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Progress in VLSI Design and Test

Progress in VLSI Design and Test PDF Author: Hafizur Rahaman
Publisher: Springer
ISBN: 3642314945
Category : Computers
Languages : en
Pages : 427

Book Description
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

Progress in VLSI Design and Test

Progress in VLSI Design and Test PDF Author: Hafizur Rahaman
Publisher: Springer
ISBN: 3642314945
Category : Computers
Languages : en
Pages : 427

Book Description
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

Progress in VLSI Design and Test, 2004

Progress in VLSI Design and Test, 2004 PDF Author: Chennagiri Prahladarao Ravikumar
Publisher:
ISBN: 9788188901104
Category : Integrated circuits
Languages : en
Pages : 567

Book Description
Papers presented at the 8th VLSI Design and Test Workshop, held at Mysore in 2004.

Progress in VLSI Design and Test, 2006

Progress in VLSI Design and Test, 2006 PDF Author: Chennagiri Prahladarao Ravikumar
Publisher:
ISBN: 9788188901241
Category : Integrated circuits
Languages : en
Pages : 451

Book Description
Papers presented at the 10th VLSI Design and Test Symposium, held at Panaji during 9-12 August 2006.

Progress in VLSI Design & Test

Progress in VLSI Design & Test PDF Author: Shabbir Batterywala
Publisher:
ISBN: 9788188901357
Category : Integrated circuits
Languages : en
Pages : 452

Book Description
Papers presented at the 12th VLSI Design and Test Symposium, held at Bangalore in 2008.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits PDF Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690

Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Progress in VLSI Design and Test 2005

Progress in VLSI Design and Test 2005 PDF Author: Chennagiri Prahladarao Ravikumar
Publisher:
ISBN: 9788188901166
Category : Integrated circuits
Languages : en
Pages : 483

Book Description
Papers presented at the 9th VLSI Design and Test Symposium, held at Bangalore during 10-13 August 2005.

Progress in VLSI Design and Test 2007

Progress in VLSI Design and Test 2007 PDF Author: Susmita Sur-Kolay
Publisher:
ISBN: 9788188901296
Category : Integrated circuits
Languages : en
Pages : 530

Book Description
Papers presented at the 11th VLSI Design and Test Symposium, held at Kolkata during 8-9 August 2007.

Progress in VLSI Design & Test

Progress in VLSI Design & Test PDF Author: Chennagiri Prahladarao Ravikumar
Publisher:
ISBN: 9788188901401
Category : Integrated circuits
Languages : en
Pages : 460

Book Description
Papers presented at the VLSI Design and Test Symposium, held at Bangalore during 8-10 July 2009.

Progress in Computing, Analytics and Networking

Progress in Computing, Analytics and Networking PDF Author: Prasant Kumar Pattnaik
Publisher: Springer
ISBN: 9811078718
Category : Technology & Engineering
Languages : en
Pages : 826

Book Description
The book focuses to foster new and original research ideas and results in three broad areas: computing, analytics, and networking with its prospective applications in the various interdisciplinary domains of engineering. This is an exciting and emerging interdisciplinary area in which a wide range of theory and methodologies are being investigated and developed to tackle complex and challenging real world problems. It also provides insights into the International Conference on Computing Analytics and Networking (ICCAN 2017) which is a premier international open forum for scientists, researchers and technocrats in academia as well as in industries from different parts of the world to present, interact, and exchange the state of art of concepts, prototypes, innovative research ideas in several diversified fields. The book includes invited keynote papers and paper presentations from both academia and industry to initiate and ignite our young minds in the meadow of momentous research and thereby enrich their existing knowledge. The book aims at postgraduate students and researchers working in the discipline of Computer Science & Engineering. It will be also useful for the researchers working in the domain of electronics as it contains some hardware technologies and forthcoming communication technologies.

Advanced VLSI Design and Testability Issues

Advanced VLSI Design and Testability Issues PDF Author: Suman Lata Tripathi
Publisher: CRC Press
ISBN: 1000168158
Category : Technology & Engineering
Languages : en
Pages : 379

Book Description
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.