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Reliability of Electronic Packages and Semiconductor Devices

Reliability of Electronic Packages and Semiconductor Devices PDF Author: Giulio Di Giacomo
Publisher: McGraw-Hill Professional Publishing
ISBN: 9780070170247
Category : Microelectronic packaging
Languages : en
Pages : 0

Book Description
This text looks at predicting and extending the functional life of semiconductor components. Using empirical modelling, the author covers major types of failure mechanisms that can greatly reduce the active life of semiconductor components, including interconnection fatigue and electromigration.
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