Random Graphs for Statistical Pattern Recognition PDF Download

Author: David J. Marchette
Publisher: John Wiley & Sons
ISBN: 0471722081
Category : Mathematics
Languages : en
Pages : 261

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Book Description
A timely convergence of two widely used disciplines Random Graphs for Statistical Pattern Recognition is the first book to address the topic of random graphs as it applies to statistical pattern recognition. Both topics are of vital interest to researchers in various mathematical and statistical fields and have never before been treated together in one book. The use of data random graphs in pattern recognition in clustering and classification is discussed, and the applications for both disciplines are enhanced with new tools for the statistical pattern recognition community. New and interesting applications for random graph users are also introduced. This important addition to statistical literature features: Information that previously has been available only through scattered journal articles Practical tools and techniques for a wide range of real-world applications New perspectives on the relationship between pattern recognition and computational geometry Numerous experimental problems to encourage practical applications With its comprehensive coverage of two timely fields, enhanced with many references and real-world examples, Random Graphs for Statistical Pattern Recognition is a valuable resource for industry professionals and students alike.

Author: Andrew R. Webb
Publisher: John Wiley & Sons
ISBN: 0470854782
Category : Mathematics
Languages : en
Pages : 516

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Book Description
Statistical pattern recognition is a very active area of study andresearch, which has seen many advances in recent years. New andemerging applications - such as data mining, web searching,multimedia data retrieval, face recognition, and cursivehandwriting recognition - require robust and efficient patternrecognition techniques. Statistical decision making and estimationare regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fullyupdated with new methods, applications and references. It providesa comprehensive introduction to this vibrant area - with materialdrawn from engineering, statistics, computer science and the socialsciences - and covers many application areas, such as databasedesign, artificial neural networks, and decision supportsystems. * Provides a self-contained introduction to statistical patternrecognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vectormachines, and unsupervised classification. * Each section concludes with a description of the applicationsthat have been addressed and with further developments of thetheory. * Includes background material on dissimilarity, parameterestimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions tomore lengthy projects. The book is aimed primarily at senior undergraduate and graduatestudents studying statistical pattern recognition, patternprocessing, neural networks, and data mining, in both statisticsand engineering departments. It is also an excellent source ofreference for technical professionals working in advancedinformation development environments. For further information on the techniques and applicationsdiscussed in this book please visit ahref="http://www.statistical-pattern-recognition.net/"www.statistical-pattern-recognition.net/a

Author: Pasi Fränti
Publisher: Springer
ISBN: 3662444151
Category : Computers
Languages : en
Pages : 493

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Book Description
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.

Author: Georgy Gimel ́farb
Publisher: Springer
ISBN: 3642341667
Category : Computers
Languages : en
Pages : 770

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Book Description
This volume constitutes the refereed proceedings of the Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition (SSPR 2012) and Statistical Techniques in Pattern Recognition (SPR 2012), held in Hiroshima, Japan, in November 2012 as a satellite event of the 21st International Conference on Pattern Recognition, ICPR 2012. The 80 revised full papers presented together with 1 invited paper and the Pierre Devijver award lecture were carefully reviewed and selected from more than 120 initial submissions. The papers are organized in topical sections on structural, syntactical, and statistical pattern recognition, graph and tree methods, randomized methods and image analysis, kernel methods in structural and syntactical pattern recognition, applications of structural and syntactical pattern recognition, clustering, learning, kernel methods in statistical pattern recognition, kernel methods in statistical pattern recognition, as well as applications of structural, syntactical, and statistical methods.

Author: Antonio Robles-Kelly
Publisher: Springer
ISBN: 3319490559
Category : Computers
Languages : en
Pages : 588

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Book Description
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.

Author: Terry Caelli
Publisher: Springer
ISBN: 3540706593
Category : Computers
Languages : en
Pages : 884

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Book Description
This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The workshops were held in parallel and closely coordinated. This was an attempt to resolve the dilemma of how to deal, in the light of the progressive specialization of pattern recognition, with the need for narrow-focus workshops without further fragmenting the ?eld and introducing yet another conference that would compete for the time and resources of potential participants. A total of 116 papers were received from many countries with the submission and reviewingprocesses beingcarried out separately for each workshop. A total of 45 papers were accepted for oral presentation and 35 for posters. In addition four invited speakers presented informative talks and overviews of their research. They were: Tom Dietterich, Oregon State University, USA Sven Dickinson, the University of Toronto, Canada Edwin Hancock, University of York, UK Anil Jain, Michigan State University, USA SSPR 2002 and SPR 2002 were sponsored by the IAPR and the University of Windsor.

Author: Ana Fred
Publisher: Springer Science & Business Media
ISBN: 3540225706
Category : Computers
Languages : en
Pages : 1187

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Book Description
This book constitutes the refereed proceedings of the 10th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2004 and the 5th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2004, held jointly in Lisbon, Portugal, in August 2004. The 59 revised full papers and 64 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 219 submissions. The papers are organized in topical sections on graphs; visual recognition and detection; contours, lines, and paths; matching and superposition; transduction and translation; image and video analysis; syntactics, languages, and strings; human shape and action; sequences and graphs; pattern matching and classification; document image analysis; shape analysis; multiple classifier systems; density estimation; clustering; feature selection; classification; and representation.

Author: Dit-Yan Yeung
Publisher: Springer Science & Business Media
ISBN: 3540372369
Category : Computers
Languages : en
Pages : 959

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Book Description
This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

Author: Andrew R. Webb
Publisher: John Wiley & Sons
ISBN: 1119961408
Category : Mathematics
Languages : en
Pages : 604

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Book Description
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: Provides a self-contained introduction to statistical pattern recognition. Includes new material presenting the analysis of complex networks. Introduces readers to methods for Bayesian density estimation. Presents descriptions of new applications in biometrics, security, finance and condition monitoring. Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications Describes mathematically the range of statistical pattern recognition techniques. Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields. www.wiley.com/go/statistical_pattern_recognition

Author: Geoffrey J. McLachlan
Publisher: John Wiley & Sons
ISBN: 0471725285
Category : Mathematics
Languages : en
Pages : 553

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Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. "For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field." –SciTech Book News ". . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition." –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.