Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Reliability Physics Symposium, 1985. 23rd Annual
Author: 23rd Annual Proceedings, Reliability Physics 1985, Orlando, Florida, March 26, 27, 28, 1985
Author: Reliability Physics 1985
Author: Fla.) International Reliability Physics Symposium (23d : 1985 : OrlandoPublisher:
ISBN:
Category :
Languages : en
Pages : 252
Book Description
Reliability Physics 1985
Author: Reliability Physics 1985
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 268
Book Description
Reliability Physics 1985
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 252
Book Description
Reliability and Failure of Electronic Materials and Devices
Author: Milton OhringPublisher: Academic Press
ISBN: 0080575528
Category : Technology & Engineering
Languages : en
Pages : 759
Book Description
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Proceedings of Annual Reliability Physics
Author: Reliability Assessments
Author: Franklin Richard Nash, Ph.D.Publisher: CRC Press
ISBN: 1315353849
Category : Business & Economics
Languages : en
Pages : 713
Book Description
This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
Reliability Physics 1985
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 252
Book Description
Dielectric integrity and reliability, GaAs devices, stress measurement, electromigration, metallization, corrosion, assembly, packaging, failure analysis, elimination of human contamination in the manufacture of ICs.