Reactive Sputter Deposition of Vanadium Oxide PDF Download

Author: Steven D. Hansen
Publisher:
ISBN:
Category : Sputtering (Physics)
Languages : en
Pages : 62

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Author: Yao Jin
Publisher:
ISBN:
Category :
Languages : en
Pages :

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A vanadium oxide (VO x) thin film is the most common imaging layer used in commercial uncooled focal plane arrays for infrared cameras. These VOx thin films have an x value ranging from 1.3 to 2 and have low resistivity (0.1 to 10 [omega] cm), high temperature coefficient of resistance (TCR) (-2 to -3 %/K), and low 1/f noise. Reactive ion beam sputtering is typically used to deposit these VOx thin films for commercial thermal imaging cameras. However, the reactive ion beam deposition system for the VOx is reported to have less than desirable throughput and a narrow process window. In this work, the potential for reactive pulsed-dc magnetron sputtering of nanocomposite VOx thin films for microbolometer applications was investigated. VOx thin films with resistivity from 10-4 to 105 [omega] cm with a TCR from 0 to -4.3 %/K were deposited by reactive sputtering from a metallic vanadium target in argon/oxygen mixtures with substrate bias. Magnetron sputtered VOx shows bolometric properties comparable to those of commercial-grade IBD prepared VOx. Important limitations for manufacturing implementation of reactive magnetron sputtering such as hysteresis oxidation and non-uniform oxidation of the vanadium target surface were evaluated. The VOx film deposition rate, resistivity, and temperature coefficient of resistance were correlated to oxygen to argon ratio, processing pressure, target-to-substrate distance, and oxygen inlet positions. To deposit VOx in the resistivity range of 0.1--10 [omega] cm with good uniformity and process control, it was found that a lower processing pressure, larger target-to-substrate distance, and an oxygen inlet near the substrate are useful. Other processing methods employing magnetron sputtering were investigated such as co-sputtering of V and V2O5 target, sputtering from a VC target, a V2O5 target, and a V2Ox target but initial investigation of these methods did not yield a superior process to the simple sputtering of a pure metallic vanadium target. Another technique, biased target ion beam deposition (BTIBD), was investigated for deposition VOx thin films with potential alloy additions. In this BTIBD system, ions with energy lower than 25 eV were generated remotely and vanadium targets are negatively biased independently for sputtering. High TCR (

Author: Diederik Depla
Publisher: Springer Science & Business Media
ISBN: 3540766642
Category : Technology & Engineering
Languages : en
Pages : 584

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In this valuable work, all aspects of the reactive magnetron sputtering process, from the discharge up to the resulting thin film growth, are described in detail, allowing the reader to understand the complete process. Hence, this book gives necessary information for those who want to start with reactive magnetron sputtering, understand and investigate the technique, control their sputtering process and tune their existing process, obtaining the desired thin films.

Author: Nada M. Abuhadba
Publisher:
ISBN:
Category : Sputtering (Physics)
Languages : en
Pages : 0

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Author: Carolyn R. Aita
Publisher:
ISBN:
Category :
Languages : en
Pages : 140

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The research involved investigation of process parameter growth environment film property relationships for various binary oxide and nitride films grown on unheated substrates by reactive sputter deposition using an elemental target. In situ optical emission spectroscopy and glow discharge mass spectrometry were used to determine gas phase species in the plasma volume. A battery of techniques were used to characterize (post-deposition) film crystallography, chemistry, microstructure, electrical resistivity, and optical behavior. Keywords: Sputter deposition, Glow discharges, Glow discharge diagnostics, Optical emission, Mass spectrometry, Aluminum oxide, Vanadium, Pentoxide, Gold oxide, Tungsten nitride, Aluminum nitride, Germanium dioxide.

Author: Qi Wang
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Author: Mengyang Zou
Publisher:
ISBN:
Category : Bolometer
Languages : en
Pages : 68

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Microbolometer IR imagers consist of an array of thermally sensitive pixels that change resistance as infrared radiation is focused onto the array. Commonly used thermoresisitive materials are amorphous silicon (a-Si) and vanadium oxide (VOx). Despite their use in image sensors, these films are extremely difficult to produce with widely varying process conditions being reported in the literature. Therefore, the goal of this work was to examine the process windows of some of these methods, including novel approaches such as oxygen ion assisted deposition (IAD), aluminum-induced crystallization and glancing angle deposition. Among the thermoresistive materials, vanadium oxide has been widely used in microbolometers due to their excellent thermoresistive properties, relatively fast thermal time constants and high temperature coefficient of resistance (TCR). In our work, we examined different physical vapor deposition methods including: RF reactive sputtering of metallic vanadium to produce vanadium oxide, thermal evaporation of vanadium films and subsequent oxidation, and Oxygen Ion-Assisted Deposition (IAD) of e-beam evaporated vanadium. In addition to VOx, amorphous silicon is also desirable because it can be easily integrated into the CMOS fabrication processes more than VOx. The hydrogenated amorphous silicon produced by PECVD has a high TCR and a relatively high optical absorption coefficient. In addition to PECVD, we used a glancing angle deposition and also examined a novel approach to create polycrystalline silicon from aluminum-induced crystallization.

Author: Kiyotaka Wasa
Publisher: William Andrew
ISBN: 1437734839
Category : Science
Languages : en
Pages : 658

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This thoroughly updated new edition includes an entirely new team of contributing authors with backgrounds specializing in the various new applications of sputtering technology. It forms a bridge between fundamental theory and practical application, giving an insight into innovative new materials, devices and systems. Organized into three parts for ease of use, this Handbook introduces the fundamentals of thin films and sputtering deposition, explores the theory and practices of this field, and also covers new technology such as nano-functional materials and MEMS. Wide varieties of functional thin film materials and processing are described, and experimental data is provided with detailed examples and theoretical descriptions. A strong applications focus, covering current and emerging technologies, including nano-materials and MEMS (microelectrolmechanical systems) for energy, environments, communications, and/or bio-medical field. New chapters on computer simulation of sputtering and MEMS completes the update and insures that the new edition includes the most current and forward-looking coverage available All applications discussed are supported by theoretical discussions, offering readers both the "how" and the "why" of each technique 40% revision: the new edition includes an entirely new team of contributing authors with backgrounds specializing in the various new applications that are covered in the book and providing the most up-to-date coverage available anywhere

Author: Hernan M. R.
Publisher:
ISBN:
Category : Science
Languages : en
Pages :

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This chapter describes a new deposition method proposed to achieve Vanadium Oxide VOx/V2O5 thin films with high temperature coefficient of resistance (TCR), intended to be used as functional material in IR microsensors (bolometers). The main aim of the work is to attain a deposition method compatible with the lift-off microstructuring technique in order to avoid the use of a reactive-ion etching (RIE) process step to selectively remove the VOx/V2O5 deposited layer in the course of the definition of the bolometer geometry, preventing the harmful effects linked to the spatial variability and the lack of selectivity of the RIE process. The proposed technique makes use of a two-stage process to produce the well-controlled VOx or V2O5 thin films by applying a suitable thermal annealing to a previously deposited layer, which was obtained before at room temperature by RF magnetron sputtering and patterned by lift-off. A set of measurements has been carried out with thin films attained in order to check the quality and properties of the materials achieved with this method. The results reached with V2O5 pure phase films are consistent with a charge transport model based on the small polarons hopping derived from Mott's model under the Schnakenberg form.

Author: Nikolay Nikitenkov
Publisher: BoD – Books on Demand
ISBN: 953513003X
Category : Science
Languages : en
Pages : 446

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Development of the thin film and coating technologies (TFCT) made possible the technological revolution in electronics and through it the revolution in IT and communications in the end of the twentieth century. Now, TFCT penetrated in many sectors of human life and industry: biology and medicine; nuclear, fusion, and hydrogen energy; protection against corrosion and hydrogen embrittlement; jet engine; space materials science; and many others. Currently, TFCT along with nanotechnologies is the most promising for the development of almost all industries. The 20 chapters of this book present the achievements of thin-film technology in many areas mentioned above but more than any other in medicine and biology and energy saving and energy efficiency.