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Reliability and Quality in Microelectronic Manufacturing

Reliability and Quality in Microelectronic Manufacturing PDF Author: A. Christou
Publisher: RIAC
ISBN: 1933904151
Category : Microelectronics
Languages : en
Pages : 410

Book Description


Reliability and Quality in Microelectronic Manufacturing

Reliability and Quality in Microelectronic Manufacturing PDF Author: A. Christou
Publisher: RIAC
ISBN: 1933904151
Category : Microelectronics
Languages : en
Pages : 410

Book Description


Contributions of DOE weapons labs and NIST to semiconductor technology

Contributions of DOE weapons labs and NIST to semiconductor technology PDF Author:
Publisher: DIANE Publishing
ISBN: 1428920862
Category :
Languages : en
Pages : 89

Book Description


Opportunities in Manufacturing Research in the Process Industries

Opportunities in Manufacturing Research in the Process Industries PDF Author: Henry A. McGee
Publisher:
ISBN:
Category : Manufacturing processes
Languages : en
Pages : 76

Book Description


Proceedings of AF-SD/Industry/NASA Conference and Workshops on Mission Assurance

Proceedings of AF-SD/Industry/NASA Conference and Workshops on Mission Assurance PDF Author:
Publisher:
ISBN:
Category : Outer space
Languages : en
Pages : 512

Book Description


Microelectronics Failure Analysis

Microelectronics Failure Analysis PDF Author:
Publisher: ASM International
ISBN: 0871708043
Category : Technology & Engineering
Languages : en
Pages : 813

Book Description
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Handbook of Electronic Package Design

Handbook of Electronic Package Design PDF Author: Michael Pecht
Publisher: CRC Press
ISBN: 1351838415
Category : Technology & Engineering
Languages : en
Pages : 904

Book Description
Both a handbook for practitioners and a text for use in teaching electronic packaging concepts, guidelines, and techniques. The treatment begins with an overview of the electronics design process and proceeds to examine the levels of electronic packaging and the fundamental issues in the development

Advances in Automation Prompt Concern Over Increased U.S. Unemployment

Advances in Automation Prompt Concern Over Increased U.S. Unemployment PDF Author: United States. General Accounting Office
Publisher:
ISBN:
Category : Automation
Languages : en
Pages : 52

Book Description


1976 NASA Authorization

1976 NASA Authorization PDF Author: United States. Congress. House. Committee on Science and Technology
Publisher:
ISBN:
Category :
Languages : en
Pages : 1020

Book Description


Quality Conformance and Qualification of Microelectronic Packages and Interconnects

Quality Conformance and Qualification of Microelectronic Packages and Interconnects PDF Author: Michael Pecht
Publisher: John Wiley & Sons
ISBN: 9780471594369
Category : Technology & Engineering
Languages : en
Pages : 498

Book Description
All packaging engineers and technologists who want to ensure thatthey give their customers the highest quality, most cost-effectiveproducts should know that the paradigm has shifted. It has shiftedaway from the MIL-STDs and other government standards and testprocedures that don't cost-effectively address potential failuremechanisms or the manufacturing processes of the product. It hasshifted decisively towards tackling the root causes of failure andthe appropriate implementation of cost-effective process controls,qualityscreens, and tests. This book's groundbreaking, science-based approach to developingqualification and quality assurance programs helps engineers reacha new level of reliability in today's high-performancemicroelectronics. It does this with powerful... * Techniques for identifying and modeling failure mechanismsearlier in the design cycle, breaking the need to rely on fielddata * Physics-of-failure product reliability assessment methods thatcan be proactively implemented throughout the design andmanufacture of the product * Process controls that decrease variabilities in the end productand reduce end-of-line screening and testing A wide range of microelectronic package and interconnectconfigurations for both single-and multi-chip modules is examined,including chip and wire-bonds, tape-automated (TAB), flip-TAB,flip-chip bonds, high-density interconnects, chip-on-board designs(COB), MCM, 3-D stack, and many more. The remaining packageelements, such as die attachment, case and lid, leads, and lid andlead seals are also discussed in detail. The product of a distinguished team of authors and editors, thisbook's guidelines for avoiding potential high-risk manufacturingand qualification problems, as well as for implementing ongoingquality assurance, are sure to prove invaluable to both studentsand practicing professionals. For the professional engineer involved in the design andmanufacture of products containing electronic components, here is acomprehensive handbook to the theory and methods surrounding theassembly of microelectronic and electronic components. The bookfocuses on computers and consumer electronic products with internalsubsystems that reflect mechanical design constraints, costlimitations, and aesthetic and ergonomic concerns. Taking a totalsystem approach to packaging, the book systematically examines:basic chip and computer architecture; design and layout;interassembly and interconnections; cooling scheme; materialsselection, including ceramics, glasses, and metals; stress,vibration, and acoustics; and manufacturing and assemblytechnology. 1994 (0-471-53299-1) 800 pp. INTEGRATED CIRCUIT, HYBRID, AND MULTICHIP MODULE PACKAGE DESIGNGUIDELINES: A Focus on Reliability --Michael Pecht This comprehensive guide features a uniquely organized time-phasedapproach to design, development, qualification, manufacture, andin-service management. It provides step-by-step instructions on howto define realistic system requirements, define the system usageenvironment, identify potential failure modes, characterizematerials and processes by the key control label factors, and useexperiment, step-stress, and accelerated methods to ensure optimumdesign before production begins. Topics covered include: detaileddesign guidelines for substrate...wire and wire, tape automated,and flip-chip bonding...element attachment and case, lead, lead andlid seals--incorporating dimensional and geometric configurationsof package elements, manufacturing and assembly conditions,materials selection, and loading conditions. 1993 (0-471-59446-6)454 pp.

1976 NASA Authorization, Hearing Before...., 94-1...

1976 NASA Authorization, Hearing Before...., 94-1... PDF Author: United States. Congress. House Science and Technology Committee
Publisher:
ISBN:
Category :
Languages : en
Pages : 1028

Book Description