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Author: Joseph Bernstein Publisher: Academic Press ISBN: 0128008199 Category : Technology & Engineering Languages : en Pages : 108
Book Description
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. - The ability to include reliability calculations and test results in their product design - The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions - Have accurate failure rate calculations for calculating warrantee period replacement costs
Author: Joseph Bernstein Publisher: Academic Press ISBN: 0128008199 Category : Technology & Engineering Languages : en Pages : 108
Book Description
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. - The ability to include reliability calculations and test results in their product design - The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions - Have accurate failure rate calculations for calculating warrantee period replacement costs
Author: Mohammad Modarres Publisher: John Wiley & Sons ISBN: 1119388686 Category : Technology & Engineering Languages : en Pages : 289
Book Description
The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Author: Joseph B. Bernstein Publisher: John Wiley & Sons ISBN: 1394210957 Category : Technology & Engineering Languages : en Pages : 404
Book Description
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Author: Abdelkhalak El Hami Publisher: John Wiley & Sons ISBN: 1786308819 Category : Technology & Engineering Languages : en Pages : 324
Book Description
This book illustrates simply, but with many details, the state of the art of reliability science, exploring clear reliability disciplines and applications through concrete examples from their industries and from real life, based on industrial experiences. Many experts believe that reliability is not only a matter of statistics but is a multidisciplinary scientific topic, involving materials, tests, simulations, quality tools, manufacturing, electronics, mechatronics, environmental engineering and Big Data, among others. For a complex mechatronic system, failure risks have to be identified at an early stage of the design. In the automotive and aeronautic industries, fatigue simulation is used both widely and efficiently. Problems arise from the variability of inputs such as fatigue parameters and life curves. This book aims to discuss probabilistic fatigue and reliability simulation. To do this, Reliability and Physics-of-Healthy in Mechatronics provides a study on some concepts of a predictive reliability model of microelectronics, with examples from the automotive, aeronautic and space industries, based on entropy and Physics-of-Healthy
Author: Elsayed A. Elsayed Publisher: John Wiley & Sons ISBN: 1119665922 Category : Technology & Engineering Languages : en Pages : 930
Book Description
Get a firm handle on the engineering reliability process with this insightful and complete resource Named one of the Best Industrial Management eBooks of All Time by BookAuthority As featured on CNN, Forbes and Inc – BookAuthority identifies and rates the best books in the world, based on recommendations by thought leaders and experts The newly and thoroughly revised 3rd Edition of Reliability Engineering delivers a comprehensive and insightful analysis of this crucial field. Accomplished author, professor, and engineer, Elsayed. A. Elsayed includes new examples and end-of-chapter problems to illustrate concepts, new chapters on resilience and the physics of failure, revised chapters on reliability and hazard functions, and more case studies illustrating the approaches and methodologies described within. The book combines analyses of system reliability estimation for time independent and time dependent models with the construction of the likelihood function and its use in estimating the parameters of failure time distribution. It concludes by addressing the physics of failures, mechanical reliability, and system resilience, along with an explanation of how to ensure reliability objectives by providing preventive and scheduled maintenance and warranty policies. This new edition of Reliability Engineering covers a wide range of topics, including: Reliability and hazard functions, like the Weibull Model, the Exponential Model, the Gamma Model, and the Log-Logistic Model, among others System reliability evaluations, including parallel-series, series-parallel, and mixed parallel systems The concepts of time- and failure-dependent reliability within both repairable and non-repairable systems Parametric reliability models, including types of censoring, and the Exponential, Weibull, Lognormal, Gamma, Extreme Value, Half-Logistic, and Rayleigh Distributions Perfect for first-year graduate students in industrial and systems engineering, Reliability Engineering, 3rd Edition also belongs on the bookshelves of practicing professionals in research laboratories and defense industries. The book offers a practical and approachable treatment of a complex area, combining the most crucial foundational knowledge with necessary and advanced topics.
Author: Constantin Volosencu Publisher: BoD – Books on Demand ISBN: 9535137050 Category : Technology & Engineering Languages : en Pages : 398
Book Description
Researchers from the entire world write to figure out their newest results and to contribute new ideas or ways in the field of system reliability and maintenance. Their articles are grouped into four sections: reliability, reliability of electronic devices, power system reliability and feasibility and maintenance. The book is a valuable tool for professors, students and professionals, with its presentation of issues that may be taken as examples applicable to practical situations. Some examples defining the contents can be highlighted: system reliability analysis based on goal-oriented methodology; reliability design of water-dispensing systems; reliability evaluation of drivetrains for off-highway machines; extending the useful life of asset; network reliability for faster feasibility decision; analysis of standard reliability parameters of technical systems' parts; cannibalisation for improving system reliability; mathematical study on the multiple temperature operational life testing procedure, for electronic industry; reliability prediction of smart maximum power point converter in photovoltaic applications; reliability of die interconnections used in plastic discrete power packages; the effects of mechanical and electrical straining on performances of conventional thick-film resistors; software and hardware development in the electric power system; electric interruptions and loss of supply in power systems; feasibility of autonomous hybrid AC/DC microgrid system; predictive modelling of emergency services in electric power distribution systems; web-based decision-support system in the electric power distribution system; preventive maintenance of a repairable equipment operating in severe environment; and others.
Author: William Denson Publisher: RIAC ISBN: 1933904178 Category : Technology & Engineering Languages : en Pages : 432
Book Description
The intent of this book is to provide guidance on modeling techniques that can be used to quantify the reliability of a product or system. In this context, reliability modeling is the process of constructing a mathematical model that is used to estimate the reliability characteristics of a product. There are many ways in which this can be accomplished, depending on the product or system and the type of information that is available, or practical to obtain. This book reviews possible approaches, summarizes their advantages and disadvantages, and provides guidance on selecting a methodology based on the specific goals and constraints of the analyst. While this book will not discuss the use of specific published methodologies, in cases where examples are provided, tools and methodologies with which the author has personal experience in their development are used, such as life modeling, NPRD, MIL-HDBK-217 and the RIAC 217Plus--Introduction.
Author: K.B. Misra Publisher: Elsevier ISBN: 0444598154 Category : Technology & Engineering Languages : en Pages : 907
Book Description
This book equips the reader with a compact information source on all the most recent methodological tools available in the area of reliability prediction and analysis. Topics covered include reliability mathematics, organisation and analysis of data, reliability modelling and system reliability evaluation techniques. Environmental factors and stresses are taken into account in computing the reliability of the involved components. The limitations of models, methods, procedures, algorithms and programmes are outlined. The treatment of maintained systems is designed to aid the worker in analysing systems with more realistic and practical assumptions. Fault tree analysis is also extensively discussed, incorporating recent developments. Examples and illustrations support the reader in the solving of problems in his own area of research. The chapters provide a logical and graded presentation of the subject matter bearing in mind the difficulties of a beginner, whilst bridging the information gap for the more experienced reader. The work will be of considerable interest to engineers working in various industries, research organizations, particularly in defence, nuclear, chemical, space or communications. It will also be an indispensable study aid for serious-minded students and teachers.
Author: Linda C. Wolstenholme Publisher: Routledge ISBN: 1351419099 Category : Business & Economics Languages : en Pages : 272
Book Description
Reliability is an essential concept in mathematics, computing, research, and all disciplines of engineering, and reliability as a characteristic is, in fact, a probability. Therefore, in this book, the author uses the statistical approach to reliability modelling along with the MINITAB software package to provide a comprehensive treatment of modelling, from the basics through advanced modelling techniques.The book begins by presenting a thorough grounding in the elements of modelling the lifetime of a single, non-repairable unit. Assuming no prior knowledge of the subject, the author includes a guide to all the fundamentals of probability theory, defines the various measures associated with reliability, then describes and discusses the more common lifetime models: the exponential, Weibull, normal, lognormal and gamma distributions. She concludes the groundwork by looking at ways of choosing and fitting the most appropriate model to a given data set, paying particular attention to two critical points: the effect of censored data and estimating lifetimes in the tail of the distribution.The focus then shifts to topics somewhat more difficult:the difference in the analysis of lifetimes for repairable versus non-repairable systems and whether repair truly ""renews"" the systemmethods for dealing with system with reliability characteristic specified for more than one component or subsystemthe effect of different types of maintenance strategiesthe analysis of life test dataThe final chapter provides snapshot introductions to a range of advanced models and presents two case studies that illustrate various ideas from throughout the book.
Author: Joseph Bernstein
Author: Joseph Bernstein
Author: Mohammad Modarres
Author: Joseph B. Bernstein
Author: Abdelkhalak El Hami
Author: Elsayed A. Elsayed
Author: Constantin Volosencu
Author: William Denson
Author: K.B. Misra
Author: Linda C. Wolstenholme
Author: United States. Department of Defense