Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II: Volume 1432 PDF Download
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Author: Osamu Ueda Publisher: Materials Research Society ISBN: 9781605114095 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Symposium G, "Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II," was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California. Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes.
Author: Osamu Ueda Publisher: Materials Research Society ISBN: 9781605114095 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Symposium G, "Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II," was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California. Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes.
Author: Osamu Ueda Publisher: Cambridge University Press ISBN: 9781605111681 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallization, bonding, packaging, etc. This book focuses on the current status of reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing, and device fabrication processes. Topics include: laser reliability; degradation mechanisms; optical devices and reliability; electronic device reliability; wide-bandgap devices; compound semiconductors; characterization; characterization methods; strain effects; defects and growth; diffusion barriers; organic and other materials and novel structures.
Author: S. Mahajan Publisher: Elsevier ISBN: 1483286576 Category : Technology & Engineering Languages : en Pages : 607
Book Description
The development of electronic materials and particularly advances in semiconductor technology have played a central role in the electronics revolution by allowing the production of increasingly cheap and powerful computing equipment and advanced telecommunications devices. This Concise Encyclopedia, which incorporates relevant articles from the acclaimed Encyclopedia of Materials Science and Engineering as well as newly commissioned articles, emphasizes the materials aspects of semiconductors and the technologies important in solid-state electronics. Growth of bulk crystals and epitaxial layers are discussed in the volume and coverage is included of defects and their effects on device behavior. Metallization and passivation issues are also covered. Over 100 alphabetically arranged articles, written by world experts in the field, are each intended to serve as the first source of information on a particular aspect of electronic materials. The volume is extensively illustrated with photographs, diagrams and tables. A bibliography is provided at the end of each article to guide the reader to recent literature. A comprehensive system of cross-references, a three-level subject index and an alphabetical list of articles are included to aid readers in the abstraction of information.
Author: E. Fred Schubert Publisher: E. Fred Schubert ISBN: 0986382612 Category : Technology & Engineering Languages : en Pages : 431
Book Description
Revised and fully updated, the Second Edition of this textbook offers a comprehensive explanation of the technology and physics of light-emitting diodes (LEDs) such as infrared, visible-spectrum, ultraviolet, and white LEDs made from III–V semiconductors. The elementary properties of LEDs such as electrical and optical characteristics are reviewed, followed by the analysis of advanced device structures. With nine additional chapters, the treatment of LEDs has been vastly expanded, including new material on device packaging, reflectors, UV LEDs, III–V nitride materials, solid-state sources for illumination applications, and junction temperature. Radiative and non-radiative recombination dynamics, methods for improving light extraction, high-efficiency and high-power device designs, white-light emitters with wavelength-converting phosphor materials, optical reflectors, and spontaneous recombination in resonant-cavity structures, are discussed in detail. Fields related to solid-state lighting such as human vision, photometry, colorimetry, and color rendering are covered beyond the introductory level provided in the first edition. The applications of infrared and visible spectrum LEDs in silica fiber, plastic fiber, and free-space communication are also discussed. Semiconductor material data, device design data, and analytic formulae governing LED operation are provided. With exercises, solutions and illustrative examples, this textbook will be of interest to scientists and engineers working on LEDs, and to graduate students in electrical engineering, applied physics, and materials science.
Author: Publisher: ISBN: Category : Aeronautics Languages : en Pages : 456
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: Osamu Ueda
Author: Osamu Ueda
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Author: Osamu Ueda
Author: S. Mahajan
Author: Defense Documentation Center (U.S.)
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