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Author: J. W. McPherson Publisher: Springer Science & Business Media ISBN: 3319001221 Category : Technology & Engineering Languages : en Pages : 406
Book Description
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Author: J. W. McPherson Publisher: Springer Science & Business Media ISBN: 3319001221 Category : Technology & Engineering Languages : en Pages : 406
Book Description
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Author: J. W. McPherson Publisher: Springer Science & Business Media ISBN: 1441963480 Category : Technology & Engineering Languages : en Pages : 324
Book Description
All engineers could bene?t from at least one course in reliability physics and engineering. It is very likely that, starting with your very ?rst engineering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product last? The evidence for material/device degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. Doors in a new home can become stuck due to the shifting of the foundation. The new ?nish on an automobile will oxidize with time. The tight tolerances associated with ?nely meshed gears will deteriorate with time. Critical parameters associated with hi- precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakages, etc.) will degrade with time. In order to und- stand the lifetime of the material/device, it is important to understand the reliability physics (kinetics) for each of the potential failure mechanisms and then be able to develop the required reliability engineering methods that can be used to prevent, or at least minimize the occurrence of, device failure.
Author: Kailash C. Kapur Publisher: John Wiley & Sons ISBN: 1118841794 Category : Technology & Engineering Languages : en Pages : 528
Book Description
An Integrated Approach to Product Development Reliability Engineering presents an integrated approach to the design, engineering, and management of reliability activities throughout the life cycle of a product, including concept, research and development, design, manufacturing, assembly, sales, and service. Containing illustrative guides that include worked problems, numerical examples, homework problems, a solutions manual, and class-tested materials, it demonstrates to product development and manufacturing professionals how to distribute key reliability practices throughout an organization. The authors explain how to integrate reliability methods and techniques in the Six Sigma process and Design for Six Sigma (DFSS). They also discuss relationships between warranty and reliability, as well as legal and liability issues. Other topics covered include: Reliability engineering in the 21st Century Probability life distributions for reliability analysis Process control and process capability Failure modes, mechanisms, and effects analysis Health monitoring and prognostics Reliability tests and reliability estimation Reliability Engineering provides a comprehensive list of references on the topics covered in each chapter. It is an invaluable resource for those interested in gaining fundamental knowledge of the practical aspects of reliability in design, manufacturing, and testing. In addition, it is useful for implementation and management of reliability programs.
Author: Mohammad Modarres Publisher: John Wiley & Sons ISBN: 1119388686 Category : Technology & Engineering Languages : en Pages : 289
Book Description
The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Author: Patrick O'Connor Publisher: Wiley ISBN: 9780471973454 Category : Technology & Engineering Languages : en Pages : 72
Book Description
This classic textbook/reference contains a complete integration of the processes which influence quality and reliability in product specification, design, test, manufacture and support. Provides a step-by-step explanation of proven techniques for the development and production of reliable engineering equipment as well as details of the highly regarded work of Taguchi and Shainin. New to this edition: over 75 pages of self-assessment questions plus a revised bibliography and references. The book fulfills the requirements of the qualifying examinations in reliability engineering of the Institute of Quality Assurance, UK and the American Society of Quality Control.
Author: Ilia B. Frenkel Publisher: John Wiley & Sons ISBN: 1118701895 Category : Technology & Engineering Languages : en Pages : 449
Book Description
This complete resource on the theory and applications of reliability engineering, probabilistic models and risk analysis consolidates all the latest research, presenting the most up-to-date developments in this field. With comprehensive coverage of the theoretical and practical issues of both classic and modern topics, it also provides a unique commemoration to the centennial of the birth of Boris Gnedenko, one of the most prominent reliability scientists of the twentieth century. Key features include: expert treatment of probabilistic models and statistical inference from leading scientists, researchers and practitioners in their respective reliability fields detailed coverage of multi-state system reliability, maintenance models, statistical inference in reliability, systemability, physics of failures and reliability demonstration many examples and engineering case studies to illustrate the theoretical results and their practical applications in industry Applied Reliability Engineering and Risk Analysis is one of the first works to treat the important areas of degradation analysis, multi-state system reliability, networks and large-scale systems in one comprehensive volume. It is an essential reference for engineers and scientists involved in reliability analysis, applied probability and statistics, reliability engineering and maintenance, logistics, and quality control. It is also a useful resource for graduate students specialising in reliability analysis and applied probability and statistics. Dedicated to the Centennial of the birth of Boris Gnedenko, renowned Russian mathematician and reliability theorist
Author: Hoang Pham Publisher: Springer Nature ISBN: 3030769046 Category : Technology & Engineering Languages : en Pages : 497
Book Description
This book presents the state-of-the-art methodology and detailed analytical models and methods used to assess the reliability of complex systems and related applications in statistical reliability engineering. It is a textbook based mainly on the author’s recent research and publications as well as experience of over 30 years in this field. The book covers a wide range of methods and models in reliability, and their applications, including: statistical methods and model selection for machine learning; models for maintenance and software reliability; statistical reliability estimation of complex systems; and statistical reliability analysis of k out of n systems, standby systems and repairable systems. Offering numerous examples and solved problems within each chapter, this comprehensive text provides an introduction to reliability engineering graduate students, a reference for data scientists and reliability engineers, and a thorough guide for researchers and instructors in the field.
Author: Thomas A. Cruse Publisher: CRC Press ISBN: 9780824797935 Category : Technology & Engineering Languages : en Pages : 364
Book Description
Discussing the modern tools that support designs based on product reliability, this text focuses on the classical techniques of reliability analysis as well as response surface modelling and physics-based reliability prediction methods. It makes use of the available personal computer tools that permit a host of application examples, and contains an IBM-compatible disk that illustrates immediately applicable software that facilitates reliability modelling in mechanical design.
Author: Gregg K. Hobbs Publisher: ISBN: Category : Business & Economics Languages : en Pages : 264
Book Description
Accelerated Reliability Engineering Halt and Hass Gregg K. Hobbs Hobbs Engineering Corporation, Westminster, Colorado, USA Accelerated reliability engineering is becoming a popular industry alternative to on-going product quality testing. Highly Accelerated Life Tests (HALT) and Highly Accelerated Stress Screens (HASS) are intensive methods which use stresses higher than the field environments to expose and then improve design and process weaknesses. HALT and HASS offer faster, cheaper and more accurate results than traditional reliability testing techniques. This book provides comprehensive coverage of the methods and philosophy behind this successful approach. Production managers will appreciate the time-saving and cost-effective testing techniques described. Design engineers involved in quality assurance and students of reliability engineering will benefit from this unique resource detailing the technical aspects of accelerated reliability engineering. Features Include: * Coverage of the physics of failure and useful testing equipment enabling those new to the area to grasp the concepts behind HALT and HASS * Overview of the HALT technique demonstrating how to find design and process defects quickly using accelerated stress methodology during the design phase of the project * Examination of detection screens and modulated excitation used to detect flaws exposed in HALT * Description of how to set up a HASS profile and how to minimize costs whilst retaining efficiency * Applications of HALT and HASS and analysis of common mistakes highlighting the pitfalls to avoid when implementing the methods Wiley Series in Ouality and Reliability Engineering Visit Or Web Page! http://www.wiley.com/
Author: J. W. McPherson
Author: J. W. McPherson
Author: J. W. McPherson
Author: Kailash C. Kapur
Author: Mohammad Modarres
Author: Patrick O'Connor
Author: Ilia B. Frenkel
Author: Hoang Pham
Author: Marvin L. Roush
Author: Thomas A. Cruse
Author: Gregg K. Hobbs