Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 332
Book Description
Reliability Physics 1984
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 332
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 332
Book Description
Reliability Physics and Engineering
Author: J. W. McPherson
Publisher: Springer Science & Business Media
ISBN: 3319001221
Category : Technology & Engineering
Languages : en
Pages : 406
Book Description
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Publisher: Springer Science & Business Media
ISBN: 3319001221
Category : Technology & Engineering
Languages : en
Pages : 406
Book Description
"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Directory of Published Proceedings
Microelectronic Reliability: Reliability, test and diagnostics
Author: Edward B. Hakim
Publisher: Artech House Publishers
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
Book Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Publisher: Artech House Publishers
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
Book Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Reliability Abstracts and Technical Reviews
Author: United States. National Aeronautics and Space Administration. Office of Reliability and Quality Assurance
Publisher:
ISBN:
Category : Quality control
Languages : en
Pages : 610
Book Description
Publisher:
ISBN:
Category : Quality control
Languages : en
Pages : 610
Book Description
VLSI Science and Technology
Handbook of Semiconductor Manufacturing Technology
Author: Yoshio Nishi
Publisher: CRC Press
ISBN: 1351829823
Category : Technology & Engineering
Languages : en
Pages : 3276
Book Description
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Publisher: CRC Press
ISBN: 1351829823
Category : Technology & Engineering
Languages : en
Pages : 3276
Book Description
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
国立国会図書館所蔵科学技術関係欧文会議錄目錄
Author: 国立国会図書館 (Japan)
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 672
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 672
Book Description
Oxide Reliability
Author: D. J. Dumin
Publisher: World Scientific
ISBN: 9789810248420
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
Presents in summary the state of our knowledge of oxide reliability.
Publisher: World Scientific
ISBN: 9789810248420
Category : Technology & Engineering
Languages : en
Pages : 292
Book Description
Presents in summary the state of our knowledge of oxide reliability.
Design for Reliability
Author: Dana Crowe
Publisher: CRC Press
ISBN: 1351836080
Category : Technology & Engineering
Languages : en
Pages : 310
Book Description
Today's marketplace demands product reliability. At the same time, it places ever-increasing demands on products that push the limits of their performance and their functional life, and it does so with the expectation of lower per-unit product costs. To meet these demands, product design now requires a focused, streamlined, concurrent engineering process that will produce a product at the lowest possible cost in the least amount of time. Design for Reliability provides a systematic approach to the design process that is sharply focused on reliability and firmly based on the physics of failure. It imparts an understanding of how, why, and when to use the wide variety of reliability engineering tools available and offers fundamental insight into the total design cycle. Applicable from the idea phase of the product development cycle through product obsolescence, Design for Reliability (DfR) concepts integrated with reliability verification and analytical physics form a coherent stage gate/phase design process that helps ensure that a product will meet customers' reliability objectives. Whether you are a high-volume manufacturer of consumer items or a low volume producer of military commodities, your goal is the same: to bring a product to market using a process focused on designing out or mitigating potential failure modes prior to production release. Readers of Design for Reliability will learn to meet that goal and move beyond solidifying a basic offering to the marketplace to creating a true competitive advantage.
Publisher: CRC Press
ISBN: 1351836080
Category : Technology & Engineering
Languages : en
Pages : 310
Book Description
Today's marketplace demands product reliability. At the same time, it places ever-increasing demands on products that push the limits of their performance and their functional life, and it does so with the expectation of lower per-unit product costs. To meet these demands, product design now requires a focused, streamlined, concurrent engineering process that will produce a product at the lowest possible cost in the least amount of time. Design for Reliability provides a systematic approach to the design process that is sharply focused on reliability and firmly based on the physics of failure. It imparts an understanding of how, why, and when to use the wide variety of reliability engineering tools available and offers fundamental insight into the total design cycle. Applicable from the idea phase of the product development cycle through product obsolescence, Design for Reliability (DfR) concepts integrated with reliability verification and analytical physics form a coherent stage gate/phase design process that helps ensure that a product will meet customers' reliability objectives. Whether you are a high-volume manufacturer of consumer items or a low volume producer of military commodities, your goal is the same: to bring a product to market using a process focused on designing out or mitigating potential failure modes prior to production release. Readers of Design for Reliability will learn to meet that goal and move beyond solidifying a basic offering to the marketplace to creating a true competitive advantage.