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Author: Xiao Pan Publisher: ISBN: Category : Atomic force microscopy Languages : en Pages : 45
Book Description
"Atomic force microscopy (AFM) is a versatile and powerful tool for imaging and measuring small-scale objects such as nanoparticles, single molecules, semiconductor devices and living cells. The basic operation of an AFM can be to utilize a sharp cantilever tip that interacts with the sample surface and senses the local force between the tip and sample surface. Based on the physical interaction between the AFM and the small-scale object for image acquisition, there can be a number of artifacts, including curvature distortion (bowing effects), high-frequency or low-frequency noise, which may not be easily recognized by users accustomed to conventional microscopy. In this research, different image processing functions are designed to visualize AFM data, address different types of AFM artifacts problems and analyze features. Algorithms according to AFM image processing functions are presented. Analysis of AFM images acquired from silicon chips, which are provided by the Mechanical Engineering Department at Missouri University of Science and Technology, is displayed."--Abstract, page iii.
Author: Xiao Pan Publisher: ISBN: Category : Atomic force microscopy Languages : en Pages : 45
Book Description
"Atomic force microscopy (AFM) is a versatile and powerful tool for imaging and measuring small-scale objects such as nanoparticles, single molecules, semiconductor devices and living cells. The basic operation of an AFM can be to utilize a sharp cantilever tip that interacts with the sample surface and senses the local force between the tip and sample surface. Based on the physical interaction between the AFM and the small-scale object for image acquisition, there can be a number of artifacts, including curvature distortion (bowing effects), high-frequency or low-frequency noise, which may not be easily recognized by users accustomed to conventional microscopy. In this research, different image processing functions are designed to visualize AFM data, address different types of AFM artifacts problems and analyze features. Algorithms according to AFM image processing functions are presented. Analysis of AFM images acquired from silicon chips, which are provided by the Mechanical Engineering Department at Missouri University of Science and Technology, is displayed."--Abstract, page iii.
Author: Peter Eaton Publisher: Oxford University Press ISBN: 0199570450 Category : Science Languages : en Pages : 257
Book Description
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Author: Victor Bellitto Publisher: BoD – Books on Demand ISBN: 9535104144 Category : Science Languages : en Pages : 272
Book Description
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
Author: Greg Haugstad Publisher: John Wiley & Sons ISBN: 1118360680 Category : Science Languages : en Pages : 496
Book Description
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com”
Author: Ricardo García Publisher: John Wiley & Sons ISBN: 352764394X Category : Technology & Engineering Languages : en Pages : 212
Book Description
Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.
Author: Ernst Meyer Publisher: Springer Nature ISBN: 3030370895 Category : Science Languages : en Pages : 330
Book Description
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author: Peter Eaton Publisher: OUP Oxford ISBN: 0191576670 Category : Science Languages : en Pages : 256
Book Description
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Author: W. Richard Bowen Publisher: Butterworth-Heinemann ISBN: 0080949576 Category : Technology & Engineering Languages : en Pages : 300
Book Description
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry. - Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products - The only book dealing with the theory and practical applications of atomic force microscopy in process engineering - Provides best-practice guidance and experience on using AFM for process and product improvement
Author: Arturo M. Baró Publisher: John Wiley & Sons ISBN: 3527327584 Category : Science Languages : en Pages : 385
Book Description
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Author: Xiao Pan
Author: Xiao Pan
Author: Peter Eaton
Author: Douglas Matthew Carmichael
Author: Victor Bellitto
Author: Greg Haugstad
Author: Ricardo García
Author: Ernst Meyer
Author: Peter Eaton
Author: W. Richard Bowen
Author: Arturo M. Baró