Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the major axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.
Process and Apparatus for Measuring Degree of Polarization and Angle of Major Axis of Polarized Beam of Light
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the major axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Apparatus and process are disclosed for calibrating measurements of the phase of the polarization of a polarized beam and the angle of the polarized optical beam's major axis of polarization at a diagnostic point with measurements of the same parameters at a point of interest along the polarized beam path prior to the diagnostic point. The process is carried out by measuring the phase angle of the polarization of the beam and angle of the major axis at the point of interest, using a rotatable polarizer and a detector, and then measuring these parameters again at a diagnostic point where a compensation apparatus, including a partial polarizer, which may comprise a stack of glass plates, is disposed normal to the beam path between a rotatable polarizer and a detector. The partial polarizer is then rotated both normal to the beam path and around the axis of the beam path until the detected phase of the beam polarization equals the phase measured at the point of interest. The rotatable polarizer at the diagnostic point may then be rotated manually to determine the angle of the major axis of the beam and this is compared with the measured angle of the major axis of the beam at the point of interest during calibration. Thereafter, changes in the polarization phase, and in the angle of the major axis, at the point of interest can be monitored by measuring the changes in these same parameters at the diagnostic point.
Official Gazette of the United States Patent and Trademark Office
Author: United States. Patent and Trademark Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1852
Book Description
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1852
Book Description
Polarized Light and Optical Measurement
Author: D. N. Clarke
Publisher: Elsevier
ISBN: 1483159256
Category : Science
Languages : en
Pages : 198
Book Description
Polarized Light and Optical Measurement is a five-chapter book that begins with a self-consistent conceptual picture of the phenomenon of polarization. Chapter 2 describes a number of interactions of light and matter used in devising optical elements in polarization studies. Specific optical elements are given in Chapter 3. The last two chapters explore the measurement of the state of polarization and the various roles played in optical instrumentation by polarization and polarization-sensitive elements. This book will provide useful information in this field of interest for research workers, postgraduate students, as well as undergraduate students.
Publisher: Elsevier
ISBN: 1483159256
Category : Science
Languages : en
Pages : 198
Book Description
Polarized Light and Optical Measurement is a five-chapter book that begins with a self-consistent conceptual picture of the phenomenon of polarization. Chapter 2 describes a number of interactions of light and matter used in devising optical elements in polarization studies. Specific optical elements are given in Chapter 3. The last two chapters explore the measurement of the state of polarization and the various roles played in optical instrumentation by polarization and polarization-sensitive elements. This book will provide useful information in this field of interest for research workers, postgraduate students, as well as undergraduate students.
Index of Patents Issued from the United States Patent and Trademark Office
Method and Apparatus for Measuring Birefringent Particles
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
A method and apparatus for measuring birefringent particles is provided comprising a source lamp, a grating, a first polarizer having a first transmission axis, a sample cell and a second polarizer having a second polarization axis. The second polarizer has a second polarization axis that is set to be perpendicular to the first polarization axis, and thereby blocks linearly polarized light with the orientation of the beam of light passing through the first polarizer. The beam of light passing through the second polarizer is measured using a detector.
Method of Measuring Dispersive Rotation of Plane Polarized Light in Crystals
Author: Carl Edward Gluesing
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 114
Book Description
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 114
Book Description
Polarized Light; Production and Use
Author: William A. Shurcliff
Publisher: Cambridge : Harvard University Press
ISBN:
Category : Polarization (Light)
Languages : en
Pages : 232
Book Description
Publisher: Cambridge : Harvard University Press
ISBN:
Category : Polarization (Light)
Languages : en
Pages : 232
Book Description
The Crystelliptometer, an Instrument for the Polariscopic Analysis of Very Slender Beams of Light
Author: Le Roy Dougherty Weld
Publisher:
ISBN:
Category : Polarization (Light)
Languages : en
Pages : 32
Book Description
Publisher:
ISBN:
Category : Polarization (Light)
Languages : en
Pages : 32
Book Description
Polarization Analysis and Measurement II
Author: Dennis H. Goldstein
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 496
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 496
Book Description
A Familiar Introduction to the Study of Polarized Light
Author: Charles Woodward
Publisher:
ISBN:
Category : Microscopes
Languages : en
Pages : 74
Book Description
Publisher:
ISBN:
Category : Microscopes
Languages : en
Pages : 74
Book Description