide for researchers, engineers, and advanced students working on the frontier of the design and modeling of nanoelectronic devices and their integration aspects with future CMOS circuits. This comprehensive volume eloquently presents the design methodologies for spintronics memories, quantum-dot cellular automata, and post-CMOS FETs, including applications in emerging integrated circuit technologies.
Author: Prem Kumar Chaurasiya Publisher: Springer Nature ISBN: 9811679096 Category : Technology & Engineering Languages : en Pages : 1028
Book Description
This book comprises select papers presented at the conference on Technology Innovation in Mechanical Engineering (TIME-2021). The book discusses the latest innovation and advanced research in the diverse field of Mechanical Engineering such as materials, manufacturing processes, evaluation of materials properties for the application in automotive, aerospace, marine, locomotive and energy sectors. The topics covered include advanced metal forming, Energy Efficient systems, Material Characterization, Advanced metal forming, bending, welding & casting techniques, Composite and Polymer Manufacturing, Intermetallics, Future generation materials, Laser Based Manufacturing, High-Energy Beam Processing, Nano materials, Smart Material, Super Alloys, Powder Metallurgy and Ceramic Forming, Aerodynamics, Biological Heat & Mass Transfer, Combustion & Propulsion, Cryogenics, Fire Dynamics, Refrigeration & Air Conditioning, Sensors and Transducers, Turbulent Flows, Reactive Flows, Numerical Heat Transfer, Phase Change Materials, Micro- and Nano-scale Transport, Multi-phase Flows, Nuclear & Space Applications, Flexible Manufacturing Technology & System, Non-Traditional Machining processes, Structural Strength and Robustness, Vibration, Noise Analysis and Control, Tribology. In addition, it discusses industrial applications and cover theoretical and analytical methods, numerical simulations and experimental techniques in the area of Mechanical Engineering. The book will be helpful for academics, including graduate students and researchers, as well as professionals interested in interdisciplinary topics in the areas of materials, manufacturing, and energy sectors.
Author: Sendhil Kumar Natarajan Publisher: Springer Nature ISBN: 9811642222 Category : Technology & Engineering Languages : en Pages : 956
Book Description
This book comprises the proceedings of the 1st International Conference on Future Technologies in Manufacturing, Automation, Design and Energy 2020. The contents of this volume focus on recent technological advances in the field of manufacturing, automation, design and energy. Some of the topics covered include additive manufacturing, renewable energy resources, design automation, process automation and monitoring, etc. This volume will prove a valuable resource for those in academia and industry.
Author: Anand D. Darji Publisher: Springer Nature ISBN: 9811967806 Category : Technology & Engineering Languages : en Pages : 293
Book Description
This book presents select peer-reviewed proceedings of the 2nd International Conference on Advances in VLSI and Embedded Systems (AVES 2021). This book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. To address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on advanced topics of circuit and systems design, fabrication, testing, and standardization. This book is useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Author: Jawar Singh
Author: Jawar Singh
Author: Jawar Singh
Author: Bhupendra Singh Reniwal
Author: Mohamed Abu Rahma
Author: S. Rajaram
Author: Jung-Seob Lee
Author: Rohit Dhiman
Author: Prem Kumar Chaurasiya
Author: Sendhil Kumar Natarajan
Author: Anand D. Darji